SG11202010082WA - Distribution board - Google Patents

Distribution board

Info

Publication number
SG11202010082WA
SG11202010082WA SG11202010082WA SG11202010082WA SG11202010082WA SG 11202010082W A SG11202010082W A SG 11202010082WA SG 11202010082W A SG11202010082W A SG 11202010082WA SG 11202010082W A SG11202010082W A SG 11202010082WA SG 11202010082W A SG11202010082W A SG 11202010082WA
Authority
SG
Singapore
Prior art keywords
distribution board
distribution
board
Prior art date
Application number
SG11202010082WA
Inventor
Atsushi Miyamoto
Hiroyuki Ito
Original Assignee
Nitto Kogyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2018077464A external-priority patent/JP7102057B2/en
Priority claimed from JP2018077463A external-priority patent/JP7072982B2/en
Priority claimed from JP2018213066A external-priority patent/JP7084851B2/en
Priority claimed from JP2019013182A external-priority patent/JP7237424B2/en
Application filed by Nitto Kogyo Corp filed Critical Nitto Kogyo Corp
Publication of SG11202010082WA publication Critical patent/SG11202010082WA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16585—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 for individual pulses, ripple or noise and other applications where timing or duration is of importance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/15—Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements (indicating that pulse width is above or below a certain limit)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
    • H01H33/02—Details
    • H01H33/26—Means for detecting the presence of an arc or other discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H9/00—Details of switching devices, not covered by groups H01H1/00 - H01H7/00
    • H01H9/50—Means for detecting the presence of an arc or discharge
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H1/00—Details of emergency protective circuit arrangements
    • H02H1/0007—Details of emergency protective circuit arrangements concerning the detecting means
    • H02H1/0015—Using arc detectors
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H1/00—Details of emergency protective circuit arrangements
    • H02H1/0092—Details of emergency protective circuit arrangements concerning the data processing means, e.g. expert systems, neural networks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Distribution Board (AREA)
SG11202010082WA 2018-04-13 2019-04-11 Distribution board SG11202010082WA (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2018077464A JP7102057B2 (en) 2018-04-13 2018-04-13 Discharge detection structure and discharge detection system
JP2018077463A JP7072982B2 (en) 2018-04-13 2018-04-13 Discharge accident detection structure
JP2018213066A JP7084851B2 (en) 2018-11-13 2018-11-13 Discharge accident detection system
JP2019013182A JP7237424B2 (en) 2019-01-29 2019-01-29 Distribution board
PCT/JP2019/015780 WO2019198791A1 (en) 2018-04-13 2019-04-11 Distribution board

Publications (1)

Publication Number Publication Date
SG11202010082WA true SG11202010082WA (en) 2020-11-27

Family

ID=68164370

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202010082WA SG11202010082WA (en) 2018-04-13 2019-04-11 Distribution board

Country Status (4)

Country Link
US (1) US11209499B2 (en)
EP (1) EP3779479B1 (en)
SG (1) SG11202010082WA (en)
WO (1) WO2019198791A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7370666B2 (en) * 2019-11-01 2023-10-30 日東工業株式会社 discharge detection system
JP2021081397A (en) * 2019-11-22 2021-05-27 パナソニックＩｐマネジメント株式会社 Abnormality detection system, abnormality detection method, program and distribution board
JP2021081396A (en) * 2019-11-22 2021-05-27 パナソニックＩｐマネジメント株式会社 Abnormality detection system, distribution board, abnormality detection method, and program
JP2021081398A (en) * 2019-11-22 2021-05-27 パナソニックＩｐマネジメント株式会社 Abnormality detection system, distribution board, abnormality detection method, and program
JP2021083293A (en) * 2019-11-22 2021-05-27 パナソニックＩｐマネジメント株式会社 Abnormality detection system, distribution board system, abnormality detection method and program
JP7357228B2 (en) * 2020-03-11 2023-10-06 パナソニックＩｐマネジメント株式会社 Arc detection equipment, power conditioners, indoor wiring systems, breakers, solar panels, solar panel attachment modules and connection boxes
WO2021182263A1 (en) * 2020-03-11 2021-09-16 パナソニックＩｐマネジメント株式会社 Arc detection device, power conditioner, indoor wiring system, breaker, solar panel, solar panel-attached module, and connection box
US11923670B2 (en) 2020-03-11 2024-03-05 Panasonic Intellectual Property Management Co., Ltd. ARC detection device, solar inverter, indoor wiring system, circuit breaker, solar panel, solar panel attachment module, and junction box
JP2023040641A (en) * 2021-09-10 2023-03-23 日東工業株式会社 Discharge detection system

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2958594B2 (en) 1993-01-11 1999-10-06 株式会社日立製作所 Insulation deterioration diagnosis device
JP3030598B2 (en) * 1994-06-24 2000-04-10 アンリツ株式会社 Jitter detector
JPH1075525A (en) * 1996-08-29 1998-03-17 Central Res Inst Of Electric Power Ind Leak detecting/removing method
JP3949322B2 (en) * 1999-09-01 2007-07-25 三菱電機株式会社 Feed forward amplifier
JP2001124814A (en) * 1999-10-28 2001-05-11 Matsushita Electric Works Ltd Insulation deterioration detection device in inverter device, and solar power generating system, and electric vehicle using it
JP2004226299A (en) 2003-01-24 2004-08-12 Toshiba Corp Deterioration diagnosing device for winding of rotating electric machine
US7248981B2 (en) * 2003-11-20 2007-07-24 Anritsu Corporation Jitter measurement device and jitter measurement method
US8098779B2 (en) * 2006-08-08 2012-01-17 Qualcomm Incorporated Interference detection and mitigation
WO2009084186A1 (en) * 2007-12-27 2009-07-09 Panasonic Corporation Noise control device
JP5319949B2 (en) 2008-03-31 2013-10-16 パナソニック株式会社 Wiring equipment
JP5369490B2 (en) 2008-05-13 2013-12-18 シンフォニアテクノロジー株式会社 Arc detection device and aircraft equipped with the same
US9031799B2 (en) * 2009-09-15 2015-05-12 Korea Electrical Safety Corporation Remote electrical safety diagnosis system and apparatus
EP2628015B1 (en) 2010-10-14 2014-06-25 ABB Research Ltd. Fault direction parameter indicator device using only current and related methods
JP6164848B2 (en) 2013-01-10 2017-07-19 三菱電機株式会社 Arc detector
US9490611B2 (en) * 2013-04-18 2016-11-08 Abl Ip Holding Llc Universal load control cabinet
EP2977772B1 (en) 2013-11-01 2018-05-09 Informetis Corporation Signal processing system, signal processing method, and signal processing program
JP6355568B2 (en) 2015-01-13 2018-07-11 三菱電機株式会社 Partial discharge monitoring device
JP6746197B2 (en) 2016-03-22 2020-08-26 日東工業株式会社 Tracking phenomenon detection system
WO2017187481A1 (en) 2016-04-25 2017-11-02 株式会社東芝 Partial discharge detector

Also Published As

Publication number Publication date
US20210035750A1 (en) 2021-02-04
US11209499B2 (en) 2021-12-28
EP3779479B1 (en) 2022-10-05
WO2019198791A1 (en) 2019-10-17
EP3779479A1 (en) 2021-02-17

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