SG11202005329XA - Method for transferring a layer by using a detachable structure - Google Patents
Method for transferring a layer by using a detachable structureInfo
- Publication number
- SG11202005329XA SG11202005329XA SG11202005329XA SG11202005329XA SG11202005329XA SG 11202005329X A SG11202005329X A SG 11202005329XA SG 11202005329X A SG11202005329X A SG 11202005329XA SG 11202005329X A SG11202005329X A SG 11202005329XA SG 11202005329X A SG11202005329X A SG 11202005329XA
- Authority
- SG
- Singapore
- Prior art keywords
- transferring
- layer
- detachable structure
- detachable
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/7806—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate
- H01L21/7813—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate leaving a reusable substrate, e.g. epitaxial lift off
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/185—Joining of semiconductor bodies for junction formation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/7806—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Micromachines (AREA)
- Thin Film Transistor (AREA)
- Decoration By Transfer Pictures (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1761759A FR3074960B1 (fr) | 2017-12-07 | 2017-12-07 | Procede de transfert d'une couche utilisant une structure demontable |
PCT/FR2018/052939 WO2019110886A1 (fr) | 2017-12-07 | 2018-11-21 | Procédé de transfert d'une couche utilisant une structure démontable |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202005329XA true SG11202005329XA (en) | 2020-07-29 |
Family
ID=61802076
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202005329XA SG11202005329XA (en) | 2017-12-07 | 2018-11-21 | Method for transferring a layer by using a detachable structure |
Country Status (7)
Country | Link |
---|---|
US (1) | US11222824B2 (zh) |
EP (1) | EP3721470A1 (zh) |
CN (1) | CN111527590B (zh) |
FR (1) | FR3074960B1 (zh) |
SG (1) | SG11202005329XA (zh) |
TW (1) | TWI766128B (zh) |
WO (1) | WO2019110886A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3108439B1 (fr) | 2020-03-23 | 2022-02-11 | Soitec Silicon On Insulator | Procede de fabrication d’une structure empilee |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2748851B1 (fr) | 1996-05-15 | 1998-08-07 | Commissariat Energie Atomique | Procede de realisation d'une couche mince de materiau semiconducteur |
FR2823596B1 (fr) | 2001-04-13 | 2004-08-20 | Commissariat Energie Atomique | Substrat ou structure demontable et procede de realisation |
FR2823599B1 (fr) | 2001-04-13 | 2004-12-17 | Commissariat Energie Atomique | Substrat demomtable a tenue mecanique controlee et procede de realisation |
FR2830983B1 (fr) * | 2001-10-11 | 2004-05-14 | Commissariat Energie Atomique | Procede de fabrication de couches minces contenant des microcomposants |
DE602004010117D1 (de) * | 2004-09-16 | 2007-12-27 | St Microelectronics Srl | Verfahren zur Hestellung von zusammengestzten Halbleiterplättchen mittels Schichtübertragung |
KR101116993B1 (ko) * | 2006-03-14 | 2012-03-15 | 인스티투트 퓌어 미크로엘렉트로닉 슈투트가르트 | 집적 회로의 제조 방법 |
KR101563138B1 (ko) * | 2008-04-25 | 2015-10-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치 제조 방법 |
DE102008056175A1 (de) * | 2008-11-06 | 2010-05-12 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Strahlung emittierenden Dünnschichtbauelements und Strahlung emittierendes Dünnschichtbauelement |
SG171762A1 (en) * | 2008-11-19 | 2011-07-28 | Agency Science Tech & Res | Method of at least partially releasing an epitaxial layer |
TWI415222B (zh) * | 2009-04-06 | 2013-11-11 | Canon Kk | 半導體裝置及其製造方法 |
WO2011131847A1 (fr) * | 2010-04-21 | 2011-10-27 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procédé de transfert d'au moins une couche micro-technologique |
US20110131847A1 (en) * | 2009-12-08 | 2011-06-09 | Brian Acworth | Art display system and method |
KR20150010776A (ko) * | 2010-02-05 | 2015-01-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 및 반도체 장치의 제조 방법 |
CN104221170B (zh) * | 2012-03-19 | 2017-02-22 | 首尔伟傲世有限公司 | 用于分离外延层与生长基板的方法及使用其的半导体器件 |
US9406551B2 (en) * | 2012-09-27 | 2016-08-02 | Infineon Technologies Austria Ag | Method for manufacturing a semiconductor substrate, and method for manufacturing semiconductor devices integrated in a semiconductor substrate |
FR2999801B1 (fr) * | 2012-12-14 | 2014-12-26 | Soitec Silicon On Insulator | Procede de fabrication d'une structure |
WO2015087192A1 (en) * | 2013-12-12 | 2015-06-18 | Semiconductor Energy Laboratory Co., Ltd. | Peeling method and peeling apparatus |
DE102014116276A1 (de) * | 2014-11-07 | 2016-05-12 | Osram Opto Semiconductors Gmbh | Epitaxie-Wafer, Bauelement und Verfahren zur Herstellung eines Epitaxie-Wafers und eines Bauelements |
US10050172B2 (en) * | 2015-07-01 | 2018-08-14 | Sensor Electronic Technology, Inc. | Substrate structure removal |
-
2017
- 2017-12-07 FR FR1761759A patent/FR3074960B1/fr active Active
-
2018
- 2018-11-21 US US16/769,976 patent/US11222824B2/en active Active
- 2018-11-21 SG SG11202005329XA patent/SG11202005329XA/en unknown
- 2018-11-21 WO PCT/FR2018/052939 patent/WO2019110886A1/fr unknown
- 2018-11-21 EP EP18819196.9A patent/EP3721470A1/fr active Pending
- 2018-11-21 CN CN201880084209.7A patent/CN111527590B/zh active Active
- 2018-11-22 TW TW107141709A patent/TWI766128B/zh active
Also Published As
Publication number | Publication date |
---|---|
CN111527590B (zh) | 2023-09-29 |
WO2019110886A1 (fr) | 2019-06-13 |
FR3074960B1 (fr) | 2019-12-06 |
US20200388539A1 (en) | 2020-12-10 |
TWI766128B (zh) | 2022-06-01 |
CN111527590A (zh) | 2020-08-11 |
EP3721470A1 (fr) | 2020-10-14 |
US11222824B2 (en) | 2022-01-11 |
FR3074960A1 (fr) | 2019-06-14 |
TW201926515A (zh) | 2019-07-01 |
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