SG11202009289PA - Pulsed plasma (dc/rf) deposition of high quality c films for patterning - Google Patents

Pulsed plasma (dc/rf) deposition of high quality c films for patterning

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Publication number
SG11202009289PA
SG11202009289PA SG11202009289PA SG11202009289PA SG11202009289PA SG 11202009289P A SG11202009289P A SG 11202009289PA SG 11202009289P A SG11202009289P A SG 11202009289PA SG 11202009289P A SG11202009289P A SG 11202009289PA SG 11202009289P A SG11202009289P A SG 11202009289PA
Authority
SG
Singapore
Prior art keywords
patterning
films
deposition
high quality
pulsed plasma
Prior art date
Application number
SG11202009289PA
Inventor
Eswaranand Venkatasubramanian
Yang Yang
Pramit Manna
Kartik Ramaswamy
Takehito Koshizawa
Abhijit Basu Mallick
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of SG11202009289PA publication Critical patent/SG11202009289PA/en

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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/26Deposition of carbon only
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/04Coating on selected surface areas, e.g. using masks
    • C23C16/042Coating on selected surface areas, e.g. using masks using masks
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45502Flow conditions in reaction chamber
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/503Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using dc or ac discharges
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • C23C16/5096Flat-bed apparatus
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/515Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using pulsed discharges
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/52Controlling or regulating the coating process
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02115Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material being carbon, e.g. alpha-C, diamond or hydrogen doped carbon
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    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02263Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
    • H01L21/02271Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H01L21/02274Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
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    • H01L21/033Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H01L21/0334Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
    • H01L21/0337Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment
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    • H01L21/02365Forming inorganic semiconducting materials on a substrate
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SG11202009289PA 2018-05-03 2018-10-16 Pulsed plasma (dc/rf) deposition of high quality c films for patterning SG11202009289PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201862666205P 2018-05-03 2018-05-03
PCT/US2018/056004 WO2019212592A1 (en) 2018-05-03 2018-10-16 Pulsed plasma (dc/rf) deposition of high quality c films for patterning

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SG11202009289PA true SG11202009289PA (en) 2020-11-27

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US (2) US11603591B2 (en)
JP (2) JP2021523558A (en)
KR (1) KR20200140388A (en)
CN (1) CN112041481A (en)
SG (1) SG11202009289PA (en)
WO (1) WO2019212592A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200130490A (en) 2018-04-09 2020-11-18 어플라이드 머티어리얼스, 인코포레이티드 Carbon hard masks and related methods for patterning applications
WO2020243342A1 (en) 2019-05-29 2020-12-03 Lam Research Corporation High selectivity, low stress, and low hydrogen diamond-like carbon hardmasks by high power pulsed low frequency rf
US11773484B2 (en) 2020-06-26 2023-10-03 Tokyo Electron Limited Hard mask deposition using direct current superimposed radio frequency plasma
EP3945541A1 (en) 2020-07-29 2022-02-02 TRUMPF Huettinger Sp. Z o. o. Pulsing assembly, power supply arrangement and method using the assembly
US20240030028A1 (en) * 2020-12-18 2024-01-25 Lam Research Corporation High selectivity, low stress, and low hydrogen carbon hardmasks in low-pressure conditions with wide gap electrode spacing
JP2022187397A (en) * 2021-06-07 2022-12-19 東京エレクトロン株式会社 Film deposition method and film deposition apparatus
WO2023196846A1 (en) * 2022-04-07 2023-10-12 Lam Research Corporation Hydrogen reduction in amorphous carbon films

Family Cites Families (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62116751A (en) * 1985-11-13 1987-05-28 Nec Corp Rigid amorphous carbon film
US5804259A (en) * 1996-11-07 1998-09-08 Applied Materials, Inc. Method and apparatus for depositing a multilayered low dielectric constant film
MY132894A (en) 1997-08-25 2007-10-31 Ibm Layered resist system using tunable amorphous carbon film as a bottom layer and methods of fabrication thereof
US6682786B1 (en) * 1999-12-07 2004-01-27 Ibm Corporation Liquid crystal display cell having liquid crystal molecules in vertical or substantially vertical alignment
JP4877884B2 (en) 2001-01-25 2012-02-15 東京エレクトロン株式会社 Plasma processing equipment
JP4158550B2 (en) 2003-02-18 2008-10-01 日本ゼオン株式会社 Laminated body
JP4725085B2 (en) * 2003-12-04 2011-07-13 株式会社豊田中央研究所 Amorphous carbon, amorphous carbon coating member and amorphous carbon film forming method
ATE343220T1 (en) * 2004-05-28 2006-11-15 Applied Films Gmbh & Co Kg DRIVE MECHANISM FOR A VACUUM TREATMENT SYSTEM
EP1841896B1 (en) * 2004-11-25 2014-11-05 Kabushiki Kaisha Toyota Chuo Kenkyusho Amorphous carbon film, process for forming the same, and high wear-resistant sliding member with amorphous carbon film provided
JP4773079B2 (en) * 2004-11-26 2011-09-14 株式会社日立ハイテクノロジーズ Control method of plasma processing apparatus
US20060130971A1 (en) * 2004-12-21 2006-06-22 Applied Materials, Inc. Apparatus for generating plasma by RF power
US7422775B2 (en) * 2005-05-17 2008-09-09 Applied Materials, Inc. Process for low temperature plasma deposition of an optical absorption layer and high speed optical annealing
JP4602171B2 (en) 2005-06-22 2010-12-22 東京エレクトロン株式会社 Plasma etching method, plasma etching apparatus, control program, and computer storage medium
US7323401B2 (en) * 2005-08-08 2008-01-29 Applied Materials, Inc. Semiconductor substrate process using a low temperature deposited carbon-containing hard mask
KR100827528B1 (en) * 2006-01-11 2008-05-06 주식회사 하이닉스반도체 Manufacturing method of semiconductor device using sp3-rich amorphous carbon as hard mask
US8119242B2 (en) * 2006-05-22 2012-02-21 Kabushiki Kaisha Toyota Chuo Kenkyusho Amorphous carbon film, process for forming amorphous carbon film, conductive member provided with amorphous carbon film, and fuel cell separator
US7867578B2 (en) * 2006-06-28 2011-01-11 Applied Materials, Inc. Method for depositing an amorphous carbon film with improved density and step coverage
US20080153311A1 (en) * 2006-06-28 2008-06-26 Deenesh Padhi Method for depositing an amorphous carbon film with improved density and step coverage
US8083961B2 (en) 2006-07-31 2011-12-27 Tokyo Electron Limited Method and system for controlling the uniformity of a ballistic electron beam by RF modulation
JP5154140B2 (en) * 2006-12-28 2013-02-27 東京エレクトロン株式会社 Semiconductor device and manufacturing method thereof
US8133819B2 (en) 2008-02-21 2012-03-13 Applied Materials, Inc. Plasma etching carbonaceous layers with sulfur-based etchants
JP4704453B2 (en) * 2008-07-16 2011-06-15 株式会社プラズマイオンアシスト Diamond-like carbon manufacturing apparatus, manufacturing method, and industrial product
US20100189923A1 (en) * 2009-01-29 2010-07-29 Asm Japan K.K. Method of forming hardmask by plasma cvd
JP5321576B2 (en) * 2009-12-25 2013-10-23 株式会社豊田中央研究所 Oriented amorphous carbon film and method for forming the same
JP5780704B2 (en) * 2010-01-19 2015-09-16 株式会社リケン Hydrogen-containing amorphous hard carbon coated member
US20110244142A1 (en) * 2010-03-30 2011-10-06 Applied Materials, Inc. Nitrogen doped amorphous carbon hardmask
WO2011137059A2 (en) * 2010-04-30 2011-11-03 Applied Materials, Inc. Amorphous carbon deposition method for improved stack defectivity
US8361906B2 (en) * 2010-05-20 2013-01-29 Applied Materials, Inc. Ultra high selectivity ashable hard mask film
TW201216331A (en) 2010-10-05 2012-04-16 Applied Materials Inc Ultra high selectivity doped amorphous carbon strippable hardmask development and integration
US20120164834A1 (en) * 2010-12-22 2012-06-28 Kevin Jennings Variable-Density Plasma Processing of Semiconductor Substrates
JP2012222175A (en) * 2011-04-11 2012-11-12 Ngk Insulators Ltd Plasma cvd apparatus and method for forming amorphous film
KR20120121340A (en) 2011-04-26 2012-11-05 삼성전자주식회사 Methods of manufacturing a carbon type hard mask layer using induced coupled plasma and methods of forming patterns using the same
US8399366B1 (en) * 2011-08-25 2013-03-19 Tokyo Electron Limited Method of depositing highly conformal amorphous carbon films over raised features
US20130107415A1 (en) 2011-10-28 2013-05-02 Applied Materials, Inc. Electrostatic chuck
US20130189845A1 (en) * 2012-01-19 2013-07-25 Applied Materials, Inc. Conformal amorphous carbon for spacer and spacer protection applications
US8679987B2 (en) 2012-05-10 2014-03-25 Applied Materials, Inc. Deposition of an amorphous carbon layer with high film density and high etch selectivity
US9362133B2 (en) 2012-12-14 2016-06-07 Lam Research Corporation Method for forming a mask by etching conformal film on patterned ashable hardmask
US20140273461A1 (en) * 2013-03-15 2014-09-18 Applied Materials, Inc. Carbon film hardmask stress reduction by hydrogen ion implantation
US20150371851A1 (en) 2013-03-15 2015-12-24 Applied Materials, Inc. Amorphous carbon deposition process using dual rf bias frequency applications
US9390923B2 (en) * 2014-07-03 2016-07-12 Applied Materials, Inc. Methods of removing residual polymers formed during a boron-doped amorphous carbon layer etch process
US9390910B2 (en) * 2014-10-03 2016-07-12 Applied Materials, Inc. Gas flow profile modulated control of overlay in plasma CVD films
US10246772B2 (en) * 2015-04-01 2019-04-02 Applied Materials, Inc. Plasma enhanced chemical vapor deposition of films for improved vertical etch performance in 3D NAND memory devices
US9865459B2 (en) * 2015-04-22 2018-01-09 Applied Materials, Inc. Plasma treatment to improve adhesion between hardmask film and silicon oxide film
US10418243B2 (en) 2015-10-09 2019-09-17 Applied Materials, Inc. Ultra-high modulus and etch selectivity boron-carbon hardmask films
US10249495B2 (en) 2016-06-28 2019-04-02 Applied Materials, Inc. Diamond like carbon layer formed by an electron beam plasma process
US10858727B2 (en) * 2016-08-19 2020-12-08 Applied Materials, Inc. High density, low stress amorphous carbon film, and process and equipment for its deposition
US10570506B2 (en) * 2017-01-24 2020-02-25 Applied Materials, Inc. Method to improve film quality for PVD carbon with reactive gas and bias power
CN113936997A (en) 2017-06-08 2022-01-14 应用材料公司 High density low temperature carbon films for hardmask and other patterning applications
US11043375B2 (en) 2017-08-16 2021-06-22 Applied Materials, Inc. Plasma deposition of carbon hardmask
KR20200130490A (en) * 2018-04-09 2020-11-18 어플라이드 머티어리얼스, 인코포레이티드 Carbon hard masks and related methods for patterning applications

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