SG144798A1 - Cantilever-type probe mechanism and method of making cantilever-type probe card - Google Patents

Cantilever-type probe mechanism and method of making cantilever-type probe card

Info

Publication number
SG144798A1
SG144798A1 SG200718122-5A SG2007181225A SG144798A1 SG 144798 A1 SG144798 A1 SG 144798A1 SG 2007181225 A SG2007181225 A SG 2007181225A SG 144798 A1 SG144798 A1 SG 144798A1
Authority
SG
Singapore
Prior art keywords
cantilever
metal
type probe
pin
signal
Prior art date
Application number
SG200718122-5A
Inventor
Wei-Cheng Ku
Chia-Tai Chang
Chien-He Lin
Original Assignee
Mjc Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39710876&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SG144798(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mjc Probe Inc filed Critical Mjc Probe Inc
Publication of SG144798A1 publication Critical patent/SG144798A1/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

CANTILEVER-TYPE PROBE MECHANISM AND METHOD OF MAKING CANTILEVER-TYPE PROBE CARD A cantilever-type probe mechanism for transmitting high frequency signal includes a probe pin holder, a transmission line, at least one metal signal pin and at least one metal grounding pin. The metal signal pin has a mounting portion mounted to the probe pin holder and electrically connected with a metal core of the transmission line, a probing tip for probing an electronic component on a wafer, and a front arm integrally extending from the mounting portion to the probing tip. The metal grounding pin has a mounting portion mounted to the probe pin holder and electrically connected with a metal layer spacedly surrounding the metal core, a probing tip, and a front arm spaced from the front arm of the at least one metal signal pin for maintaining the characteristic impedance of the signal pin upon transmitting high frequency test signal.
SG200718122-5A 2007-01-15 2007-11-28 Cantilever-type probe mechanism and method of making cantilever-type probe card SG144798A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96101463A TW200829923A (en) 2007-01-15 2007-01-15 High frequency suspension arm probe

Publications (1)

Publication Number Publication Date
SG144798A1 true SG144798A1 (en) 2008-08-28

Family

ID=39710876

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200718122-5A SG144798A1 (en) 2007-01-15 2007-11-28 Cantilever-type probe mechanism and method of making cantilever-type probe card

Country Status (2)

Country Link
SG (1) SG144798A1 (en)
TW (1) TW200829923A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI461698B (en) * 2010-09-30 2014-11-21 Mpi Corp Probe unit and its making method
TW201305574A (en) * 2011-07-22 2013-02-01 Mpi Corp High-frequency signal path adjustment method and testing device thereof
TWI458987B (en) * 2013-04-26 2014-11-01 Mpi Corp Probe needle module
WO2016156003A1 (en) * 2015-03-31 2016-10-06 Technoprobe S.P.A. Vertical contact probe and corresponding testing head with vertical contact probes, particularly for high frequency applications
CN108022848B (en) * 2016-11-01 2020-10-27 稳懋半导体股份有限公司 Improved coaxial probe structure

Also Published As

Publication number Publication date
TW200829923A (en) 2008-07-16
TWI312867B (en) 2009-08-01

Similar Documents

Publication Publication Date Title
SG144799A1 (en) Probe for high frequency signal transmission and probe card using the same
US6724205B1 (en) Probe for combined signals
TW200513659A (en) Integrated printed circuit board and test contactor for high speed semiconductor testing
WO2004107401A3 (en) Probe for testing a device under test
SG144798A1 (en) Cantilever-type probe mechanism and method of making cantilever-type probe card
US20140266280A1 (en) Probe card, probe structure and method for manufacturing the same
CN101988938B (en) Antenna test system, test method and test tool
DE602004009214D1 (en) DEVICE FOR CHECKING A DEVICE HAVING A HIGH FREQUENCY SIGNAL
MY162914A (en) Wiring board for testing loaded printed circuit board
GB2470868A (en) Receiver for recovering and retiming electromagnetically coupled data
CN106133531A (en) Contact assembly, particularly HF measure head
US7525319B1 (en) Method and apparatus to electrically qualify high speed PCB connectors
CN200989913Y (en) Testing connector for picking up high frequency signal
US9482695B2 (en) High bandwidth differential lead with device connection
US9880198B2 (en) High bandwidth signal probe tip
TW200501181A (en) Apparatus and method for testing electronic component
US7342466B2 (en) Hybrid coupler having resistive coupling and electromagnetic coupling
TW200634311A (en) Vertical probe card
TW200704936A (en) Resilient micro-probe structure
US9075085B2 (en) Test system for analyzing a circuit carrier
KR20180040324A (en) Probe tip assembly
US20120050117A1 (en) Electromagnetic interference test device
JPH095461A (en) Propagation delay time measuring circuit for measurement signal
TWI479157B (en) Probe card structure
SG145579A1 (en) High frequency cantilever-type probe card