SG10201811843QA - Surface inspection system, apparatus, and method - Google Patents
Surface inspection system, apparatus, and methodInfo
- Publication number
- SG10201811843QA SG10201811843QA SG10201811843QA SG10201811843QA SG 10201811843Q A SG10201811843Q A SG 10201811843QA SG 10201811843Q A SG10201811843Q A SG 10201811843QA SG 10201811843Q A SG10201811843Q A SG 10201811843QA
- Authority
- SG
- Singapore
- Prior art keywords
- detector
- inspection system
- surface inspection
- terahertz emitter
- computing device
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title abstract 3
- 238000000034 method Methods 0.000 title abstract 2
- 239000002344 surface layer Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/927,591 US10976244B2 (en) | 2018-03-21 | 2018-03-21 | Surface inspection system, apparatus, and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG10201811843QA true SG10201811843QA (en) | 2019-10-30 |
Family
ID=65904258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG10201811843Q SG10201811843QA (en) | 2018-03-21 | 2018-12-31 | Surface inspection system, apparatus, and method |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10976244B2 (fr) |
| EP (1) | EP3543683B1 (fr) |
| JP (1) | JP7432991B2 (fr) |
| CN (1) | CN110296954A (fr) |
| SG (1) | SG10201811843QA (fr) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10643324B2 (en) * | 2018-08-30 | 2020-05-05 | Saudi Arabian Oil Company | Machine learning system and data fusion for optimization of deployment conditions for detection of corrosion under insulation |
| US10533937B1 (en) | 2018-08-30 | 2020-01-14 | Saudi Arabian Oil Company | Cloud-based machine learning system and data fusion for the prediction and detection of corrosion under insulation |
| US10871444B2 (en) * | 2018-08-30 | 2020-12-22 | Saudi Arabian Oil Company | Inspection and failure detection of corrosion under fireproofing insulation using a hybrid sensory system |
| DE102019109339B4 (de) * | 2019-04-09 | 2021-04-08 | CiTEX Holding GmbH | Verfahren zur Kalibrierung einer THz-Messvorrichtung, THz-Messverfahren sowie entsprechende THz-Messvorrichtung |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2405466B (en) | 2003-08-27 | 2006-01-25 | Teraview Ltd | Method and apparatus for investigating a non-planner sample |
| US7145148B2 (en) * | 2003-09-25 | 2006-12-05 | Alfano Robert R | Systems and methods for non-destructively detecting material abnormalities beneath a coated surface |
| US9909986B2 (en) | 2003-10-15 | 2018-03-06 | Applied Research And Photonics, Inc. | Thickness determination and layer characterization using terahertz scanning reflectometry |
| WO2006088845A2 (fr) * | 2005-02-15 | 2006-08-24 | Walleye Technologies, Inc. | Imageur a balayage electromagnetique |
| KR101545419B1 (ko) * | 2011-02-10 | 2015-08-18 | 가부시키가이샤 히다치 하이테크놀로지즈 | 이물 검출 장치 및 이물 검출 방법 |
| JP2013213687A (ja) | 2012-03-30 | 2013-10-17 | Mitsubishi Heavy Ind Ltd | シーラント検査方法、シーラント検査装置および航空機部材 |
| JP6074908B2 (ja) * | 2012-04-26 | 2017-02-08 | Ｊｆｅスチール株式会社 | 表面検査装置および欠陥計測方法 |
| US9414026B2 (en) * | 2013-01-25 | 2016-08-09 | The Boeing Company | System and method for automated crack inspection and repair |
| GB201303324D0 (en) * | 2013-02-25 | 2013-04-10 | Subterandt Ltd | Passive detection of deformation under coatings |
| JP6459249B2 (ja) | 2014-07-01 | 2019-01-30 | 大日本印刷株式会社 | 積層体の検査方法、積層体の製造方法および積層体の検査装置 |
| DE102014012095A1 (de) | 2014-08-13 | 2016-02-18 | Steinbichler Optotechnik Gmbh | Verfahren und Vorrichtung zum Prüfen eines Reifens |
| JP2016075618A (ja) * | 2014-10-08 | 2016-05-12 | パイオニア株式会社 | 異常検出装置及び異常検出方法、並びにコンピュータプログラム及び記録媒体 |
| US10168287B2 (en) * | 2015-06-12 | 2019-01-01 | The Boeing Company | Automated detection of fatigue cracks around fasteners using millimeter waveguide probe |
| CN105333841B (zh) * | 2015-12-01 | 2017-12-29 | 中国矿业大学 | 基于反射型太赫兹时域光谱的金属表面粗糙度检测方法 |
| CN106226836A (zh) * | 2016-08-29 | 2016-12-14 | 北京农业信息技术研究中心 | 基于太赫兹技术的畜禽体内芯片获取装置及方法 |
| CN106769995A (zh) | 2017-01-25 | 2017-05-31 | 长春理工大学 | 原型离线编程机器人太赫兹时域光谱成像装置及方法 |
-
2018
- 2018-03-21 US US15/927,591 patent/US10976244B2/en active Active
- 2018-12-31 SG SG10201811843Q patent/SG10201811843QA/en unknown
-
2019
- 2019-01-22 CN CN201910056143.7A patent/CN110296954A/zh active Pending
- 2019-03-13 JP JP2019045699A patent/JP7432991B2/ja active Active
- 2019-03-21 EP EP19164481.4A patent/EP3543683B1/fr active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20190293552A1 (en) | 2019-09-26 |
| JP2019194570A (ja) | 2019-11-07 |
| EP3543683A1 (fr) | 2019-09-25 |
| US10976244B2 (en) | 2021-04-13 |
| CN110296954A (zh) | 2019-10-01 |
| EP3543683B1 (fr) | 2024-05-01 |
| JP7432991B2 (ja) | 2024-02-19 |
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