SG144798A1 - Cantilever-type probe mechanism and method of making cantilever-type probe card - Google Patents
Cantilever-type probe mechanism and method of making cantilever-type probe cardInfo
- Publication number
- SG144798A1 SG144798A1 SG200718122-5A SG2007181225A SG144798A1 SG 144798 A1 SG144798 A1 SG 144798A1 SG 2007181225 A SG2007181225 A SG 2007181225A SG 144798 A1 SG144798 A1 SG 144798A1
- Authority
- SG
- Singapore
- Prior art keywords
- cantilever
- metal
- type probe
- pin
- signal
- Prior art date
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
CANTILEVER-TYPE PROBE MECHANISM AND METHOD OF MAKING CANTILEVER-TYPE PROBE CARD A cantilever-type probe mechanism for transmitting high frequency signal includes a probe pin holder, a transmission line, at least one metal signal pin and at least one metal grounding pin. The metal signal pin has a mounting portion mounted to the probe pin holder and electrically connected with a metal core of the transmission line, a probing tip for probing an electronic component on a wafer, and a front arm integrally extending from the mounting portion to the probing tip. The metal grounding pin has a mounting portion mounted to the probe pin holder and electrically connected with a metal layer spacedly surrounding the metal core, a probing tip, and a front arm spaced from the front arm of the at least one metal signal pin for maintaining the characteristic impedance of the signal pin upon transmitting high frequency test signal.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96101463A TW200829923A (en) | 2007-01-15 | 2007-01-15 | High frequency suspension arm probe |
Publications (1)
Publication Number | Publication Date |
---|---|
SG144798A1 true SG144798A1 (en) | 2008-08-28 |
Family
ID=39710876
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200718122-5A SG144798A1 (en) | 2007-01-15 | 2007-11-28 | Cantilever-type probe mechanism and method of making cantilever-type probe card |
Country Status (2)
Country | Link |
---|---|
SG (1) | SG144798A1 (en) |
TW (1) | TW200829923A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI461698B (en) * | 2010-09-30 | 2014-11-21 | Mpi Corp | Probe unit and its making method |
TW201305574A (en) * | 2011-07-22 | 2013-02-01 | Mpi Corp | High-frequency signal path adjustment method and testing device thereof |
TWI458987B (en) * | 2013-04-26 | 2014-11-01 | Mpi Corp | Probe needle module |
WO2016156003A1 (en) * | 2015-03-31 | 2016-10-06 | Technoprobe S.P.A. | Vertical contact probe and corresponding testing head with vertical contact probes, particularly for high frequency applications |
CN108022848B (en) * | 2016-11-01 | 2020-10-27 | 稳懋半导体股份有限公司 | Improved coaxial probe structure |
-
2007
- 2007-01-15 TW TW96101463A patent/TW200829923A/en not_active IP Right Cessation
- 2007-11-28 SG SG200718122-5A patent/SG144798A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
TW200829923A (en) | 2008-07-16 |
TWI312867B (en) | 2009-08-01 |
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