SG115395A1 - Systems and methods for facilitating automated test equipment functionality within integrated circuits - Google Patents

Systems and methods for facilitating automated test equipment functionality within integrated circuits

Info

Publication number
SG115395A1
SG115395A1 SG200105108A SG200105108A SG115395A1 SG 115395 A1 SG115395 A1 SG 115395A1 SG 200105108 A SG200105108 A SG 200105108A SG 200105108 A SG200105108 A SG 200105108A SG 115395 A1 SG115395 A1 SG 115395A1
Authority
SG
Singapore
Prior art keywords
systems
methods
integrated circuits
test equipment
automated test
Prior art date
Application number
SG200105108A
Other languages
English (en)
Inventor
G Rohrbaugh John
R Rearick Jeffrey
R Shepston Shad
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of SG115395A1 publication Critical patent/SG115395A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
SG200105108A 2000-08-29 2001-08-29 Systems and methods for facilitating automated test equipment functionality within integrated circuits SG115395A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/649,797 US6556938B1 (en) 2000-08-29 2000-08-29 Systems and methods for facilitating automated test equipment functionality within integrated circuits

Publications (1)

Publication Number Publication Date
SG115395A1 true SG115395A1 (en) 2005-10-28

Family

ID=24606272

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200105108A SG115395A1 (en) 2000-08-29 2001-08-29 Systems and methods for facilitating automated test equipment functionality within integrated circuits

Country Status (4)

Country Link
US (2) US6556938B1 (de)
JP (1) JP2002148316A (de)
DE (1) DE10142293A1 (de)
SG (1) SG115395A1 (de)

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Publication number Priority date Publication date Assignee Title
CA2308820A1 (en) * 2000-05-15 2001-11-15 The Governors Of The University Of Alberta Wireless radio frequency technique design and method for testing of integrated circuits and wafers
US6556938B1 (en) * 2000-08-29 2003-04-29 Agilent Technologies, Inc. Systems and methods for facilitating automated test equipment functionality within integrated circuits
US6545016B1 (en) * 2000-12-08 2003-04-08 3M Innovative Properties Company Amide substituted imidazopyridines
US7337088B2 (en) * 2001-05-23 2008-02-26 Micron Technology, Inc. Intelligent measurement modular semiconductor parametric test system
US20030018937A1 (en) * 2001-07-18 2003-01-23 Athavale Atul S. Method and apparatus for efficient self-test of voltage and current level testing
US6792374B2 (en) * 2001-10-30 2004-09-14 Micron Technology, Inc. Apparatus and method for determining effect of on-chip noise on signal propagation
US6762614B2 (en) * 2002-04-18 2004-07-13 Agilent Technologies, Inc. Systems and methods for facilitating driver strength testing of integrated circuits
US7162386B2 (en) * 2002-04-25 2007-01-09 Micron Technology, Inc. Dynamically adaptable semiconductor parametric testing
KR100466984B1 (ko) * 2002-05-15 2005-01-24 삼성전자주식회사 테스트 소자 그룹 회로를 포함하는 집적 회로 칩 및 그것의 테스트 방법
GB2393795B (en) * 2002-10-01 2005-09-14 Motorola Inc Test structure, integrated circuit, system and method for testing a failure analysis instrument
US7010733B2 (en) * 2002-10-09 2006-03-07 International Business Machines Corporation Parametric testing for high pin count ASIC
US7010451B2 (en) * 2003-04-17 2006-03-07 Micron Technology, Inc. Dynamic creation and modification of wafer test maps during wafer testing
US7146285B2 (en) * 2003-05-19 2006-12-05 Avago Technologies General Ip (Singapore) Pte. Ltd. Integrated circuit with parameter measurement
CN100592097C (zh) * 2003-07-09 2010-02-24 Nxp股份有限公司 具有板上表征单元的ic
US7073109B2 (en) * 2003-09-30 2006-07-04 Agilent Technologies, Inc. Method and system for graphical pin assignment and/or verification
US7747828B2 (en) * 2004-11-17 2010-06-29 Integrated Device Technology, Inc. Systems and methods for monitoring and controlling binary state devices using a memory device
US7583087B2 (en) * 2005-02-22 2009-09-01 Integrated Device Technology, Inc. In-situ monitor of process and device parameters in integrated circuits
US7594149B2 (en) * 2005-02-22 2009-09-22 Integrated Device Technology, Inc. In-situ monitor of process and device parameters in integrated circuits
US7881430B2 (en) * 2006-07-28 2011-02-01 General Electric Company Automatic bus management
US7411407B2 (en) * 2006-10-13 2008-08-12 Agilent Technologies, Inc. Testing target resistances in circuit assemblies
US8966414B2 (en) 2009-05-29 2015-02-24 Cypress Semiconductor Corporation Implementing a circuit using an integrated circuit including parametric analog elements
US9858367B1 (en) * 2009-08-31 2018-01-02 Cypress Semiconductor Corporation Integrated circuit including parametric analog elements
CN105790736B (zh) * 2015-12-29 2018-11-02 北京自动测试技术研究所 一种用于频率信号发生芯片的修调装置
CN116298802A (zh) * 2023-03-22 2023-06-23 镇江矽佳测试技术有限公司 一种用于测试板质量检测系统及检测方法

Citations (3)

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Publication number Priority date Publication date Assignee Title
US20020135391A1 (en) * 2001-03-21 2002-09-26 Rearick Jeffrey R. Systems and methods for facilitating testing of pad receivers of integrated circuits
US6556938B1 (en) * 2000-08-29 2003-04-29 Agilent Technologies, Inc. Systems and methods for facilitating automated test equipment functionality within integrated circuits
US20030172332A1 (en) * 2002-03-08 2003-09-11 Jeffrey R. Rearick Systems and methods for facilitating testing of pad drivers of integrated circuits

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EP0535617A2 (de) * 1991-09-30 1993-04-07 Hughes Aircraft Company Verfahren zur Prüfung der elektrischen Parameter von Eingängen und Ausgängen integrierter Schaltungen
US5504432A (en) 1993-08-31 1996-04-02 Hewlett-Packard Company System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment
US5682392A (en) * 1994-09-28 1997-10-28 Teradyne, Inc. Method and apparatus for the automatic generation of boundary scan description language files
US5668745A (en) * 1995-10-20 1997-09-16 Lsi Logic Corporation Method and apparatus for testing of semiconductor devices
US5796260A (en) * 1996-03-12 1998-08-18 Honeywell Inc. Parametric test circuit
DE19713748A1 (de) 1997-04-04 1998-10-08 Omicron Electronics Gmbh Verfahren und Vorrichtung zur Prüfung von Differentialschutzrelais/-systemen
US6000050A (en) * 1997-10-23 1999-12-07 Synopsys, Inc. Method for minimizing ground bounce during DC parametric tests using boundary scan register
US6275962B1 (en) 1998-10-23 2001-08-14 Teradyne, Inc. Remote test module for automatic test equipment
US6324485B1 (en) 1999-01-26 2001-11-27 Newmillennia Solutions, Inc. Application specific automated test equipment system for testing integrated circuit devices in a native environment
US6397361B1 (en) * 1999-04-02 2002-05-28 International Business Machines Corporation Reduced-pin integrated circuit I/O test
US6365859B1 (en) * 2000-06-28 2002-04-02 Advanced Micro Devices Processor IC performance metric

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6556938B1 (en) * 2000-08-29 2003-04-29 Agilent Technologies, Inc. Systems and methods for facilitating automated test equipment functionality within integrated circuits
US20020135391A1 (en) * 2001-03-21 2002-09-26 Rearick Jeffrey R. Systems and methods for facilitating testing of pad receivers of integrated circuits
US20030172332A1 (en) * 2002-03-08 2003-09-11 Jeffrey R. Rearick Systems and methods for facilitating testing of pad drivers of integrated circuits

Also Published As

Publication number Publication date
DE10142293A1 (de) 2002-05-02
JP2002148316A (ja) 2002-05-22
US6556938B1 (en) 2003-04-29
US20030158690A1 (en) 2003-08-21
US6741946B2 (en) 2004-05-25

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