SG138517A1 - High-frequency probe card and transmission line for high-frequency probe card - Google Patents

High-frequency probe card and transmission line for high-frequency probe card

Info

Publication number
SG138517A1
SG138517A1 SG200702176-9A SG2007021769A SG138517A1 SG 138517 A1 SG138517 A1 SG 138517A1 SG 2007021769 A SG2007021769 A SG 2007021769A SG 138517 A1 SG138517 A1 SG 138517A1
Authority
SG
Singapore
Prior art keywords
signal
frequency
circuits
probe card
frequency probe
Prior art date
Application number
SG200702176-9A
Other languages
English (en)
Inventor
Wei-Cheng Ku
Hsin-Hung Lin
Chih-Hao Ho
Te-Chen Feng
Original Assignee
Mjc Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mjc Probe Inc filed Critical Mjc Probe Inc
Publication of SG138517A1 publication Critical patent/SG138517A1/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG200702176-9A 2006-07-06 2007-03-23 High-frequency probe card and transmission line for high-frequency probe card SG138517A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95124686A TW200804822A (en) 2006-07-06 2006-07-06 High-frequency probe card and transmission line for high-frequency probe card

Publications (1)

Publication Number Publication Date
SG138517A1 true SG138517A1 (en) 2008-01-28

Family

ID=39004448

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200702176-9A SG138517A1 (en) 2006-07-06 2007-03-23 High-frequency probe card and transmission line for high-frequency probe card

Country Status (2)

Country Link
SG (1) SG138517A1 (https=)
TW (1) TW200804822A (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116990560A (zh) * 2022-04-26 2023-11-03 芯恩（青岛）集成电路有限公司 适用于测试不同角度Testkey的WAT探针卡
CN120610148A (zh) * 2025-08-11 2025-09-09 广州广合科技股份有限公司 一种线路板插损测试方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407106B (zh) * 2009-09-17 2013-09-01 Mpi Corp High frequency cantilever probe card
WO2013006771A2 (en) 2011-07-06 2013-01-10 Celadon Systems, Inc. Test systems with a probe apparatus and index mechanism
TW201305574A (zh) 2011-07-22 2013-02-01 Mpi Corp 高頻訊號路徑調整方式及其測試裝置
TWI512300B (zh) * 2013-07-15 2015-12-11 Mpi Corp Cantilever high frequency probe card
TWI572867B (zh) * 2015-06-05 2017-03-01 Mpi Corp Probe module with feedback test function (2)
TWI576590B (zh) * 2015-07-03 2017-04-01 Mpi Corp Cantilever high frequency probe card
TW202035995A (zh) * 2019-03-18 2020-10-01 旺矽科技股份有限公司 探針裝置
TWI707145B (zh) * 2019-09-24 2020-10-11 松翰股份有限公司 用於影像感測晶片之探針卡的探針頭結構

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116990560A (zh) * 2022-04-26 2023-11-03 芯恩（青岛）集成电路有限公司 适用于测试不同角度Testkey的WAT探针卡
CN120610148A (zh) * 2025-08-11 2025-09-09 广州广合科技股份有限公司 一种线路板插损测试方法

Also Published As

Publication number Publication date
TW200804822A (en) 2008-01-16
TWI306154B (https=) 2009-02-11

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