SG138473A1 - System and method for automated focus measuring of a lithography tool - Google Patents
System and method for automated focus measuring of a lithography toolInfo
- Publication number
- SG138473A1 SG138473A1 SG200603913-5A SG2006039135A SG138473A1 SG 138473 A1 SG138473 A1 SG 138473A1 SG 2006039135 A SG2006039135 A SG 2006039135A SG 138473 A1 SG138473 A1 SG 138473A1
- Authority
- SG
- Singapore
- Prior art keywords
- wafer
- focus
- lithography tool
- patterned image
- parameters
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70491—Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
- G03F7/70516—Calibration of components of the microlithographic apparatus, e.g. light sources, addressable masks or detectors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70641—Focus
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US39193102P | 2002-06-28 | 2002-06-28 | |
US10/301,627 US6885429B2 (en) | 2002-06-28 | 2002-11-22 | System and method for automated focus measuring of a lithography tool |
Publications (1)
Publication Number | Publication Date |
---|---|
SG138473A1 true SG138473A1 (en) | 2008-01-28 |
Family
ID=29718517
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200603913-5A SG138473A1 (en) | 2002-06-28 | 2003-06-24 | System and method for automated focus measuring of a lithography tool |
SG200303720A SG103389A1 (en) | 2002-06-28 | 2003-06-24 | System and method for automated focus measuring of a lithography tool |
SG200603912-7A SG138472A1 (en) | 2002-06-28 | 2003-06-24 | System and method for automated focus measuring of a lithography tool |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200303720A SG103389A1 (en) | 2002-06-28 | 2003-06-24 | System and method for automated focus measuring of a lithography tool |
SG200603912-7A SG138472A1 (en) | 2002-06-28 | 2003-06-24 | System and method for automated focus measuring of a lithography tool |
Country Status (7)
Country | Link |
---|---|
US (2) | US6885429B2 (fr) |
EP (1) | EP1376052A3 (fr) |
JP (1) | JP4083636B2 (fr) |
KR (1) | KR100575172B1 (fr) |
CN (1) | CN100547490C (fr) |
SG (3) | SG138473A1 (fr) |
TW (1) | TWI278016B (fr) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7242464B2 (en) * | 1999-06-24 | 2007-07-10 | Asml Holdings N.V. | Method for characterizing optical systems using holographic reticles |
US7016025B1 (en) | 1999-06-24 | 2006-03-21 | Asml Holding N.V. | Method and apparatus for characterization of optical systems |
US6885429B2 (en) * | 2002-06-28 | 2005-04-26 | Asml Holding N.V. | System and method for automated focus measuring of a lithography tool |
US8453111B2 (en) * | 2004-05-14 | 2013-05-28 | National Instruments Corporation | Generating a hardware description for a programmable hardware element based on a graphical program including multiple models of computation |
US7834975B2 (en) * | 2004-12-27 | 2010-11-16 | Asml Netherlands B.V. | Method and exposure apparatus for performing a tilted focus and a device manufactured accordingly |
US7502097B2 (en) * | 2004-12-27 | 2009-03-10 | Asml Netherlands B.V. | Method and exposure apparatus for performing a tilted focus and a device manufactured accordingly |
KR100689709B1 (ko) * | 2005-08-10 | 2007-03-08 | 삼성전자주식회사 | 반도체 디바이스 제조를 위한 오버레이 마크 및 이를이용한 오버레이 측정방법 |
JP2008140911A (ja) * | 2006-11-30 | 2008-06-19 | Toshiba Corp | フォーカスモニタ方法 |
TWI383273B (zh) | 2007-11-20 | 2013-01-21 | Asml Netherlands Bv | 微影投射裝置之焦點測量方法及微影投射裝置之校準方法 |
CN101651098B (zh) * | 2009-06-12 | 2012-10-17 | 上海宏力半导体制造有限公司 | 一种刻蚀方法 |
NL2004716A (en) * | 2009-06-17 | 2010-12-20 | Asml Netherlands Bv | Lithographic method and arrangement. |
NL2005997A (en) * | 2010-02-19 | 2011-08-22 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
CN102445855B (zh) * | 2010-10-14 | 2013-09-11 | 中芯国际集成电路制造(上海)有限公司 | 双层曝光补偿方法 |
US8792080B2 (en) | 2011-01-27 | 2014-07-29 | International Business Machines Corporation | Method and system to predict lithography focus error using simulated or measured topography |
KR101966622B1 (ko) * | 2012-04-05 | 2019-04-09 | 삼성전자주식회사 | 나노 임프린트 리소그래피용 템플리트의 제조 및 보정 방법 |
US9454072B2 (en) * | 2012-11-09 | 2016-09-27 | Kla-Tencor Corporation | Method and system for providing a target design displaying high sensitivity to scanner focus change |
US9810916B2 (en) | 2015-06-19 | 2017-11-07 | Sandisk Technologies Llc | Reticle with reduced transmission regions for detecting a defocus condition in a lithography process |
JP6694717B2 (ja) | 2016-01-25 | 2020-05-20 | デクセリアルズ株式会社 | 露光装置および露光方法 |
JP2018138990A (ja) | 2016-12-08 | 2018-09-06 | ウルトラテック インク | 再構成ウェハーのリソグラフィ処理のための焦点制御のための走査方法 |
US10209636B1 (en) | 2018-03-07 | 2019-02-19 | Sandisk Technologies Llc | Exposure focus leveling method using region-differentiated focus scan patterns |
CN109116593B (zh) * | 2018-08-02 | 2021-07-20 | 深圳市华星光电半导体显示技术有限公司 | 母板曝光方法 |
CN111338185B (zh) * | 2018-12-19 | 2022-05-20 | 联芯集成电路制造(厦门)有限公司 | 增进晶片曝光品质的方法 |
JP7320986B2 (ja) * | 2019-05-22 | 2023-08-04 | キヤノン株式会社 | 露光装置及び物品の製造方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4326805A (en) * | 1980-04-11 | 1982-04-27 | Bell Telephone Laboratories, Incorporated | Method and apparatus for aligning mask and wafer members |
US4645338A (en) * | 1985-04-26 | 1987-02-24 | International Business Machines Corporation | Optical system for focus correction for a lithographic tool |
US4786166A (en) | 1987-06-01 | 1988-11-22 | Hewlett-Packard Company | Determination of focal plane for a scanning projection aligner |
US5991004A (en) * | 1996-04-03 | 1999-11-23 | Mrs Technology, Inc. | Lens focus shift sensor |
KR100200729B1 (ko) * | 1996-09-18 | 1999-06-15 | 윤종용 | 포토리소그래피 장치의 포커스 캘리브레이션 장치 |
US5898479A (en) * | 1997-07-10 | 1999-04-27 | Vlsi Technology, Inc. | System for monitoring optical properties of photolithography equipment |
JP3809268B2 (ja) * | 1997-12-19 | 2006-08-16 | キヤノン株式会社 | デバイス製造方法 |
JP4365908B2 (ja) * | 1998-09-04 | 2009-11-18 | キヤノン株式会社 | 面位置検出装置、露光装置およびデバイス製造方法 |
JP3862438B2 (ja) * | 1998-12-28 | 2006-12-27 | キヤノン株式会社 | 走査露光装置、走査露光方法およびデバイス製造方法 |
JP3385238B2 (ja) | 1999-01-12 | 2003-03-10 | シャープ株式会社 | 光送受信モジュール |
JP2000357656A (ja) * | 1999-04-13 | 2000-12-26 | Nikon Corp | 露光装置、露光方法およびデバイス製造方法 |
US7242464B2 (en) | 1999-06-24 | 2007-07-10 | Asml Holdings N.V. | Method for characterizing optical systems using holographic reticles |
US7016025B1 (en) | 1999-06-24 | 2006-03-21 | Asml Holding N.V. | Method and apparatus for characterization of optical systems |
KR100956670B1 (ko) * | 2000-07-19 | 2010-05-10 | 에이에스엠엘 유에스, 인크. | 홀로그래픽 레티클을 제조하는 방법 |
JP2002043214A (ja) | 2000-07-26 | 2002-02-08 | Toshiba Corp | 走査型露光方法 |
US6278515B1 (en) | 2000-08-29 | 2001-08-21 | International Business Machines Corporation | Method and apparatus for adjusting a tilt of a lithography tool |
US6885429B2 (en) | 2002-06-28 | 2005-04-26 | Asml Holding N.V. | System and method for automated focus measuring of a lithography tool |
-
2002
- 2002-11-22 US US10/301,627 patent/US6885429B2/en not_active Expired - Lifetime
-
2003
- 2003-06-18 EP EP03013854A patent/EP1376052A3/fr not_active Withdrawn
- 2003-06-24 SG SG200603913-5A patent/SG138473A1/en unknown
- 2003-06-24 SG SG200303720A patent/SG103389A1/en unknown
- 2003-06-24 SG SG200603912-7A patent/SG138472A1/en unknown
- 2003-06-25 TW TW092117279A patent/TWI278016B/zh not_active IP Right Cessation
- 2003-06-27 CN CNB031493408A patent/CN100547490C/zh not_active Expired - Fee Related
- 2003-06-27 JP JP2003185184A patent/JP4083636B2/ja not_active Expired - Fee Related
- 2003-06-27 KR KR1020030042392A patent/KR100575172B1/ko not_active IP Right Cessation
-
2005
- 2005-04-12 US US11/103,427 patent/US7081948B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US6885429B2 (en) | 2005-04-26 |
KR20040026108A (ko) | 2004-03-27 |
SG103389A1 (en) | 2004-04-29 |
EP1376052A2 (fr) | 2004-01-02 |
US7081948B2 (en) | 2006-07-25 |
CN100547490C (zh) | 2009-10-07 |
JP2004040102A (ja) | 2004-02-05 |
US20050179883A1 (en) | 2005-08-18 |
TWI278016B (en) | 2007-04-01 |
TW200400546A (en) | 2004-01-01 |
US20040001192A1 (en) | 2004-01-01 |
JP4083636B2 (ja) | 2008-04-30 |
KR100575172B1 (ko) | 2006-05-02 |
SG138472A1 (en) | 2008-01-28 |
CN1484099A (zh) | 2004-03-24 |
EP1376052A3 (fr) | 2006-08-02 |
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