GB0314678D0 - X-ray inspection system - Google Patents

X-ray inspection system

Info

Publication number
GB0314678D0
GB0314678D0 GBGB0314678.4A GB0314678A GB0314678D0 GB 0314678 D0 GB0314678 D0 GB 0314678D0 GB 0314678 A GB0314678 A GB 0314678A GB 0314678 D0 GB0314678 D0 GB 0314678D0
Authority
GB
United Kingdom
Prior art keywords
inspection system
ray inspection
ray
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB0314678.4A
Other versions
GB2403388A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Defence
Original Assignee
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Defence filed Critical UK Secretary of State for Defence
Priority to GB0314678A priority Critical patent/GB2403388A/en
Publication of GB0314678D0 publication Critical patent/GB0314678D0/en
Priority to PCT/GB2004/002551 priority patent/WO2005001514A1/en
Publication of GB2403388A publication Critical patent/GB2403388A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB0314678A 2003-06-24 2003-06-24 X-ray inspection system having X-ray source with compound fluorescent secondary target Withdrawn GB2403388A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB0314678A GB2403388A (en) 2003-06-24 2003-06-24 X-ray inspection system having X-ray source with compound fluorescent secondary target
PCT/GB2004/002551 WO2005001514A1 (en) 2003-06-24 2004-06-14 X-ray inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0314678A GB2403388A (en) 2003-06-24 2003-06-24 X-ray inspection system having X-ray source with compound fluorescent secondary target

Publications (2)

Publication Number Publication Date
GB0314678D0 true GB0314678D0 (en) 2003-07-30
GB2403388A GB2403388A (en) 2004-12-29

Family

ID=27637218

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0314678A Withdrawn GB2403388A (en) 2003-06-24 2003-06-24 X-ray inspection system having X-ray source with compound fluorescent secondary target

Country Status (2)

Country Link
GB (1) GB2403388A (en)
WO (1) WO2005001514A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100389313C (en) * 2005-05-20 2008-05-21 中国印钞造币总公司 Pure gold standard sampler of emitting spectroscopy and production thereof
WO2008142446A2 (en) * 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
US7693261B2 (en) 2007-05-17 2010-04-06 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
US8696201B2 (en) * 2010-11-19 2014-04-15 Siemens Aktiengesellschaft Device and method for calibrating an X-ray detector, calibration apparatus and X-ray apparatus
CN110199209B (en) * 2016-07-28 2021-07-30 德国史密斯海曼简化股份公司 Scatter imaging
GB2552537B (en) * 2016-07-28 2020-05-27 Smiths Heimann Sas Inspection system with source of radiation and method

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
US3882310A (en) * 1972-11-01 1975-05-06 Raytheon Co Spatially modulated imaging system
JPS60119410A (en) * 1983-11-30 1985-06-26 Sumitomo Metal Ind Ltd Radiation thickness measuring device
JPH01274746A (en) * 1988-04-26 1989-11-02 Horiba Ltd Measurement of bone salt concentration
US5319547A (en) * 1990-08-10 1994-06-07 Vivid Technologies, Inc. Device and method for inspection of baggage and other objects
JP3918104B2 (en) * 1997-10-02 2007-05-23 日本政策投資銀行 X-ray fluorescence analyzer and X-ray fluorescence detector
US6347132B1 (en) * 1998-05-26 2002-02-12 Annistech, Inc. High energy X-ray inspection system for detecting nuclear weapons materials
DE19955392A1 (en) * 1999-11-18 2001-05-23 Philips Corp Intellectual Pty Monochromatic x-ray source
EP1241470B1 (en) * 2001-03-14 2003-09-24 YXLON International X-Ray GmbH Apparatus for measuring the pulse transfer of elastically scattered X-ray quanta from an area of a container being inspected
WO2002099167A1 (en) * 2001-05-31 2002-12-12 Honeywell International Inc. Crystalline compositions, radiation detector elements, and methods of formation

Also Published As

Publication number Publication date
GB2403388A (en) 2004-12-29
WO2005001514A1 (en) 2005-01-06

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)