SG11201908445PA - Object processing apparatus - Google Patents

Object processing apparatus

Info

Publication number
SG11201908445PA
SG11201908445PA SG11201908445PA SG11201908445PA SG11201908445PA SG 11201908445P A SG11201908445P A SG 11201908445PA SG 11201908445P A SG11201908445P A SG 11201908445PA SG 11201908445P A SG11201908445P A SG 11201908445PA SG 11201908445P A SG11201908445P A SG 11201908445PA
Authority
SG
Singapore
Prior art keywords
processing apparatus
object processing
processing
Prior art date
Application number
SG11201908445PA
Inventor
Tsuyoshi Kagami
Hidenori Fukumoto
Original Assignee
Ulvac Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac Inc filed Critical Ulvac Inc
Publication of SG11201908445PA publication Critical patent/SG11201908445PA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67069Apparatus for fluid treatment for etching for drying etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/32568Relative arrangement or disposition of electrodes; moving means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32816Pressure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065Plasma etching; Reactive-ion etching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/46Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/334Etching
    • H01J2237/3343Problems associated with etching

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
SG11201908445PA 2017-10-17 2018-10-15 Object processing apparatus SG11201908445PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017201074 2017-10-17
PCT/JP2018/038294 WO2019078149A1 (en) 2017-10-17 2018-10-15 Apparatus for treating object to be treated

Publications (1)

Publication Number Publication Date
SG11201908445PA true SG11201908445PA (en) 2020-05-28

Family

ID=66173680

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201908445PA SG11201908445PA (en) 2017-10-17 2018-10-15 Object processing apparatus

Country Status (7)

Country Link
US (1) US20210305070A1 (en)
JP (1) JP6768946B2 (en)
KR (1) KR102215873B1 (en)
CN (1) CN110402481B (en)
SG (1) SG11201908445PA (en)
TW (1) TWI708276B (en)
WO (1) WO2019078149A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7190495B2 (en) 2018-09-03 2022-12-15 株式会社Preferred Networks Inference method, inference device, model generation method, and learning device

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59205719A (en) * 1983-05-09 1984-11-21 Matsushita Electric Ind Co Ltd Dry-etching apparatus
JPH06283472A (en) * 1993-03-29 1994-10-07 Tokyo Electron Ltd Plasma device and plasma processing method
KR20010089376A (en) * 1998-10-29 2001-10-06 조셉 제이. 스위니 Apparatus for coupling power through a workpiece in a semiconductor wafer processing system
JP2003017466A (en) * 1999-01-28 2003-01-17 Nec Corp Particle removal system
US6228438B1 (en) * 1999-08-10 2001-05-08 Unakis Balzers Aktiengesellschaft Plasma reactor for the treatment of large size substrates
TW464879B (en) * 2000-01-28 2001-11-21 Nippon Electric Co Dust particle removing method and apparatus, impurity detecting method and system
US7850174B2 (en) * 2003-01-07 2010-12-14 Tokyo Electron Limited Plasma processing apparatus and focus ring
KR100752800B1 (en) * 2003-03-12 2007-08-29 동경 엘렉트론 주식회사 Substrate holding structure for semiconductor processing, and plasma processing device
TWI488236B (en) * 2003-09-05 2015-06-11 Tokyo Electron Ltd Focusing ring and plasma processing device
JP4398802B2 (en) 2004-06-17 2010-01-13 東京エレクトロン株式会社 Substrate processing equipment
JP4597894B2 (en) * 2006-03-31 2010-12-15 東京エレクトロン株式会社 Substrate mounting table and substrate processing apparatus
CN101512736A (en) * 2006-09-11 2009-08-19 株式会社爱发科 Dry etching method
JP4992389B2 (en) * 2006-11-06 2012-08-08 東京エレクトロン株式会社 Mounting apparatus, plasma processing apparatus, and plasma processing method
JP5014166B2 (en) 2007-02-13 2012-08-29 株式会社日立ハイテクノロジーズ Plasma processing method and plasma processing apparatus
JP5294669B2 (en) * 2008-03-25 2013-09-18 東京エレクトロン株式会社 Plasma processing equipment
JP2010278166A (en) * 2009-05-27 2010-12-09 Tokyo Electron Ltd Annular component for plasma treatment, and plasma treatment device
JP2011228436A (en) 2010-04-19 2011-11-10 Hitachi High-Technologies Corp Plasma processing apparatus and plasma processing method
JP5848760B2 (en) * 2010-06-22 2016-01-27 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. Organic electroluminescent device with separating foil
JP6283472B2 (en) 2013-04-30 2018-02-21 グンゼ株式会社 Coating device
CN104701157A (en) * 2015-03-31 2015-06-10 上海华力微电子有限公司 Plasma etching apparatus with top disc for reducing edge etching rate

Also Published As

Publication number Publication date
CN110402481B (en) 2023-07-21
WO2019078149A1 (en) 2019-04-25
KR102215873B1 (en) 2021-02-16
CN110402481A (en) 2019-11-01
US20210305070A1 (en) 2021-09-30
JP6768946B2 (en) 2020-10-14
JPWO2019078149A1 (en) 2019-11-21
TWI708276B (en) 2020-10-21
TW201923819A (en) 2019-06-16
KR20190112800A (en) 2019-10-07

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