SG11201605673VA - Workpiece processing apparatus and workpiece processing method - Google Patents

Workpiece processing apparatus and workpiece processing method

Info

Publication number
SG11201605673VA
SG11201605673VA SG11201605673VA SG11201605673VA SG11201605673VA SG 11201605673V A SG11201605673V A SG 11201605673VA SG 11201605673V A SG11201605673V A SG 11201605673VA SG 11201605673V A SG11201605673V A SG 11201605673VA SG 11201605673V A SG11201605673V A SG 11201605673VA
Authority
SG
Singapore
Prior art keywords
workpiece processing
processing apparatus
processing method
workpiece
processing
Prior art date
Application number
SG11201605673VA
Inventor
Taichi Yasuda
Tatsuo Enomoto
Original Assignee
Shinetsu Handotai Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinetsu Handotai Kk filed Critical Shinetsu Handotai Kk
Publication of SG11201605673VA publication Critical patent/SG11201605673VA/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/08Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/16Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
SG11201605673VA 2014-01-29 2015-01-16 Workpiece processing apparatus and workpiece processing method SG11201605673VA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014014920A JP6015683B2 (en) 2014-01-29 2014-01-29 Workpiece processing apparatus and workwork processing method
PCT/JP2015/000170 WO2015115043A1 (en) 2014-01-29 2015-01-16 Workpiece machining device and workpiece machining method

Publications (1)

Publication Number Publication Date
SG11201605673VA true SG11201605673VA (en) 2016-08-30

Family

ID=53756630

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201605673VA SG11201605673VA (en) 2014-01-29 2015-01-16 Workpiece processing apparatus and workpiece processing method

Country Status (7)

Country Link
US (1) US10434621B2 (en)
JP (1) JP6015683B2 (en)
KR (1) KR102296692B1 (en)
CN (1) CN105980105B (en)
DE (1) DE112015000336T5 (en)
SG (1) SG11201605673VA (en)
WO (1) WO2015115043A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6269450B2 (en) * 2014-11-18 2018-01-31 信越半導体株式会社 Workpiece processing equipment
JP6443370B2 (en) * 2016-03-18 2018-12-26 信越半導体株式会社 Method for manufacturing carrier for double-side polishing apparatus and double-side polishing method for wafer
JP6589762B2 (en) * 2016-07-13 2019-10-16 株式会社Sumco Double-side polishing equipment
DE102018202059A1 (en) * 2018-02-09 2019-08-14 Siltronic Ag Method for polishing a semiconductor wafer
JP7369067B2 (en) * 2020-03-11 2023-10-25 日本発條株式会社 Polishing equipment and method
CN115070511B (en) * 2021-03-16 2023-12-15 华晨宝马汽车有限公司 Method, apparatus and production line for monitoring a polishing operation on a vehicle

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02106269A (en) * 1988-10-12 1990-04-18 Toshiba Mach Co Ltd Polishing machine having abnormal charging detector
JP2839331B2 (en) 1990-05-17 1998-12-16 レッキス工業株式会社 Pipe scraper
JPH0425371A (en) * 1990-05-17 1992-01-29 Showa Alum Corp Polishing device
JPH08216016A (en) * 1995-02-14 1996-08-27 Mitsubishi Materials Shilicon Corp Method of polishing semiconductor wafer and polishing device
US6113165A (en) * 1998-10-02 2000-09-05 Taiwan Semiconductor Manufacturing Co., Ltd. Self-sensing wafer holder and method of using
KR100737879B1 (en) * 2000-04-24 2007-07-10 주식회사 사무코 Method of manufacturing semiconductor wafer
US6709981B2 (en) 2000-08-16 2004-03-23 Memc Electronic Materials, Inc. Method and apparatus for processing a semiconductor wafer using novel final polishing method
CN1315159C (en) 2002-09-06 2007-05-09 大连淡宁实业发展有限公司 Technique for precision finishing two side of plane wafer in large size
US6931330B1 (en) * 2003-06-30 2005-08-16 Lam Research Corporation Methods for monitoring and controlling chemical mechanical planarization
JP4492155B2 (en) 2004-02-27 2010-06-30 信越半導体株式会社 Semiconductor wafer carrier holding hole detection device and detection method, and semiconductor wafer polishing method
JP2008227393A (en) 2007-03-15 2008-09-25 Fujikoshi Mach Corp Double-side polishing apparatus for wafer
JP2009039827A (en) 2007-08-09 2009-02-26 Fujitsu Ltd Polishing apparatus, substrate manufacturing method, and electronic device manufacturing method
US8834230B2 (en) 2008-07-31 2014-09-16 Shin-Etsu Handotai Co., Ltd. Wafer polishing method and double-side polishing apparatus
JP5630414B2 (en) * 2011-10-04 2014-11-26 信越半導体株式会社 Wafer processing method
JP5973883B2 (en) * 2012-11-15 2016-08-23 株式会社荏原製作所 Substrate holding device and polishing device

Also Published As

Publication number Publication date
JP2015139857A (en) 2015-08-03
CN105980105B (en) 2017-12-01
US20160332279A1 (en) 2016-11-17
DE112015000336T5 (en) 2016-09-29
US10434621B2 (en) 2019-10-08
CN105980105A (en) 2016-09-28
KR102296692B1 (en) 2021-09-02
JP6015683B2 (en) 2016-10-26
KR20160113619A (en) 2016-09-30
WO2015115043A1 (en) 2015-08-06

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