TWI807847B - Antenna measurement chamber with primary reflection suppression - Google Patents
Antenna measurement chamber with primary reflection suppression Download PDFInfo
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本發明是關於一種天線量測暗室，特別是具有初次反射抑制的天線量測暗室。 The invention relates to an antenna measurement darkroom, in particular to an antenna measurement darkroom with primary reflection suppression.
現今普遍使用的天線量測暗室是由六個矩形組成的一長方體，其缺點在於：若該天線量測暗室是採用如圖1所示的直接遠場(Direct Far Field,DFF)量測技術，則待測物放置的靜區(Quiet Zone,QZ)不但會接收到來自標準增益天線直接入射的視線(line-of-sight)電磁波11，也會收到初次反射的非視線(Non-line-of-sight)電磁波12，且初次反射的非視線電磁波12因為與直接入射的視線電磁波11均來自同個該標準增益天線ANT1但卻有不同的相位差，因此初次反射的非視線電磁波12無可避免的會對視線電磁波11造成同頻干擾進而導致靜區QZ中的電場振幅與相位變化變大，靜區品質的說明與規範可參考網路公開資料3GPP TR 38.810。 The antenna measurement chamber commonly used today is a cuboid composed of six rectangles. The disadvantage is that if the antenna measurement chamber adopts the direct far field (DFF) measurement technology as shown in Figure 1, the quiet zone (Quiet Zone, QZ) where the object to be measured is placed will not only receive the line-of-sight electromagnetic wave 11 directly incident from the standard gain antenna, but also receive the first reflected non-line-of-sight electromagnetic wave 1 2. The first reflected non-line-of-sight electromagnetic wave 12 and the directly incident line-of-sight electromagnetic wave 11 all come from the same standard gain antenna ANT1 but have different phase differences. Therefore, the first-time reflected non-line-of-sight electromagnetic wave 12 will inevitably cause co-frequency interference to the line-of-sight electromagnetic wave 11, which will cause the electric field amplitude and phase change in the quiet zone QZ to become larger. For the description and specifications of the quiet zone quality, please refer to the public information 3GPP TR 38.810 on the Internet.
若採用如圖2所示綜合遠場及縮距場的天線量測暗室(證書號I697682)則待測物放置的靜區同樣會接收到來自直接遠場標準增益天線ANT2初次反射的非視線電磁波12，或是接收到來自縮距場標準增益天線ANT3之背向輻 射所導致的初次反射的非視線電磁波12，與前述同樣的原因這些非視線電磁波12都會導致靜區QZ的品質變差。 If the antenna measurement chamber (certificate number I697682) integrating far-field and narrow-distance field is used as shown in Figure 2, the quiet zone where the object to be measured is placed will also receive the non-line-of-sight electromagnetic wave 12 first reflected from the direct far-field standard gain antenna ANT2, or receive the back radiation from the narrow-distance field standard gain antenna ANT3. The first reflected non-line-of-sight electromagnetic waves 12 caused by radiation, these non-line-of-sight electromagnetic waves 12 will cause the quality of the quiet zone QZ to deteriorate for the same reason as above.
又或者，CN103163340A號專利所揭露的電波暗室是採用如圖3所示特殊的半球形罩體，但顯而易見的缺點就是不如長方體的電波暗室建置便利。 Alternatively, the anechoic chamber disclosed in the CN103163340A patent uses a special hemispherical cover as shown in FIG. 3 , but the obvious disadvantage is that it is not as convenient to construct as a cuboid anechoic chamber.
參閱圖4，專利I542884則是利用固定在長方體隔離室壁面13上之角錐狀的兩個反射擾動金屬片141、142來改變反射波的路徑方向，但缺點在於 Referring to Fig. 4, the patent I542884 utilizes two pyramid-shaped reflective disturbance metal sheets 141, 142 fixed on the cuboid isolation chamber wall 13 to change the path direction of the reflected wave, but the disadvantage is that
(1)、該等反射擾動金屬片141、142是固定式的設計，一但建置完成就無法移動，無法根據靜區品質的最佳化微調到最佳位置，特別是近年無線通訊世代更新快速，例如該等反射擾動金屬片141、142對於5G Sub-6頻段及5G mmWave頻段兩者之最佳靜區品質的位置不一定是相同的，而對於低軌衛星通訊頻段也可能不同，但是為了提升電波暗室的共用性，專利I542884的方式就不再適合沿用，此外，不同頻段的量測必須置換不同頻段的標準增益天線ANT4，而不同頻段的標準增益天線ANT4其半功率波束寬並不會相同，因此，發生初次反射的位置也會不一樣，需要對應所採用的該個標準增益天線ANT4去實測。 (1) The reflective disturbance metal sheets 141 and 142 are of fixed design, and cannot be moved once the construction is completed, and cannot be fine-tuned to the best position according to the optimization of the quiet zone quality, especially in recent years, the generation of wireless communication is updated rapidly. The commonality of the patent I542884 is no longer suitable for use. In addition, the measurement of different frequency bands must replace the standard gain antenna ANT4 of different frequency bands, and the half-power beam width of the standard gain antenna ANT4 of different frequency bands will not be the same. Therefore, the position where the first reflection occurs will also be different, and it is necessary to use the standard gain antenna ANT4 for actual measurement.
(2)、同理，正是因為該等反射擾動金屬片141、142是固定式的設計，所以形狀也不方便改變。 (2) Similarly, it is precisely because the reflection and disturbance metal sheets 141 and 142 are fixed in design, so the shape is inconvenient to change.
為了解決先前技術的問題，本發明提出了一種能抑制初次反射的天線量測暗室，包含一長方體形狀的電波隔離室、一直接遠場標準增益天線、一待測物乘載台、一第一凸面反射鏡、一第二凸面反射鏡、一第三凸面反射鏡及一第四凸面反射鏡。 In order to solve the problems of the prior art, the present invention proposes an antenna measurement darkroom capable of suppressing primary reflections, which includes a cuboid-shaped radio wave isolation chamber, a direct far-field standard gain antenna, an object-to-be-measured platform, a first convex reflector, a second convex reflector, a third convex reflector, and a fourth convex reflector.
該長方體形狀的電波隔離室包括一第一至第六電波屏蔽板，其中，該第一電波屏蔽板及該第二電波屏蔽板平行間隔排列且面積最小，該第三電波屏蔽板面積最大，該第三電波屏蔽板及該第四電波屏蔽板平行一地面設置，且該第四電波屏蔽板位於該第三電波屏蔽板及該地面之間，該第一電波屏蔽板垂直地連接該第三電波屏蔽板的一短邊及該第四電波屏蔽板的一短邊，該第二電波屏蔽板也垂直地連接該第三電波屏蔽板及該第四電波屏蔽板，該第五電波屏蔽板垂直地連接該第三電波屏蔽板的一長邊及該第四電波屏蔽板的一長邊，該第六電波屏蔽板與該第五電波屏蔽板平行間隔排列。 The rectangular parallelepiped-shaped electric wave isolation chamber includes first to sixth electric wave shielding plates, wherein, the first electric wave shielding plate and the second electric wave shielding plate are arranged in parallel at intervals and have the smallest area, the third electric wave shielding plate has the largest area, the third electric wave shielding plate and the fourth electric wave shielding plate are arranged parallel to a ground, and the fourth electric wave shielding plate is located between the third electric wave shielding plate and the ground, the first electric wave shielding plate vertically connects a short side of the third electric wave shielding plate and a short side of the fourth electric wave shielding plate, and the second electric wave shielding plate The wave shielding plate is also vertically connected to the third electric wave shielding plate and the fourth electric wave shielding plate, the fifth electric wave shielding plate is vertically connected to a long side of the third electric wave shielding plate and a long side of the fourth electric wave shielding plate, and the sixth electric wave shielding plate is arranged in parallel with the fifth electric wave shielding plate.
該直接遠場標準增益天線及該待測物乘載台均設置於該電波隔離室內，且分別鄰近該第一電波屏蔽板及該第二電波屏蔽板。 The direct far-field standard gain antenna and the object-to-be-tested platform are both arranged in the radio wave isolation chamber, and are respectively adjacent to the first radio wave shielding plate and the second radio wave shielding plate.
該第一凸面反射鏡可移動地設置於該電波隔離室中鄰近該第三電波屏蔽板的位置，該第一凸面反射鏡用以分散該直接遠場標準增益天線一次入射到該第三電波屏蔽板方向上的電磁波。 The first convex reflector is movably arranged in the radio wave isolation chamber adjacent to the third radio wave shielding plate, and the first convex reflector is used to disperse the electromagnetic waves incident on the third radio wave shielding plate by the direct far-field standard booster antenna.
該第二凸面反射鏡可移動地設置於該電波隔離室中鄰近該第四電波屏蔽板的位置，該第一凸面反射鏡用以分散該直接遠場標準增益天線一次入射到該第四電波屏蔽板方向上的電磁波。 The second convex reflector is movably arranged in the radio wave isolation chamber adjacent to the fourth radio wave shielding plate, and the first convex reflector is used to disperse the electromagnetic waves incident on the fourth radio wave shielding plate by the direct far-field standard booster antenna.
該第三凸面反射鏡可移動地設置於該電波隔離室中鄰近該第五電波屏蔽板的位置，該第五電波屏蔽板及該第六電波屏蔽板平行間隔排列，該第三凸面反射鏡用以分散該直接遠場標準增益天線一次入射到該第五電波屏蔽板方向上的電磁波。 The third convex reflector is movably arranged in the electric wave isolation chamber adjacent to the fifth electric wave shielding plate, the fifth electric wave shielding plate and the sixth electric wave shielding plate are arranged in parallel and spaced apart, and the third convex reflector is used to disperse the electromagnetic waves incident on the fifth electric wave shielding plate by the direct far-field standard booster antenna once.
該第四凸面反射鏡可移動地設置於該電波隔離室中鄰近該第六電波屏蔽板的位置，該第四凸面反射鏡用以分散該直接遠場標準增益天線一次入射到該第六電波屏蔽板方向上的電磁波。 The fourth convex reflector is movably arranged in the radio wave isolation chamber adjacent to the sixth radio wave shielding plate, and the fourth convex reflector is used to disperse the electromagnetic waves incident on the sixth radio wave shielding plate by the direct far-field standard booster antenna.
較佳的，該第一至第六電波屏蔽板的每一個凸面上都覆蓋一電磁波吸收體。 Preferably, each convex surface of the first to sixth electric wave shielding plates is covered with an electromagnetic wave absorber.
較佳的，該初次反射抑制的天線量測暗室還包含一凹面反射鏡及一縮距場標準增益天線。該凹面反射鏡設置於電波隔離室中鄰近該第一電波屏蔽板的位置，該縮距場標準增益天線設置於該凹面反射鏡的一光學焦點的位置，該縮距場標準增益天線的一最大輻射波束朝向該凹面反射鏡，該凹面反射鏡反射該主輻射波束朝向該待測物乘載台。 Preferably, the antenna measurement darkroom with primary reflection suppression further includes a concave reflector and a narrow field standard gain antenna. The concave reflector is arranged in the electric wave isolation chamber adjacent to the first electric wave shielding plate, the narrowed-field standard gain antenna is set at an optical focal point of the concave reflector, a maximum radiation beam of the narrowed-field standard gain antenna faces the concave reflector, and the concave reflector reflects the main radiation beam toward the object-to-be-tested carrier.
本發明的效果在於：(1)、不同頻段的該直接遠場標準增益天線或該縮距場標準增益天線會具有不同的半功率波束寬度(HPBW)，而不同的半功率波束寬度則會在該電波隔離室的不同位置發生初次反射，而隨著通訊頻段的擴增，一個該電波隔離室不但需要用來量測5G Sub-7的頻段，也需要量測衛星Ku/Ka頻段，或是5G mmWave頻段，因此該直接遠場標準增益天線或該縮距場標準增益天線對需要更換成對應待測物之天線的頻段，而可移動的該第一至第四凸面反射鏡就可以解決初次反射發生在不同位置的問題；(2)、專利I542884的反射擾動金屬片仍是平面結構，平面型的反射鏡其特性就是入射波與反射波的功率密度特性仍是趨近一致，然而，該第一至第四凸面反射鏡卻能以凸面結構將入射波發散，進而能更有效降低反射波的功率密度；及(3)、因前述第(1)、(2)點的原因，使得該電波隔離室可採用長方體形狀，建置方便成本低， 此外，更能因初次反射電磁波被發散及抑制，採用比現今電波隔離室高度低的設計，克服既有建築物樓層實際可使用高度低於3公尺的問題。 The effect of the present invention is: (1), the direct far-field standard gain antenna or the narrow-field standard gain antenna of different frequency bands will have different half-power beam widths (HPBW), and different half-power beam widths will first reflect at different positions of the radio wave isolation room, and with the expansion of communication frequency bands, one radio wave isolation room needs to be used not only to measure the frequency band of 5G Sub-7, but also to measure the satellite Ku/Ka frequency band, or 5G mmWave frequency band, so the direct far field The standard gain antenna or the narrow field standard gain antenna pair needs to be replaced with the frequency band of the antenna corresponding to the object under test, and the movable first to fourth convex reflectors can solve the problem that the first reflection occurs at different positions; (2), the reflection disturbance metal sheet of the patent I542884 is still a planar structure, and the characteristic of the planar reflector is that the power density characteristics of the incident wave and the reflected wave are still close to the same. Effectively reduce the power density of the reflected wave; and (3), due to the reasons of the aforementioned points (1) and (2), the radio wave isolation chamber can adopt a rectangular parallelepiped shape, which is convenient for construction and low in cost. In addition, due to the divergence and suppression of the first reflected electromagnetic wave, a design with a lower height than the current radio wave isolation room is adopted to overcome the problem that the actual usable height of the floors of existing buildings is less than 3 meters.
11:視線電磁波 11: Line of sight electromagnetic waves
12:非視線電磁波 12: Non-line-of-sight electromagnetic waves
13:隔離室 13: Isolation room
141、142:反射擾動金屬片 141, 142: reflective disturbance metal sheet
2:電波隔離室 2: Radio wave isolation room
21:第一電波屏蔽板 21: The first radio wave shielding board
22:第二電波屏蔽板 22: The second radio wave shielding plate
23:第三電波屏蔽板 23: The third electric wave shielding plate
24:第四電波屏蔽板 24: The fourth electric wave shielding plate
25:第五電波屏蔽板 25: The fifth electric wave shielding plate
26:第六電波屏蔽板 26: The sixth radio wave shielding board
3:直接遠場標準增益天線 3: Direct far-field standard gain antenna
4:待測物乘載台 4: The platform for the object to be tested
5:第一凸面反射鏡 5: The first convex mirror
6:第二凸面反射鏡 6: Second convex mirror
7:第三凸面反射鏡 7: The third convex mirror
8:第四凸面反射鏡 8: The fourth convex mirror
01:凹面反射鏡 01: Concave mirror
02:縮距場標準增益天線 02:Short distance field standard gain antenna
03:地面 03: Ground
04:電磁波吸收體 04: Electromagnetic wave absorber
〔圖1〕是傳統直接遠場天線量測暗室的光學分析圖。 [Figure 1] is an optical analysis diagram of a traditional direct far-field antenna measurement chamber.
〔圖2〕是傳統綜合遠場及縮距場之天線量測暗室的光學分析圖。 [Fig. 2] is the optical analysis diagram of the traditional far-field and short-distance field antenna measurement darkroom.
〔圖3〕是傳統半球形罩體的電波暗室。 [Fig. 3] is an anechoic chamber of a traditional hemispherical cover.
〔圖4〕是傳統加入擾動金屬片之電波暗室的示意圖。 [Fig. 4] is a schematic diagram of a conventional anechoic chamber with perturbation metal sheets.
〔圖5〕是本發明第一較佳實施例的局部示意圖。 [Fig. 5] is a partial schematic view of the first preferred embodiment of the present invention.
〔圖6〕是本發明第一較佳實施例另一視角的局部示意圖。 [Fig. 6] is a partial schematic diagram of another viewing angle of the first preferred embodiment of the present invention.
〔圖7〕是光學分析圖，說明第一較佳實施例第三及第四凸面反射鏡的功效。 [FIG. 7] is an optical analysis diagram illustrating the effects of the third and fourth convex mirrors of the first preferred embodiment.
〔圖8〕是光學分析圖，對比圖7說明移除第三及第四凸面反射鏡後的差異。 [Fig. 8] is an optical analysis diagram, comparing with Fig. 7 to illustrate the difference after removing the third and fourth convex mirrors.
〔圖9〕說明每一個凸面反射鏡加上電磁波吸收體後的示意圖。 [FIG. 9] A schematic diagram illustrating the addition of an electromagnetic wave absorber to each convex mirror.
〔圖10〕是本發明第二較佳實施例的局部示意圖。 [Fig. 10] is a partial schematic view of a second preferred embodiment of the present invention.
〔圖11〕是第二較佳實施例的分學分析圖。 [FIG. 11] is an analysis diagram of the second preferred embodiment.
〔圖12〕是光學分析圖，對比圖11說明移除第三及第四凸面反射鏡後的差異。 [Fig. 12] is an optical analysis diagram, comparing with Fig. 11 to illustrate the difference after removing the third and fourth convex mirrors.
參閱圖5及圖6，本發明初次反射抑制的天線量測暗室的第一較佳實施例包含一長方體形狀的電波隔離室2、一直接遠場標準增益天線3、一待測物乘載台4、一第一凸面反射鏡5、一第二凸面反射鏡6、一第三凸面反射鏡7及一第四凸面反射鏡8。 Referring to Fig. 5 and Fig. 6, the first preferred embodiment of the antenna measurement darkroom of primary reflection suppression of the present invention comprises a cuboid-shaped radio wave isolation chamber 2, a direct far-field standard gain antenna 3, an object-to-be-measured platform 4, a first convex reflector 5, a second convex reflector 6, a third convex reflector 7 and a fourth convex reflector 8.
該電波隔離室2包括一第一至第六電波屏蔽板21~26，其中，該第一電波屏蔽板21及該第二電波屏蔽板22平行間隔排列且面積最小，該第三電波屏蔽板23面積最大，該第三電波屏蔽板23及該第四電波屏蔽板24平行一地面03設置，且該第四電波屏蔽板24位於該第三電波屏蔽板23及該地面03之間，該第一電波屏蔽板21垂直地連接該第三電波屏蔽板23的一短邊及該第四電波屏蔽板24的一短邊，該第二電波屏蔽板22也垂直地連接該第三電波屏蔽板23及該第四電波屏蔽板24，該第五電波屏蔽板25垂直地連接該第三電波屏蔽板23的一長邊及該第四電波屏蔽板24的一長邊，該第六電波屏蔽板26與該第五電波屏蔽板25平行間隔排列。 The radio wave isolation chamber 2 includes a first to sixth radio wave shielding plates 21 to 26, wherein the first radio wave shielding plate 21 and the second radio wave shielding plate 22 are arranged in parallel at intervals and have the smallest area, the third radio wave shielding plate 23 has the largest area, the third radio wave shielding plate 23 and the fourth radio wave shielding plate 24 are arranged parallel to a ground 03, and the fourth radio wave shielding plate 24 is located between the third radio wave shielding plate 23 and the ground 03, and the first radio wave shielding plate 21 is vertically connected to the third radio wave shielding plate 23. A short side of the shielding plate 23 and a short side of the fourth electric wave shielding plate 24, the second electric wave shielding plate 22 is also vertically connected to the third electric wave shielding plate 23 and the fourth electric wave shielding plate 24, the fifth electric wave shielding plate 25 is vertically connected to a long side of the third electric wave shielding plate 23 and a long side of the fourth electric wave shielding plate 24, the sixth electric wave shielding plate 26 and the fifth electric wave shielding plate 25 are arranged in parallel and spaced apart.
該直接遠場標準增益天線3及該待測物乘載台4均設置於該電波隔離室2內，且分別鄰近該第一電波屏蔽板21及該第二電波屏蔽板22。 The direct far-field standard gain antenna 3 and the DUT carrying platform 4 are both disposed in the radio wave isolation chamber 2 and adjacent to the first radio wave shielding plate 21 and the second radio wave shielding plate 22 respectively.
該第一凸面反射鏡5可移動地設置於該電波隔離室2中鄰近該第三電波屏蔽板23的位置，該第一凸面反射鏡5用以分散該直接遠場標準增益天線3一次入射到該第三電波屏蔽板23方向上的電磁波。 The first convex reflector 5 is movably arranged in the radio wave isolation chamber 2 adjacent to the third radio wave shielding plate 23, and the first convex reflector 5 is used to disperse the electromagnetic waves incident on the direction of the third radio wave shielding plate 23 by the direct far-field standard booster antenna 3 once.
該第二凸面反射鏡6可移動地設置於該電波隔離室2中鄰近該第四電波屏蔽板24的位置，該第一凸面反射鏡5用以分散該直接遠場標準增益天線3一次入射到該第四電波屏蔽板24方向上的電磁波。 The second convex reflector 6 is movably arranged in the radio wave isolation chamber 2 adjacent to the fourth radio wave shielding plate 24, and the first convex reflector 5 is used to disperse the electromagnetic waves incident on the direction of the fourth radio wave shielding plate 24 by the direct far-field standard booster antenna 3 once.
該第三凸面反射鏡7可移動地設置於該電波隔離室2中鄰近該第五電波屏蔽板25的位置，該第五電波屏蔽板25及該第六電波屏蔽板26平行間隔排列，該第三凸面反射鏡7用以分散該直接遠場標準增益天線3一次入射到該第五電波屏蔽板25方向上的電磁波。 The third convex reflector 7 is movably arranged in the radio wave isolation chamber 2 adjacent to the fifth radio wave shielding plate 25, the fifth radio wave shielding plate 25 and the sixth radio wave shielding plate 26 are arranged in parallel and spaced apart, and the third convex reflector 7 is used to disperse the electromagnetic waves incident on the fifth radio wave shielding plate 25 once incident on the direct far-field standard booster antenna 3.
該第四凸面反射鏡8可移動地設置於該電波隔離室2中鄰近該第六電波屏蔽板26的位置，該第四凸面反射鏡8用以分散該直接遠場標準增益天線3一次入射到該第六電波屏蔽板26方向上的電磁波。 The fourth convex reflector 8 is movably arranged in the radio wave isolation chamber 2 adjacent to the sixth radio wave shielding plate 26, and the fourth convex reflector 8 is used to disperse the electromagnetic waves incident on the sixth radio wave shielding plate 26 by the direct far-field standard booster antenna 3 once.
圖7是該第三凸面反射鏡7分散一次入射到該第五電波屏蔽板25方向上的電磁波，以及該第四凸面反射鏡8分散一次入射到該第六電波屏蔽板26方向上的電磁波的光學分析圖，從中可以瞭解凸面鏡具有分散反射波的效果，且初次反射的電磁波功率密度通常是最大的，因此只要能降低初次反射的功率密度分佈則二次反射對量測的干擾通常就無需考慮。 7 is an optical analysis diagram of the third convex reflector 7 dispersing the electromagnetic wave incident on the direction of the fifth electric wave shielding plate 25, and the fourth convex reflector 8 dispersing the electromagnetic wave incident on the direction of the sixth electric wave shielding plate 26. From this, it can be understood that the convex mirror has the effect of dispersing the reflected wave, and the power density of the first reflected electromagnetic wave is usually the largest. Therefore, as long as the power density distribution of the first reflection can be reduced, the interference of the second reflection on the measurement usually does not need to be considered.
圖8是將圖7中的該第三及第四凸面反射鏡7、8移除後的光學分析圖，從中可以看到初次反射的電磁波會入射到該待測物乘載台4，進而造成靜區中的參考量測訊號不穩定的波動，而這個問題就是該電波隔離室2所應該要避免的，此外，同時比對圖7、8，也可以證明該第三及第四凸面反射鏡7、8具有分散反射波以降低電磁波功率密度的效果，同理，該第一及第二凸面反射鏡5、6也具有同樣的功效，因此不再重複示出。 Fig. 8 is an optical analysis diagram after removing the third and fourth convex mirrors 7 and 8 in Fig. 7, from which it can be seen that the first reflected electromagnetic wave will be incident on the object-to-be-tested carrier 4, thereby causing unstable fluctuations in the reference measurement signal in the quiet zone, and this problem should be avoided in the radio wave isolation chamber 2. In addition, comparing Figs. And the second convex mirrors 5, 6 also have the same effect, so it will not be shown again.
參閱圖9，該第一至第六電波屏蔽板21~26各自都覆蓋一電磁波吸收體04。 Referring to FIG. 9 , the first to sixth electromagnetic wave shielding plates 21 to 26 each cover an electromagnetic wave absorber 04 .
圖10是本發明的第二較佳實施例，第二較佳實施例與該第一較佳實施例的差異在於：還包含一凹面反射鏡01及一縮距場標準增益天線02。該凹面反射鏡01設置於電波隔離室2中鄰近該第一電波屏蔽板21的位置，該縮距場標準增益天線02設置於該凹面反射鏡01的一光學焦點的位置，該縮距場標準增益天線02的一最大輻射波束朝向該凹面反射鏡01，該凹面反射鏡01反射該主輻射波束朝向該待測物乘載台4。 FIG. 10 is the second preferred embodiment of the present invention. The difference between the second preferred embodiment and the first preferred embodiment is that it further includes a concave reflector 01 and a narrow field standard gain antenna 02 . The concave reflector 01 is arranged at a position adjacent to the first radio shielding plate 21 in the radio wave isolation chamber 2, and the reduced-distance field standard gain antenna 02 is arranged at an optical focal point of the concave reflector 01. A maximum radiation beam of the reduced-distance standard gain antenna 02 is directed toward the concave reflector 01, and the concave reflector 01 reflects the main radiation beam toward the object-to-be-tested platform 4.
圖11是第二較佳實施例的光學分析圖，從中可以瞭解可移動的該第三及第四凸面反射鏡7、8便於調整位置，使該縮距場標準增益天線02的背向輻射被該第四凸面反射鏡8改變行進路徑且發散，同理，該第三凸面反射鏡7也能避免該直接遠場標準增益天線3一次入射到該第五電波屏蔽板25方向上的電磁波被反射到該待測物乘載台4。 11 is an optical analysis diagram of the second preferred embodiment, from which it can be understood that the movable third and fourth convex reflectors 7, 8 are convenient to adjust the position, so that the back radiation of the narrow-distance field standard gain antenna 02 is changed by the fourth convex reflector 8 and diverges. Similarly, the third convex reflector 7 can also prevent the direct far-field standard gain antenna 3 from being reflected to the object under test.
圖12是將圖11中的該第三及第四凸面反射鏡7、8移除後的光學分析圖，從中可以明瞭該直接遠場標準增益天線3一次入射到該第五電波屏蔽板25方向上的電磁波確實會被反射到該待測物乘載台4，並且，該縮距場標準增益天線02的背向輻射也會被該第六電波屏蔽板26初次反射到該待測物乘載台4，從而干擾量測的準確度。 12 is an optical analysis diagram after the third and fourth convex reflectors 7 and 8 in FIG. 11 are removed, from which it can be seen that the electromagnetic wave incident on the direction of the fifth electric wave shielding plate 25 by the direct far-field standard booster antenna 3 will indeed be reflected to the object-under-test platform 4, and the back radiation of the narrow-field standard booster antenna 02 will also be reflected by the sixth radio-wave shield plate 26 to the object-under-test platform 4 for the first time, thereby disturbing the accuracy of measurement.
本發明的效果在於：(1)、不同頻段的該直接遠場標準增益天線3或該縮距場標準增益天線02會具有不同的半功率波束寬度(HPBW)，而不同的半功率波束寬度則會在該電波隔離室2的不同位置發生初次反射，而隨著通訊頻段的擴增，一個該電波隔離室2不但需要用來量測5G Sub-7的頻段，也需要量測衛星Ku/Ka頻段，或是5G mmWave頻段，因此該直接遠場標準增益天線3或該縮距場標準增益天線02對需要更換成對應待測物之天線的頻段，而可移動的該第一至第四凸面反射鏡8就可以解決初次反射發生在不同位置的問題；(2)、專利I542884的反射擾動金屬片仍是平面結構，平面型的反射鏡其特性就是入射波與反射波的功率密度特性仍是趨近一致，然而，該第一至第四凸面反射鏡8卻能以凸面結構將入射波發散，進而能更有效降低反射波的功率密度；及(3)、因前述第(1)、(2)點的原因，使得該電波隔離室2可採用長方體形狀，建置方便成本低，此 外，更能因初次反射電磁波被發散及抑制，採用高度較低的設計，克服既有建築物樓層實際可使用高度低於3公尺的問題。 The effects of the present invention are: (1), the direct far-field standard gain antenna 3 or the narrow-field standard gain antenna 02 of different frequency bands will have different half-power beamwidths (HPBW), and different half-power beamwidths will first reflect at different positions of the radio wave isolation room 2, and with the expansion of communication frequency bands, one radio wave isolation room 2 needs to be used not only to measure the frequency band of 5G Sub-7, but also to measure the satellite Ku/Ka frequency band, or 5G mmWave frequency band, Therefore, the direct far-field standard gain antenna 3 or the narrow-distance field standard gain antenna 02 need to be replaced with the frequency band of the antenna corresponding to the object under test, and the movable first to fourth convex reflectors 8 can solve the problem that the initial reflection occurs at different positions; (2), the reflection disturbance metal sheet of the patent I542884 is still a planar structure, and the characteristic of the planar reflector is that the power density characteristics of the incident wave and the reflected wave are still close to the same. However, the first to fourth convex reflectors 8 can be in a convex structure. The incident wave is diverged, so that the power density of the reflected wave can be reduced more effectively; and (3), due to the aforementioned reasons of (1) and (2), the radio wave isolation chamber 2 can adopt a rectangular parallelepiped shape, which is convenient for construction and low in cost. In addition, due to the divergence and suppression of the first reflected electromagnetic wave, the design with a lower height overcomes the problem that the actual usable height of the floors of existing buildings is less than 3 meters.
惟以上所述者，僅為本發明之實施例而已，當不能以此限定本發明實施之範圍，凡是依本發明申請專利範圍及專利說明書內容所作之簡單地等效變化與修飾，皆仍屬本發明專利涵蓋之範圍內。 But the above are only the embodiments of the present invention, and should not limit the implementation scope of the present invention. All simple equivalent changes and modifications made according to the patent scope of the present invention and the content of the patent specification are still within the scope of the patent of the present invention.
2:電波隔離室 2: Radio wave isolation room
21:第一電波屏蔽板 21: The first radio wave shielding board
22:第二電波屏蔽板 22: The second radio wave shielding plate
25:第五電波屏蔽板 25: The fifth electric wave shielding plate
26:第六電波屏蔽板 26: The sixth radio wave shielding board
3:直接遠場標準增益天線 3: Direct far-field standard gain antenna
4:待測物乘載台 4: The platform for the object to be tested
7:第三凸面反射鏡 7: The third convex mirror
8:第四凸面反射鏡 8: The fourth convex mirror
01:凹面反射鏡 01: Concave mirror
02:縮距場標準增益天線 02:Short distance field standard gain antenna
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