SG11201406416PA - A method of estimating frictional resistance of ship bottom coating film, and a method of evaluating coating film performance using said method and a device for evaluating coating film performance - Google Patents
A method of estimating frictional resistance of ship bottom coating film, and a method of evaluating coating film performance using said method and a device for evaluating coating film performanceInfo
- Publication number
- SG11201406416PA SG11201406416PA SG11201406416PA SG11201406416PA SG11201406416PA SG 11201406416P A SG11201406416P A SG 11201406416PA SG 11201406416P A SG11201406416P A SG 11201406416PA SG 11201406416P A SG11201406416P A SG 11201406416PA SG 11201406416P A SG11201406416P A SG 11201406416PA
- Authority
- SG
- Singapore
- Prior art keywords
- coating film
- evaluating
- film performance
- frictional resistance
- ship bottom
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N19/00—Investigating materials by mechanical methods
- G01N19/02—Measuring coefficient of friction between materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B63—SHIPS OR OTHER WATERBORNE VESSELS; RELATED EQUIPMENT
- B63B—SHIPS OR OTHER WATERBORNE VESSELS; EQUIPMENT FOR SHIPPING
- B63B71/00—Designing vessels; Predicting their performance
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/16—Antifouling paints; Underwater paints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20016—Goniometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
- G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
- G01N23/20041—Sample holders or supports therefor for high pressure testing, e.g. anvil cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/2005—Preparation of powder samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20058—Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Automation & Control Theory (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Wood Science & Technology (AREA)
- Ocean & Marine Engineering (AREA)
- Mechanical Engineering (AREA)
- Combustion & Propulsion (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012088427A JP5916490B2 (en) | 2012-04-09 | 2012-04-09 | Friction resistance prediction method for ship bottom coating film, coating film performance evaluation method and coating film performance evaluation apparatus using the method |
PCT/JP2013/055777 WO2013153877A1 (en) | 2012-04-09 | 2013-03-04 | Method for estimating frictional resistance of ship bottom coating film, and method for evaluating coating film performance and device for evaluating coating film performance using said method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201406416PA true SG11201406416PA (en) | 2015-02-27 |
Family
ID=49327455
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201406416PA SG11201406416PA (en) | 2012-04-09 | 2013-03-04 | A method of estimating frictional resistance of ship bottom coating film, and a method of evaluating coating film performance using said method and a device for evaluating coating film performance |
Country Status (7)
Country | Link |
---|---|
US (1) | US10145781B2 (en) |
JP (1) | JP5916490B2 (en) |
KR (1) | KR101685268B1 (en) |
CN (1) | CN104204770B (en) |
GB (1) | GB2515232B (en) |
SG (1) | SG11201406416PA (en) |
WO (1) | WO2013153877A1 (en) |
Families Citing this family (6)
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---|---|---|---|---|
JP6482888B2 (en) * | 2015-02-05 | 2019-03-13 | 中国塗料株式会社 | Method of predicting frictional resistance of rough surface and surface performance evaluation apparatus |
WO2017064016A1 (en) | 2015-10-15 | 2017-04-20 | Akzo Nobel Coatings International B.V. | Method for applying a coating to an external surface of a man-made object to be at least partly immersed in water |
JP6969724B2 (en) * | 2017-05-22 | 2021-11-24 | 国立研究開発法人 海上・港湾・航空技術研究所 | Wavy rough surface friction resistance evaluation method and wavy rough surface friction resistance evaluation device |
CN108344557A (en) * | 2018-01-24 | 2018-07-31 | 中国船舶重工集团公司第七二五研究所 | A kind of test method for nonpolluting coating resistance performance under real extra large environment |
CN109931980A (en) * | 2019-02-02 | 2019-06-25 | 中铝材料应用研究院有限公司 | A kind of evaluation method of aluminium alloy anodization film surface quality |
CN114154246B (en) * | 2021-12-07 | 2023-06-13 | 中国船舶科学研究中心 | Evaluation method for friction resistance reducing efficacy test of rotating cylinder |
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JPS6044568A (en) * | 1983-08-19 | 1985-03-09 | Dainippon Toryo Co Ltd | Antifouling paint for ship bottom capable of reducing frictional resistance in water |
JPS6239393A (en) * | 1985-08-14 | 1987-02-20 | Nippon Oil & Fats Co Ltd | Method of applying antifouling processing on ship outer board part |
JPH02170010A (en) * | 1988-12-23 | 1990-06-29 | Kawasaki Steel Corp | Replica sampling method for surface roughness measurement |
KR960031985A (en) * | 1995-02-28 | 1996-09-17 | 김무 | Friction Wear Test Device for Limit Load Measurement |
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JP4633224B2 (en) | 2000-04-03 | 2011-02-16 | 中国塗料株式会社 | Antifouling paint composition, antifouling coating film, ship or underwater structure coated with said antifouling coating film, and antifouling method for ship outer plate or underwater structure |
JP4786053B2 (en) | 2000-04-12 | 2011-10-05 | 中国塗料株式会社 | Antifouling paint composition, antifouling coating, substrate coated with the coating, antifouling method |
WO2001077238A1 (en) | 2000-04-12 | 2001-10-18 | Dainippon Ink And Chemicals, Inc. | Antifouling coating composition and novel resin |
JP4647060B2 (en) | 2000-05-12 | 2011-03-09 | 中国塗料株式会社 | Antifouling paint composition, antifouling coating film, ship or underwater structure coated with said antifouling coating film, and antifouling method for ship outer plate or underwater structure |
JP4651792B2 (en) | 2000-08-30 | 2011-03-16 | 中国塗料株式会社 | Antifouling paint composition, coating film thereof and antifouling method |
JP4642204B2 (en) | 2000-09-22 | 2011-03-02 | 中国塗料株式会社 | Antifouling paint composition, coating film comprising the composition, substrate coated with the coating film, and antifouling method |
SG97209A1 (en) | 2000-10-25 | 2003-07-18 | Chugoku Marine Paints | Novel (poly) oxyalkylene block silyl ester copolymer, antifouling coating composition, antifouling coating formed from antifouling coating composition, antifouling method using antifouling coating composition and hull or underwater structure covered with antifouling coating |
JP4776839B2 (en) | 2000-10-25 | 2011-09-21 | 中国塗料株式会社 | Antifouling coating composition, antifouling coating film formed from this antifouling coating composition, antifouling method using the antifouling coating composition, and hull or underwater structure coated with the coating |
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JP4813608B2 (en) | 2010-03-05 | 2011-11-09 | 学校法人北里研究所 | Barnacle culture method, and barnacles with a flat bottom obtained by the method |
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TW201205217A (en) | 2010-07-30 | 2012-02-01 | Univ Nat Formosa | Topography shaping apparatus for forming surfaces of low friction coefficient |
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JP4812895B1 (en) | 2010-11-10 | 2011-11-09 | 日東化成株式会社 | Antifouling paint composition, fishing net to which the paint composition is applied, fishing net equipment and underwater construction |
JP4812902B1 (en) | 2011-02-28 | 2011-11-09 | 大日本塗料株式会社 | Antifouling paint composition and method for forming antifouling coating film |
US20150132539A1 (en) * | 2013-08-29 | 2015-05-14 | Jeffrey R. Bailey | Process for Applying a Friction Reducing Coating |
-
2012
- 2012-04-09 JP JP2012088427A patent/JP5916490B2/en active Active
-
2013
- 2013-03-04 CN CN201380019147.9A patent/CN104204770B/en active Active
- 2013-03-04 WO PCT/JP2013/055777 patent/WO2013153877A1/en active Application Filing
- 2013-03-04 KR KR1020147028614A patent/KR101685268B1/en active IP Right Grant
- 2013-03-04 GB GB1418118.4A patent/GB2515232B/en active Active
- 2013-03-04 SG SG11201406416PA patent/SG11201406416PA/en unknown
- 2013-03-04 US US14/391,259 patent/US10145781B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN104204770B (en) | 2017-02-08 |
KR101685268B1 (en) | 2016-12-09 |
JP2013217766A (en) | 2013-10-24 |
CN104204770A (en) | 2014-12-10 |
US10145781B2 (en) | 2018-12-04 |
GB201418118D0 (en) | 2014-11-26 |
JP5916490B2 (en) | 2016-05-11 |
US20150081231A1 (en) | 2015-03-19 |
KR20140130233A (en) | 2014-11-07 |
GB2515232B (en) | 2018-05-16 |
WO2013153877A1 (en) | 2013-10-17 |
GB2515232A (en) | 2014-12-17 |
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