SG10201909185PA - Memory device including charge pump circuit - Google Patents

Memory device including charge pump circuit

Info

Publication number
SG10201909185PA
SG10201909185PA SG10201909185PA SG10201909185PA SG10201909185PA SG 10201909185P A SG10201909185P A SG 10201909185PA SG 10201909185P A SG10201909185P A SG 10201909185PA SG 10201909185P A SG10201909185P A SG 10201909185PA SG 10201909185P A SG10201909185P A SG 10201909185PA
Authority
SG
Singapore
Prior art keywords
memory device
device including
charge pump
pump circuit
including charge
Prior art date
Application number
SG10201909185PA
Inventor
Baek Se-Heon
Byeon Dae-Seok
Jang Ki-chang
Min Young-Sun
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of SG10201909185PA publication Critical patent/SG10201909185PA/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5671Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge trapping in an insulator
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/32Timing circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/12005Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising voltage or current generators
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222Clock generating, synchronizing or distributing circuits within memory device
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00Conversion of dc power input into dc power output
    • H02M3/02Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/06Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
    • H02M3/07Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
    • H02M3/073Charge pumps of the Schenkel-type
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22Control and timing of internal memory operations
    • G11C2207/2254Calibration
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00Conversion of dc power input into dc power output
    • H02M3/02Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/06Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
    • H02M3/07Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
    • H02M3/073Charge pumps of the Schenkel-type
    • H02M3/077Charge pumps of the Schenkel-type with parallel connected charge pump stages
SG10201909185PA 2018-10-05 2019-10-01 Memory device including charge pump circuit SG10201909185PA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020180119304A KR102545174B1 (en) 2018-10-05 2018-10-05 Memory device having charge pump circuit

Publications (1)

Publication Number Publication Date
SG10201909185PA true SG10201909185PA (en) 2020-05-28

Family

ID=70051246

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201909185PA SG10201909185PA (en) 2018-10-05 2019-10-01 Memory device including charge pump circuit

Country Status (4)

Country Link
US (1) US10867639B2 (en)
KR (1) KR102545174B1 (en)
CN (1) CN111009267A (en)
SG (1) SG10201909185PA (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102609558B1 (en) * 2018-12-07 2023-12-04 삼성전자주식회사 Voltage generator and operating method thereof
KR20220049653A (en) * 2020-10-14 2022-04-22 삼성전자주식회사 Nonvolatile memory device
US11908528B2 (en) * 2020-11-20 2024-02-20 Stmicroelectronics International N.V. Selectively configurable charge pump
EP4033661B1 (en) * 2020-11-25 2024-01-24 Changxin Memory Technologies, Inc. Control circuit and delay circuit
KR20220118174A (en) * 2021-02-18 2022-08-25 에스케이하이닉스 주식회사 Charge pump circuit and operation method thereof and semiconductor device including charge pump circuit
CN113409849A (en) * 2021-05-21 2021-09-17 芯天下技术股份有限公司 Method, device, storage medium and terminal for reducing programming power consumption
IT202200006488A1 (en) * 2022-04-01 2023-10-01 St Microelectronics Srl VOLTAGE REGULATOR DEVICE, CORRESPONDING PROCEDURE AND DATA STORAGE SYSTEM

Family Cites Families (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002032987A (en) * 2000-07-18 2002-01-31 Mitsubishi Electric Corp Internal voltage generating circuit
EP1310959B1 (en) * 2001-11-09 2008-06-18 STMicroelectronics S.r.l. Low power charge pump circuit
ITMI20022268A1 (en) 2002-10-25 2004-04-26 Atmel Corp VARIABLE CHARGE PUMP CIRCUIT WITH DYNAMIC LOAD
KR100572323B1 (en) * 2003-12-11 2006-04-19 삼성전자주식회사 Multilevel High Voltage Generator
KR100645055B1 (en) * 2004-10-28 2006-11-10 삼성전자주식회사 Flash memory device and program method thereof
KR100673170B1 (en) * 2005-03-10 2007-01-22 주식회사 하이닉스반도체 Flash memory device with improved erase function and method for controlling erase operation of the same
KR100700147B1 (en) * 2005-12-13 2007-03-28 삼성전자주식회사 Circuit and method of driving sub word-lines of a semiconductor memory device
US8279704B2 (en) * 2006-07-31 2012-10-02 Sandisk 3D Llc Decoder circuitry providing forward and reverse modes of memory array operation and method for biasing same
JP2008193766A (en) * 2007-02-01 2008-08-21 Spansion Llc Voltage generating circuit and control method thereof
US7760569B2 (en) * 2007-04-05 2010-07-20 Qimonda Ag Semiconductor memory device with temperature control
KR100918299B1 (en) * 2007-04-25 2009-09-18 삼성전자주식회사 Flash memory device including a row decoder having no bad bolck data storage means and control method thereof
US7724603B2 (en) * 2007-08-03 2010-05-25 Freescale Semiconductor, Inc. Method and circuit for preventing high voltage memory disturb
US8072256B2 (en) * 2007-09-14 2011-12-06 Mosaid Technologies Incorporated Dynamic random access memory and boosted voltage producer therefor
US7760010B2 (en) * 2007-10-30 2010-07-20 International Business Machines Corporation Switched-capacitor charge pumps
US7701784B2 (en) * 2007-11-02 2010-04-20 Kabushiki Kaisha Toshiba Semiconductor memory device which includes memory cell having charge accumulation layer and control gate
US7956673B2 (en) 2008-08-11 2011-06-07 Micron Technology, Inc. Variable stage charge pump and method for providing boosted output voltage
US7973592B2 (en) * 2009-07-21 2011-07-05 Sandisk Corporation Charge pump with current based regulation
KR101605381B1 (en) * 2009-09-28 2016-03-23 삼성전자주식회사 Non-volatile memory device and non-volatile memory system having the same
US20110133820A1 (en) 2009-12-09 2011-06-09 Feng Pan Multi-Stage Charge Pump with Variable Number of Boosting Stages
US8085086B1 (en) * 2010-07-20 2011-12-27 Macronix International Co., Ltd. Non-volatile memory device and charge pump circuit for the same
KR20120061574A (en) * 2010-12-03 2012-06-13 에스케이하이닉스 주식회사 Pump circuit and semiconductor memory device having the same
US9413362B2 (en) 2011-01-18 2016-08-09 Peregrine Semiconductor Corporation Differential charge pump
US8724373B2 (en) * 2011-09-12 2014-05-13 Qualcomm Incorporated Apparatus for selective word-line boost on a memory cell
KR20130031483A (en) * 2011-09-21 2013-03-29 에스케이하이닉스 주식회사 Non-volatile memory device
JP2013114711A (en) * 2011-11-28 2013-06-10 Toshiba Corp Voltage generation circuit
KR20130063255A (en) * 2011-12-06 2013-06-14 에스케이하이닉스 주식회사 Semiconductor memory device and method of operating the same
KR102083491B1 (en) * 2012-12-05 2020-03-02 삼성전자 주식회사 Memory device, memory system and operating method of the same
KR102053944B1 (en) 2013-02-21 2019-12-11 삼성전자주식회사 Nonvolatile memory device and memory system including the same
KR102161738B1 (en) * 2014-04-07 2020-10-05 삼성전자주식회사 Non-volatile memory device, memory system and operating method of non-volatile memory device
KR102158859B1 (en) * 2014-05-21 2020-09-22 삼성전자주식회사 Voltage generator and semiconductor memory device including the same
KR102131324B1 (en) * 2014-07-08 2020-07-07 삼성전자 주식회사 Resistive Memory Device and Operating Method thereof
US9462395B2 (en) * 2014-07-22 2016-10-04 Stmicroelectronics S.R.L. Biasing circuit for a MEMS acoustic transducer with reduced start-up time
US9881654B2 (en) 2015-01-14 2018-01-30 Macronix International Co., Ltd. Power source for memory circuitry
US9917507B2 (en) 2015-05-28 2018-03-13 Sandisk Technologies Llc Dynamic clock period modulation scheme for variable charge pump load currents
JP2017054574A (en) * 2015-09-11 2017-03-16 株式会社東芝 Voltage generation circuit and semiconductor memory device
US9698676B1 (en) 2016-03-11 2017-07-04 Sandisk Technologies Llc Charge pump based over-sampling with uniform step size for current detection
US10014851B2 (en) 2016-11-02 2018-07-03 Texas Instruments Incorporated Current sensing and control for a transistor power switch
KR102242565B1 (en) * 2017-06-08 2021-04-20 삼성전자주식회사 Memory controller for controlling a memory device based on erase status information and an operation method thereof
TWI702611B (en) * 2018-12-06 2020-08-21 旺宏電子股份有限公司 Memory circuit
US11011239B2 (en) * 2018-12-27 2021-05-18 Kioxia Corporation Semiconductor memory
KR20200092749A (en) * 2019-01-25 2020-08-04 삼성전자주식회사 Integrated circuit including charging circuit and camera flash driver and operation method thereof

Also Published As

Publication number Publication date
US20200111513A1 (en) 2020-04-09
CN111009267A (en) 2020-04-14
KR102545174B1 (en) 2023-06-19
US10867639B2 (en) 2020-12-15
KR20200039403A (en) 2020-04-16

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