SG10201905061PA - Semiconductor Packages Having Improved Thermal Discharge And Electromagnetic Shielding Characteristics - Google Patents
Semiconductor Packages Having Improved Thermal Discharge And Electromagnetic Shielding CharacteristicsInfo
- Publication number
- SG10201905061PA SG10201905061PA SG10201905061PA SG10201905061PA SG10201905061PA SG 10201905061P A SG10201905061P A SG 10201905061PA SG 10201905061P A SG10201905061P A SG 10201905061PA SG 10201905061P A SG10201905061P A SG 10201905061PA SG 10201905061P A SG10201905061P A SG 10201905061PA
- Authority
- SG
- Singapore
- Prior art keywords
- electromagnetic shielding
- semiconductor packages
- improved thermal
- thermal discharge
- shielding characteristics
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06575—Auxiliary carrier between devices, the carrier having no electrical connection structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06589—Thermal management, e.g. cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020180104781A KR102574453B1 (en) | 2018-09-03 | 2018-09-03 | semiconductor package having improved thermal emission and electromagnetic shielding characteristics |
Publications (1)
Publication Number | Publication Date |
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SG10201905061PA true SG10201905061PA (en) | 2020-04-29 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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SG10201905061PA SG10201905061PA (en) | 2018-09-03 | 2019-06-03 | Semiconductor Packages Having Improved Thermal Discharge And Electromagnetic Shielding Characteristics |
Country Status (6)
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US (2) | US10797021B2 (en) |
EP (1) | EP3627550A1 (en) |
KR (1) | KR102574453B1 (en) |
CN (1) | CN110875282A (en) |
SG (1) | SG10201905061PA (en) |
TW (1) | TWI799589B (en) |
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Publication number | Priority date | Publication date | Assignee | Title |
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US10872835B1 (en) * | 2019-07-03 | 2020-12-22 | Micron Technology, Inc. | Semiconductor assemblies including vertically integrated circuits and methods of manufacturing the same |
US20210193579A1 (en) * | 2019-12-23 | 2021-06-24 | Intel Corporation | Embedded die architecture and method of making |
JP2021148653A (en) * | 2020-03-19 | 2021-09-27 | キオクシア株式会社 | Semiconductor device, inspection component, and inspection device |
KR20220083438A (en) | 2020-12-11 | 2022-06-20 | 삼성전자주식회사 | Semiconductor package |
CN112908867A (en) * | 2021-01-18 | 2021-06-04 | 上海先方半导体有限公司 | 2.5D packaging structure and manufacturing method thereof |
CN112908984A (en) * | 2021-01-18 | 2021-06-04 | 上海先方半导体有限公司 | SSD (solid State disk) stacked packaging structure with radiating fins and manufacturing method thereof |
US20240186274A1 (en) * | 2022-12-01 | 2024-06-06 | Micron Technology, Inc. | Techniques for thermal distribution in coupled semiconductor systems |
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JP3532871B2 (en) * | 2001-02-28 | 2004-05-31 | 株式会社東芝 | Cooling device and electronic device having this cooling device |
US7309911B2 (en) | 2005-05-26 | 2007-12-18 | International Business Machines Corporation | Method and stacked memory structure for implementing enhanced cooling of memory devices |
US8143098B2 (en) * | 2009-03-25 | 2012-03-27 | Stats Chippac Ltd. | Integrated circuit packaging system with interposer and method of manufacture thereof |
KR101099577B1 (en) * | 2009-09-18 | 2011-12-28 | 앰코 테크놀로지 코리아 주식회사 | Semiconductor package having electromagnetic waves shielding and heat emission means |
US8030750B2 (en) * | 2009-11-19 | 2011-10-04 | Advanced Semiconductor Engineering, Inc. | Semiconductor device packages with electromagnetic interference shielding |
KR101711048B1 (en) * | 2010-10-07 | 2017-03-02 | 삼성전자 주식회사 | Semiconductor device comprising a shielding layer and fabrication method thereof |
US20130037929A1 (en) * | 2011-08-09 | 2013-02-14 | Kay S. Essig | Stackable wafer level packages and related methods |
KR20130105151A (en) | 2012-03-16 | 2013-09-25 | (주) 나온텍 | Sip module having electromagnetic wave shielding function |
US8704341B2 (en) * | 2012-05-15 | 2014-04-22 | Advanced Semiconductor Engineering, Inc. | Semiconductor packages with thermal dissipation structures and EMI shielding |
US9111896B2 (en) | 2012-08-24 | 2015-08-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package-on-package semiconductor device |
US9881875B2 (en) * | 2013-07-31 | 2018-01-30 | Universal Scientific Industrial (Shanghai) Co., Ltd. | Electronic module and method of making the same |
KR102126977B1 (en) * | 2013-08-21 | 2020-06-25 | 삼성전자주식회사 | Semiconductor package |
US9368455B2 (en) | 2014-03-28 | 2016-06-14 | Intel Corporation | Electromagnetic interference shield for semiconductor chip packages |
US9820373B2 (en) * | 2014-06-26 | 2017-11-14 | Apple Inc. | Thermal solutions for system-in-package assemblies in portable electronic devices |
US9786623B2 (en) * | 2015-03-17 | 2017-10-10 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming PoP semiconductor device with RDL over top package |
US9761540B2 (en) | 2015-06-24 | 2017-09-12 | Micron Technology, Inc. | Wafer level package and fabrication method thereof |
US10224290B2 (en) | 2015-12-24 | 2019-03-05 | Intel Corporation | Electromagnetically shielded electronic devices and related systems and methods |
US10163810B2 (en) | 2015-12-26 | 2018-12-25 | Intel Corporation | Electromagnetic interference shielding for system-in-package technology |
US10147685B2 (en) * | 2016-03-10 | 2018-12-04 | Apple Inc. | System-in-package devices with magnetic shielding |
KR101837514B1 (en) | 2016-06-07 | 2018-03-14 | 주식회사 네패스 | Semiconductor package, method of manufacturing the same and system in package |
JP6328698B2 (en) * | 2016-07-26 | 2018-05-23 | Tdk株式会社 | Electronic circuit package |
US10037948B2 (en) | 2016-08-19 | 2018-07-31 | Apple Inc. | Invisible compartment shielding |
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2018
- 2018-09-03 KR KR1020180104781A patent/KR102574453B1/en active IP Right Grant
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2019
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2020
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TWI799589B (en) | 2023-04-21 |
KR20200026610A (en) | 2020-03-11 |
EP3627550A1 (en) | 2020-03-25 |
US10797021B2 (en) | 2020-10-06 |
CN110875282A (en) | 2020-03-10 |
KR102574453B1 (en) | 2023-09-04 |
US20200075545A1 (en) | 2020-03-05 |
TW202011561A (en) | 2020-03-16 |
US11205637B2 (en) | 2021-12-21 |
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