SG131113A1 - Rotating prism component inspection system - Google Patents

Rotating prism component inspection system

Info

Publication number
SG131113A1
SG131113A1 SG200701614-0A SG2007016140A SG131113A1 SG 131113 A1 SG131113 A1 SG 131113A1 SG 2007016140 A SG2007016140 A SG 2007016140A SG 131113 A1 SG131113 A1 SG 131113A1
Authority
SG
Singapore
Prior art keywords
inspection system
component inspection
rotating prism
prism component
rotating
Prior art date
Application number
SG200701614-0A
Other languages
English (en)
Inventor
Soon Wei Wong
Victor Vertoprakhov
Wensen Zhou
Ashedah Binti Jusoh Noor
Tian Poh Yew
Kundapura Parameshwar Srinivas
Original Assignee
Microview Technologies Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microview Technologies Pte Ltd filed Critical Microview Technologies Pte Ltd
Publication of SG131113A1 publication Critical patent/SG131113A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SG200701614-0A 2003-09-03 2004-09-03 Rotating prism component inspection system SG131113A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/653,825 US7340085B2 (en) 2003-09-03 2003-09-03 Rotating prism component inspection system

Publications (1)

Publication Number Publication Date
SG131113A1 true SG131113A1 (en) 2007-04-26

Family

ID=34217983

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200701614-0A SG131113A1 (en) 2003-09-03 2004-09-03 Rotating prism component inspection system

Country Status (4)

Country Link
US (2) US7340085B2 (fr)
SG (1) SG131113A1 (fr)
TW (1) TWI330815B (fr)
WO (1) WO2005022132A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7340085B2 (en) * 2003-09-03 2008-03-04 Microview Technologies Pte Ltd. Rotating prism component inspection system
US8942486B1 (en) * 2011-07-17 2015-01-27 Vy Corporation Apparatus and method for identifying objects and activities based upon at least one of shape, position or movement
US10418527B2 (en) * 2014-10-31 2019-09-17 eLux, Inc. System and method for the fluidic assembly of emissive displays
US10446728B2 (en) * 2014-10-31 2019-10-15 eLux, Inc. Pick-and remove system and method for emissive display repair

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3283898A (en) * 1965-07-16 1966-11-08 Meyer Geo J Mfg Co Inspection apparatus
US4040748A (en) * 1975-06-30 1977-08-09 International Business Machines Corporation Inspection tool
JPS5371563A (en) * 1976-12-08 1978-06-26 Hitachi Ltd Automatic inspection correcting method for mask
US4593406A (en) * 1984-01-16 1986-06-03 The United States Of America As Represented By The United States Department Of Energy Automatic image acquisition processor and method
US5212647A (en) * 1991-07-15 1993-05-18 Preco Industries, Inc. Die stamping press having ccd camera system for automatic 3-axis die registration
US5430666A (en) * 1992-12-18 1995-07-04 Dtm Corporation Automated method and apparatus for calibration of laser scanning in a selective laser sintering apparatus
US5677763A (en) * 1996-08-08 1997-10-14 Technology Resources, Inc. Optical device for measuring physical and optical characteristics of an object
JP3995030B2 (ja) 1996-09-17 2007-10-24 コグネックス・テクノロジー・アンド・インベストメント・コーポレーション 半導体パッケージの検査装置
US6055054A (en) 1997-05-05 2000-04-25 Beaty; Elwin M. Three dimensional inspection system
JP2888829B1 (ja) * 1998-06-05 1999-05-10 日本特殊陶業株式会社 ランド付基板の検査装置
JP2001085321A (ja) * 1999-07-13 2001-03-30 Nikon Corp 露光装置及び露光方法並びにマイクロデバイスの製造方法
US6567161B1 (en) * 2000-11-28 2003-05-20 Asti Holdings Limited Three dimensional lead inspection system
US7113629B2 (en) 2001-04-11 2006-09-26 Dainippon Screen Mfg. Co., Ltd. Pattern inspecting apparatus and method
JP3996774B2 (ja) * 2002-01-09 2007-10-24 株式会社日立ハイテクノロジーズ パターン欠陥検査方法及びパターン欠陥検査装置
US7340085B2 (en) * 2003-09-03 2008-03-04 Microview Technologies Pte Ltd. Rotating prism component inspection system

Also Published As

Publication number Publication date
TWI330815B (en) 2010-09-21
US20050047644A1 (en) 2005-03-03
TW200521875A (en) 2005-07-01
US7684610B2 (en) 2010-03-23
US7340085B2 (en) 2008-03-04
WO2005022132A1 (fr) 2005-03-10
US20080152211A1 (en) 2008-06-26

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