SG11202105360UA - Bevel portion treatment agent composition and method of manufacturing wafer - Google Patents
Bevel portion treatment agent composition and method of manufacturing waferInfo
- Publication number
- SG11202105360UA SG11202105360UA SG11202105360UA SG11202105360UA SG11202105360UA SG 11202105360U A SG11202105360U A SG 11202105360UA SG 11202105360U A SG11202105360U A SG 11202105360UA SG 11202105360U A SG11202105360U A SG 11202105360UA SG 11202105360U A SG11202105360U A SG 11202105360UA
- Authority
- SG
- Singapore
- Prior art keywords
- treatment agent
- agent composition
- bevel portion
- manufacturing wafer
- portion treatment
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/02—Inorganic compounds
- C11D7/04—Water-soluble compounds
- C11D7/08—Acids
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/28—Organic compounds containing halogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/0803—Compounds with Si-C or Si-Si linkages
- C07F7/081—Compounds with Si-C or Si-Si linkages comprising at least one atom selected from the elements N, O, halogen, S, Se or Te
- C07F7/0812—Compounds with Si-C or Si-Si linkages comprising at least one atom selected from the elements N, O, halogen, S, Se or Te comprising a heterocyclic ring
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/18—Compounds having one or more C—Si linkages as well as one or more C—O—Si linkages
- C07F7/1804—Compounds having Si-O-C linkages
- C07F7/1872—Preparation; Treatments not provided for in C07F7/20
- C07F7/188—Preparation; Treatments not provided for in C07F7/20 by reactions involving the formation of Si-O linkages
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
- C11D7/261—Alcohols; Phenols
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/34—Organic compounds containing sulfur
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02082—Cleaning product to be cleaned
- H01L21/02087—Cleaning of wafer edges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02334—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment in-situ cleaning after layer formation, e.g. removing process residues
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/40—Specific cleaning or washing processes
- C11D2111/44—Multi-step processes
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- Inorganic Chemistry (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Weting (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018218942 | 2018-11-22 | ||
PCT/JP2019/041349 WO2020105340A1 (en) | 2018-11-22 | 2019-10-21 | Beveled part treatment agent composition and method for manufacturing wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202105360UA true SG11202105360UA (en) | 2021-06-29 |
Family
ID=70774250
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202105360UA SG11202105360UA (en) | 2018-11-22 | 2019-10-21 | Bevel portion treatment agent composition and method of manufacturing wafer |
Country Status (7)
Country | Link |
---|---|
US (1) | US11817310B2 (en) |
JP (1) | JP7328564B2 (en) |
KR (1) | KR20210092297A (en) |
CN (1) | CN113169060A (en) |
SG (1) | SG11202105360UA (en) |
TW (1) | TW202031668A (en) |
WO (1) | WO2020105340A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2023234370A1 (en) * | 2022-06-02 | 2023-12-07 | セントラル硝子株式会社 | Substrate processing method, and substrate manufacturing method |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005340554A (en) | 2004-05-28 | 2005-12-08 | Hitachi Ltd | Manufacturing method for semiconductor memory |
JP2008277748A (en) | 2007-03-30 | 2008-11-13 | Renesas Technology Corp | Method for forming resist pattern, and semiconductor device manufactured by the method |
US20080241489A1 (en) | 2007-03-30 | 2008-10-02 | Renesas Technology Corp. | Method of forming resist pattern and semiconductor device manufactured with the same |
JP5136103B2 (en) | 2008-02-12 | 2013-02-06 | 東京エレクトロン株式会社 | Cleaning device and method, coating and developing device and method, and storage medium |
EP2246876A4 (en) * | 2008-02-22 | 2012-07-04 | Asahi Glass Co Ltd | Water-repellant composition for substrate to be exposed, method of forming resist pattern, electronic device produced by the formation method, method of imparting water repellency to substrate to be exposed, water-repellant set for substrate to be exposed, and method of imparting water repellency with the same to substrate to be exposed |
JP2009218249A (en) | 2008-03-07 | 2009-09-24 | Seiko Epson Corp | Wafer cleaning equipment and production process of semiconductor device |
KR102189379B1 (en) * | 2008-10-21 | 2020-12-11 | 도오꾜오까고오교 가부시끼가이샤 | Surface treatment liquid, surface treatment method, hydrophobilization method, and hydrophobilized substrate |
KR101363441B1 (en) * | 2010-06-07 | 2014-02-21 | 샌트랄 글래스 컴퍼니 리미티드 | Chemical solution for formation of protective film, process for preparing thereof and process for cleaning using the same |
JP2012015335A (en) | 2010-06-30 | 2012-01-19 | Central Glass Co Ltd | Chemical for forming protective film, and cleaning method of wafer surface |
JP2013118347A (en) * | 2010-12-28 | 2013-06-13 | Central Glass Co Ltd | Cleaning method of wafer |
JP6098741B2 (en) * | 2010-12-28 | 2017-03-22 | セントラル硝子株式会社 | Wafer cleaning method |
JP5288147B2 (en) * | 2011-11-29 | 2013-09-11 | セントラル硝子株式会社 | Method for preparing protective film forming chemical |
JP6317547B2 (en) | 2012-08-28 | 2018-04-25 | 株式会社Screenホールディングス | Substrate processing method |
US10093815B2 (en) * | 2015-09-24 | 2018-10-09 | Tokyo Ohka Kogyo Co., Ltd. | Surface treatment agent and surface treatment method |
SG11201908617QA (en) * | 2017-03-24 | 2019-10-30 | Fujifilm Electronic Materials Usa Inc | Surface treatment methods and compositions therefor |
SG11202009171XA (en) * | 2018-04-05 | 2020-10-29 | Central Glass Co Ltd | Surface treatment method of wafer and composition used for said method |
-
2019
- 2019-10-21 JP JP2020558176A patent/JP7328564B2/en active Active
- 2019-10-21 CN CN201980076584.1A patent/CN113169060A/en active Pending
- 2019-10-21 KR KR1020217019164A patent/KR20210092297A/en unknown
- 2019-10-21 US US17/295,739 patent/US11817310B2/en active Active
- 2019-10-21 SG SG11202105360UA patent/SG11202105360UA/en unknown
- 2019-10-21 WO PCT/JP2019/041349 patent/WO2020105340A1/en active Application Filing
- 2019-10-30 TW TW108139200A patent/TW202031668A/en unknown
Also Published As
Publication number | Publication date |
---|---|
TW202031668A (en) | 2020-09-01 |
CN113169060A (en) | 2021-07-23 |
JPWO2020105340A1 (en) | 2021-10-07 |
US11817310B2 (en) | 2023-11-14 |
WO2020105340A1 (en) | 2020-05-28 |
JP7328564B2 (en) | 2023-08-17 |
KR20210092297A (en) | 2021-07-23 |
US20220020582A1 (en) | 2022-01-20 |
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