SG11202005773RA - Auto-referenced memory cell read techniques - Google Patents

Auto-referenced memory cell read techniques

Info

Publication number
SG11202005773RA
SG11202005773RA SG11202005773RA SG11202005773RA SG11202005773RA SG 11202005773R A SG11202005773R A SG 11202005773RA SG 11202005773R A SG11202005773R A SG 11202005773RA SG 11202005773R A SG11202005773R A SG 11202005773RA SG 11202005773R A SG11202005773R A SG 11202005773RA
Authority
SG
Singapore
Prior art keywords
auto
memory cell
cell read
referenced memory
read techniques
Prior art date
Application number
SG11202005773RA
Inventor
Graziano Mirichigni
Paolo Amato
Federico Pio
Alessandro Orlando
Marco Sforzin
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Publication of SG11202005773RA publication Critical patent/SG11202005773RA/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021Auxiliary circuits
    • G11C13/004Reading or sensing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5678Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using amorphous/crystalline phase transition storage elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0004Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021Auxiliary circuits
    • G11C13/003Cell access
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1006Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B63/00Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/20Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having two electrodes, e.g. diodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B63/00Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/80Arrangements comprising multiple bistable or multi-stable switching components of the same type on a plane parallel to the substrate, e.g. cross-point arrays
    • H10B63/84Arrangements comprising multiple bistable or multi-stable switching components of the same type on a plane parallel to the substrate, e.g. cross-point arrays arranged in a direction perpendicular to the substrate, e.g. 3D cell arrays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices without a potential-jump barrier or surface barrier, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20Multistable switching devices, e.g. memristors
    • H10N70/231Multistable switching devices, e.g. memristors based on solid-state phase change, e.g. between amorphous and crystalline phases, Ovshinsky effect
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021Auxiliary circuits
    • G11C13/004Reading or sensing circuits or methods
    • G11C2013/0054Read is performed on a reference element, e.g. cell, and the reference sensed value is used to compare the sensed value of the selected cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2213/00Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70Resistive array aspects
    • G11C2213/71Three dimensional array
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2213/00Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70Resistive array aspects
    • G11C2213/72Array wherein the access device being a diode
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2213/00Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70Resistive array aspects
    • G11C2213/76Array using an access device for each cell which being not a transistor and not a diode
SG11202005773RA 2017-12-22 2018-12-20 Auto-referenced memory cell read techniques SG11202005773RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/853,364 US10431301B2 (en) 2017-12-22 2017-12-22 Auto-referenced memory cell read techniques
PCT/US2018/066653 WO2019126416A2 (en) 2017-12-22 2018-12-20 Auto-referenced memory cell read techniques

Publications (1)

Publication Number Publication Date
SG11202005773RA true SG11202005773RA (en) 2020-07-29

Family

ID=66950574

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202005773RA SG11202005773RA (en) 2017-12-22 2018-12-20 Auto-referenced memory cell read techniques

Country Status (8)

Country Link
US (5) US10431301B2 (en)
EP (1) EP3729437A4 (en)
JP (1) JP7026235B2 (en)
KR (2) KR102386641B1 (en)
CN (1) CN111512378B (en)
SG (1) SG11202005773RA (en)
TW (1) TWI683312B (en)
WO (1) WO2019126416A2 (en)

Families Citing this family (68)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9324398B2 (en) 2013-02-04 2016-04-26 Micron Technology, Inc. Apparatuses and methods for targeted refreshing of memory
US9047978B2 (en) 2013-08-26 2015-06-02 Micron Technology, Inc. Apparatuses and methods for selective row refreshes
JP2015219938A (en) 2014-05-21 2015-12-07 マイクロン テクノロジー, インク. Semiconductor device
JP2017182854A (en) 2016-03-31 2017-10-05 マイクロン テクノロジー, インク. Semiconductor device
US10490251B2 (en) 2017-01-30 2019-11-26 Micron Technology, Inc. Apparatuses and methods for distributing row hammer refresh events across a memory device
KR102401182B1 (en) * 2018-01-19 2022-05-24 삼성전자주식회사 Memory device and memory package
US10580475B2 (en) 2018-01-22 2020-03-03 Micron Technology, Inc. Apparatuses and methods for calculating row hammer refresh addresses in a semiconductor device
US11017833B2 (en) 2018-05-24 2021-05-25 Micron Technology, Inc. Apparatuses and methods for pure-time, self adopt sampling for row hammer refresh sampling
US11152050B2 (en) 2018-06-19 2021-10-19 Micron Technology, Inc. Apparatuses and methods for multiple row hammer refresh address sequences
US10714185B2 (en) * 2018-10-24 2020-07-14 Micron Technology, Inc. Event counters for memory operations
US10685696B2 (en) 2018-10-31 2020-06-16 Micron Technology, Inc. Apparatuses and methods for access based refresh timing
CN113168861A (en) 2018-12-03 2021-07-23 美光科技公司 Semiconductor device for performing row hammer refresh operation
US10713116B2 (en) * 2018-12-06 2020-07-14 Sabrina Barbato Solid state device implementing dynamic polar encoding
CN111354393B (en) 2018-12-21 2023-10-20 美光科技公司 Apparatus and method for timing interleaving for targeted refresh operations
US10770127B2 (en) * 2019-02-06 2020-09-08 Micron Technology, Inc. Apparatuses and methods for managing row access counts
US11043254B2 (en) 2019-03-19 2021-06-22 Micron Technology, Inc. Semiconductor device having cam that stores address signals
US11227649B2 (en) 2019-04-04 2022-01-18 Micron Technology, Inc. Apparatuses and methods for staggered timing of targeted refresh operations
US11264096B2 (en) 2019-05-14 2022-03-01 Micron Technology, Inc. Apparatuses, systems, and methods for a content addressable memory cell with latch and comparator circuits
US11158364B2 (en) 2019-05-31 2021-10-26 Micron Technology, Inc. Apparatuses and methods for tracking victim rows
US11069393B2 (en) 2019-06-04 2021-07-20 Micron Technology, Inc. Apparatuses and methods for controlling steal rates
US11158373B2 (en) 2019-06-11 2021-10-26 Micron Technology, Inc. Apparatuses, systems, and methods for determining extremum numerical values
US10832792B1 (en) 2019-07-01 2020-11-10 Micron Technology, Inc. Apparatuses and methods for adjusting victim data
US11139015B2 (en) 2019-07-01 2021-10-05 Micron Technology, Inc. Apparatuses and methods for monitoring word line accesses
US11386946B2 (en) 2019-07-16 2022-07-12 Micron Technology, Inc. Apparatuses and methods for tracking row accesses
US10943636B1 (en) 2019-08-20 2021-03-09 Micron Technology, Inc. Apparatuses and methods for analog row access tracking
US10964378B2 (en) 2019-08-22 2021-03-30 Micron Technology, Inc. Apparatus and method including analog accumulator for determining row access rate and target row address used for refresh operation
US11200942B2 (en) 2019-08-23 2021-12-14 Micron Technology, Inc. Apparatuses and methods for lossy row access counting
US11302374B2 (en) 2019-08-23 2022-04-12 Micron Technology, Inc. Apparatuses and methods for dynamic refresh allocation
US11302377B2 (en) 2019-10-16 2022-04-12 Micron Technology, Inc. Apparatuses and methods for dynamic targeted refresh steals
TWI760924B (en) * 2019-12-03 2022-04-11 美商美光科技公司 Methods and systems for accessing memory cells
JP2023516346A (en) * 2020-03-03 2023-04-19 マイクロン テクノロジー,インク. Counter-based sense amplifier method for memory cells
US11437100B2 (en) 2020-04-06 2022-09-06 Crossbar, Inc. Distinct chip identifier sequence utilizing unclonable characteristics of resistive memory on a chip
US11823739B2 (en) 2020-04-06 2023-11-21 Crossbar, Inc. Physically unclonable function (PUF) generation involving high side programming of bits
CN115485776A (en) * 2020-05-13 2022-12-16 美光科技公司 Counter-based method and system for accessing memory cells
US11302390B2 (en) 2020-07-10 2022-04-12 Micron Technology, Inc. Reading a multi-level memory cell
US11355209B2 (en) 2020-07-10 2022-06-07 Micron Technology, Inc. Accessing a multi-level memory cell
US11309010B2 (en) 2020-08-14 2022-04-19 Micron Technology, Inc. Apparatuses, systems, and methods for memory directed access pause
US11380382B2 (en) 2020-08-19 2022-07-05 Micron Technology, Inc. Refresh logic circuit layout having aggressor detector circuit sampling circuit and row hammer refresh control circuit
US11348631B2 (en) 2020-08-19 2022-05-31 Micron Technology, Inc. Apparatuses, systems, and methods for identifying victim rows in a memory device which cannot be simultaneously refreshed
US11222682B1 (en) 2020-08-31 2022-01-11 Micron Technology, Inc. Apparatuses and methods for providing refresh addresses
WO2022043727A1 (en) * 2020-08-31 2022-03-03 Micron Technology, Inc. Methods and systems for improving read and write of memory cells
US11705429B2 (en) 2020-09-04 2023-07-18 Micron Technology, Inc. Redundant through-silicon vias
US11557331B2 (en) 2020-09-23 2023-01-17 Micron Technology, Inc. Apparatuses and methods for controlling refresh operations
WO2022087943A1 (en) * 2020-10-29 2022-05-05 Yangtze Memory Technologies Co., Ltd. Concentric staircase structure in three-dimensional memory device and method thereof
US11929124B2 (en) * 2020-11-11 2024-03-12 Micron Technology, Inc. Method and system for accessing memory cells
US11222686B1 (en) 2020-11-12 2022-01-11 Micron Technology, Inc. Apparatuses and methods for controlling refresh timing
US11462291B2 (en) 2020-11-23 2022-10-04 Micron Technology, Inc. Apparatuses and methods for tracking word line accesses
US11264079B1 (en) 2020-12-18 2022-03-01 Micron Technology, Inc. Apparatuses and methods for row hammer based cache lockdown
US11482275B2 (en) 2021-01-20 2022-10-25 Micron Technology, Inc. Apparatuses and methods for dynamically allocated aggressor detection
US11367484B1 (en) 2021-01-21 2022-06-21 Micron Technology, Inc. Multi-step pre-read for write operations in memory devices
CN112951990B (en) * 2021-02-22 2021-12-28 长江先进存储产业创新中心有限责任公司 Three-dimensional phase change memory and preparation method thereof
DE102021107795A1 (en) 2021-03-11 2022-09-15 Taiwan Semiconductor Manufacturing Co., Ltd. SILICON THRU-THROUGH MEMORY MACRO
CN114822609A (en) * 2021-03-11 2022-07-29 台湾积体电路制造股份有限公司 Memory macro including through-silicon vias
US11600314B2 (en) 2021-03-15 2023-03-07 Micron Technology, Inc. Apparatuses and methods for sketch circuits for refresh binning
US11615854B2 (en) 2021-04-02 2023-03-28 Micron Technology, Inc. Identify the programming mode of memory cells during reading of the memory cells
US11664073B2 (en) 2021-04-02 2023-05-30 Micron Technology, Inc. Adaptively programming memory cells in different modes to optimize performance
US11514983B2 (en) 2021-04-02 2022-11-29 Micron Technology, Inc. Identify the programming mode of memory cells based on cell statistics obtained during reading of the memory cells
US11715520B2 (en) 2021-04-05 2023-08-01 Micron Technology, Inc. Socket structure for spike current suppression in a memory array
US11514985B2 (en) 2021-04-05 2022-11-29 Micron Technology, Inc. Spike current suppression in a memory array
US11348640B1 (en) 2021-04-05 2022-05-31 Micron Technology, Inc. Charge screening structure for spike current suppression in a memory array
US11527287B1 (en) 2021-05-27 2022-12-13 Micron Technology, Inc. Drift aware read operations
US11664074B2 (en) 2021-06-02 2023-05-30 Micron Technology, Inc. Programming intermediate state to store data in self-selecting memory cells
US11694747B2 (en) 2021-06-03 2023-07-04 Micron Technology, Inc. Self-selecting memory cells configured to store more than one bit per memory cell
US11562790B1 (en) * 2021-06-30 2023-01-24 Micron Technology, Inc. Systems and methods for adaptive self-referenced reads of memory devices
US11538522B1 (en) 2021-06-30 2022-12-27 Micron Technology, Inc. Systems and methods for adaptive self-referenced reads of memory devices
US11664063B2 (en) 2021-08-12 2023-05-30 Micron Technology, Inc. Apparatuses and methods for countering memory attacks
US11688451B2 (en) 2021-11-29 2023-06-27 Micron Technology, Inc. Apparatuses, systems, and methods for main sketch and slim sketch circuit for row address tracking
US20230207003A1 (en) * 2021-12-23 2023-06-29 Micron Technology, Inc. Refresh of Neighboring Memory Cells Based on Read Status

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6781880B2 (en) 2002-07-19 2004-08-24 Micron Technology, Inc. Non-volatile memory erase circuitry
KR100634330B1 (en) 2002-08-14 2006-10-16 인텔 코포레이션 Method for reading a structural phase-change memory
US6738298B1 (en) 2002-11-18 2004-05-18 Micron Technology, Inc. Automatic reference voltage regulation in a memory device
DE60317768T2 (en) 2003-04-10 2008-11-27 Stmicroelectronics S.R.L., Agrate Brianza Method for reading out a non-volatile memory device and associated device
EP1634299B1 (en) 2003-06-05 2009-04-01 Nxp B.V. Integrity control for data stored in a non-volatile memory
JP4330396B2 (en) 2003-07-24 2009-09-16 株式会社ルネサステクノロジ Semiconductor memory device
JP2005100527A (en) 2003-09-25 2005-04-14 Matsushita Electric Ind Co Ltd Semiconductor nonvolatile storage device
US7079436B2 (en) 2003-09-30 2006-07-18 Hewlett-Packard Development Company, L.P. Resistive cross point memory
DE602005018738D1 (en) 2005-03-03 2010-02-25 St Microelectronics Srl A time shift based reference cell emulation memory device
EP1699054A1 (en) 2005-03-03 2006-09-06 STMicroelectronics S.r.l. A memory device with a ramp-like voltage biasing structure and reduced number of reference cells
ITVA20050028A1 (en) 2005-05-03 2006-11-04 St Microelectronics Srl RAMP GENERATOR AND RELATIVE ROW DECODER FOR FLASH MEMORY
JP4936746B2 (en) 2006-03-08 2012-05-23 ルネサスエレクトロニクス株式会社 Semiconductor device
CN100590735C (en) 2006-08-23 2010-02-17 财团法人工业技术研究院 Multi-stable state read amplifier used for memory device
JP5214422B2 (en) 2008-02-15 2013-06-19 株式会社東芝 Data storage system
US8406048B2 (en) 2008-08-08 2013-03-26 Marvell World Trade Ltd. Accessing memory using fractional reference voltages
JP2011181134A (en) * 2010-02-26 2011-09-15 Elpida Memory Inc Method of controlling nonvolatile semiconductor device
US8531888B2 (en) 2010-07-07 2013-09-10 Marvell World Trade Ltd. Determining optimal reference voltages for progressive reads in flash memory systems
US8737138B2 (en) 2010-11-18 2014-05-27 Micron Technology, Inc. Memory instruction including parameter to affect operating condition of memory
US8693252B2 (en) 2011-07-12 2014-04-08 Samsung Electronics Co., Ltd. Method and system for adjusting read voltage in flash memory device
US8767482B2 (en) 2011-08-18 2014-07-01 Micron Technology, Inc. Apparatuses, devices and methods for sensing a snapback event in a circuit
US8495285B2 (en) * 2011-08-31 2013-07-23 Micron Technology, Inc. Apparatuses and methods of operating for memory endurance
JP5942781B2 (en) 2012-04-16 2016-06-29 ソニー株式会社 Storage control device, memory system, information processing system, and storage control method
JP5293860B1 (en) * 2012-05-16 2013-09-18 富士ゼロックス株式会社 Serial communication system, image forming system, and transmission apparatus
JP5929790B2 (en) 2012-06-19 2016-06-08 ソニー株式会社 Storage control device, storage device, information processing system, and processing method therefor
US8832530B2 (en) 2012-09-26 2014-09-09 Intel Corporation Techniques associated with a read and write window budget for a two level memory system
KR101934892B1 (en) 2012-10-17 2019-01-04 삼성전자 주식회사 Method for determining deterioration state of memory device and memory system using method thereof
US9141534B2 (en) 2012-12-14 2015-09-22 Sandisk Technologies Inc. Tracking read accesses to regions of non-volatile memory
US9141823B2 (en) * 2013-03-15 2015-09-22 Veridicom, Sa De Cv Abstraction layer for default encryption with orthogonal encryption logic session object; and automated authentication, with a method for online litigation
US9275740B2 (en) 2013-08-05 2016-03-01 CNEXLABS, Inc. Method and apparatus for improving data integrity using threshold voltage recalibration
US9263136B1 (en) * 2013-09-04 2016-02-16 Western Digital Technologies, Inc. Data retention flags in solid-state drives
DE102014207296A1 (en) * 2014-04-16 2015-10-22 Robert Bosch Gmbh Apparatus and method for processing data
JP2016054017A (en) 2014-09-04 2016-04-14 株式会社東芝 Semiconductor memory device
US10320429B2 (en) 2015-03-04 2019-06-11 Toshiba Memory Corporation Memory controller, memory system and memory control method
US9460784B1 (en) 2015-04-22 2016-10-04 Micron Technology, Inc. Reference voltage generation apparatuses and methods
JP6657634B2 (en) 2015-07-24 2020-03-04 ソニー株式会社 Encoding device, memory system, communication system, and encoding method
CN108139711B (en) * 2015-09-22 2023-12-12 西门子保健有限责任公司 Automatic reference in digital holographic microscopy reconstruction
US10134470B2 (en) 2015-11-04 2018-11-20 Micron Technology, Inc. Apparatuses and methods including memory and operation of same
US9607691B1 (en) * 2016-02-17 2017-03-28 Micron Technology, Inc. Memory cell architecture for multilevel cell programming
US10083731B2 (en) 2016-03-11 2018-09-25 Micron Technology, Inc Memory cell sensing with storage component isolation
US10192606B2 (en) 2016-04-05 2019-01-29 Micron Technology, Inc. Charge extraction from ferroelectric memory cell using sense capacitors
US9892776B2 (en) 2016-06-13 2018-02-13 Micron Technology, Inc. Half density ferroelectric memory and operation
US9715919B1 (en) * 2016-06-21 2017-07-25 Micron Technology, Inc. Array data bit inversion
CN106898371B (en) 2017-02-24 2020-08-28 中国科学院上海微系统与信息技术研究所 Three-dimensional memory reading circuit and word line and bit line voltage configuration method thereof
US10424372B1 (en) 2018-04-19 2019-09-24 Micron Technology, Inc. Apparatuses and methods for sensing memory cells

Also Published As

Publication number Publication date
EP3729437A2 (en) 2020-10-28
US20220208262A1 (en) 2022-06-30
JP7026235B2 (en) 2022-02-25
US10896727B2 (en) 2021-01-19
WO2019126416A2 (en) 2019-06-27
US11282574B2 (en) 2022-03-22
US20190198099A1 (en) 2019-06-27
CN111512378A (en) 2020-08-07
KR20200089762A (en) 2020-07-27
WO2019126416A3 (en) 2019-07-25
US10600480B2 (en) 2020-03-24
JP2021508904A (en) 2021-03-11
KR102386641B1 (en) 2022-04-14
CN111512378B (en) 2023-09-29
TWI683312B (en) 2020-01-21
KR102457048B1 (en) 2022-10-20
US10431301B2 (en) 2019-10-01
US20210020239A1 (en) 2021-01-21
KR20220049609A (en) 2022-04-21
EP3729437A4 (en) 2021-08-04
TW201937498A (en) 2019-09-16
US20200294586A1 (en) 2020-09-17
US20200035297A1 (en) 2020-01-30

Similar Documents

Publication Publication Date Title
SG11202005773RA (en) Auto-referenced memory cell read techniques
SG11202005283YA (en) Auto-referenced memory cell read techniques
EP3443461A4 (en) Memory device with direct read access
GB2564994B (en) Cache memory access
EP3259757A4 (en) Memory cells
SG11201807961SA (en) Ferroelectric memory cell sensing
EP3117435A4 (en) Mitigating read disturb in a cross-point memory
IL231550A0 (en) Secure storage on external memory
EP3732685A4 (en) Polarity-conditioned memory cell write operations
EP3146524A4 (en) Read cache memory
GB2571218B (en) Memory cell structure
HK1223195A1 (en) Anti-fuse memory cell
GB201603590D0 (en) Memory unit
GB2565499B (en) Memory unit
GB2525713B (en) Memory subsystem with wrapped-to-continuous read
GB201603295D0 (en) Data storage
GB201609703D0 (en) Memory unit
EP3230879A4 (en) Storage memory direct access
IL267292B1 (en) Non-volatile memory
GB201807589D0 (en) Memory access
GB201801625D0 (en) Reversible cell
PL3193274T3 (en) Secure memory storage
EP3347928A4 (en) Memory cells
EP3314611A4 (en) Magnetic storage cell memory with back-hop prevention
GB201603589D0 (en) Memory unit