TW200626916A - Antenna test chamber for dual tests - Google Patents

Antenna test chamber for dual tests

Info

Publication number
TW200626916A
TW200626916A TW094101595A TW94101595A TW200626916A TW 200626916 A TW200626916 A TW 200626916A TW 094101595 A TW094101595 A TW 094101595A TW 94101595 A TW94101595 A TW 94101595A TW 200626916 A TW200626916 A TW 200626916A
Authority
TW
Taiwan
Prior art keywords
antenna
tests
test chamber
antenna test
dual
Prior art date
Application number
TW094101595A
Other languages
Chinese (zh)
Other versions
TWI258588B (en
Inventor
Hua-Ching Yang
Original Assignee
Mitac Int Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitac Int Corp filed Critical Mitac Int Corp
Priority to TW94101595A priority Critical patent/TWI258588B/en
Application granted granted Critical
Publication of TWI258588B publication Critical patent/TWI258588B/en
Publication of TW200626916A publication Critical patent/TW200626916A/en

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)

Abstract

An antenna test chamber for dual tests for conducting related electromagnetic wave tests of an electronic device mainly has an antenna stand capable of being selectively mounted by a testing antenna, such that two related electromagnetic wave tests of the electronic device can share a same testing chamber and the test error generated by moving testing antenna can be reduced.
TW94101595A 2005-01-19 2005-01-19 Antenna test chamber for dual tests TWI258588B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94101595A TWI258588B (en) 2005-01-19 2005-01-19 Antenna test chamber for dual tests

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94101595A TWI258588B (en) 2005-01-19 2005-01-19 Antenna test chamber for dual tests

Publications (2)

Publication Number Publication Date
TWI258588B TWI258588B (en) 2006-07-21
TW200626916A true TW200626916A (en) 2006-08-01

Family

ID=37765347

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94101595A TWI258588B (en) 2005-01-19 2005-01-19 Antenna test chamber for dual tests

Country Status (1)

Country Link
TW (1) TWI258588B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI807847B (en) * 2022-06-06 2023-07-01 川升股份有限公司 Antenna measurement chamber with primary reflection suppression

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI769846B (en) * 2019-12-05 2022-07-01 鴻勁精密股份有限公司 Rfic testing apparatus and testing equipment using the same
TWI734288B (en) * 2019-12-05 2021-07-21 鴻勁精密股份有限公司 Radio frequency electronic component test device and test operation equipment for its application
TWI756138B (en) * 2019-12-05 2022-02-21 鴻勁精密股份有限公司 Rfic testing apparatus and testing equipment using the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI807847B (en) * 2022-06-06 2023-07-01 川升股份有限公司 Antenna measurement chamber with primary reflection suppression

Also Published As

Publication number Publication date
TWI258588B (en) 2006-07-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees