SG10201701848RA - Quartz crystal microbalance assembly for ald systems - Google Patents

Quartz crystal microbalance assembly for ald systems

Info

Publication number
SG10201701848RA
SG10201701848RA SG10201701848RA SG10201701848RA SG10201701848RA SG 10201701848R A SG10201701848R A SG 10201701848RA SG 10201701848R A SG10201701848R A SG 10201701848RA SG 10201701848R A SG10201701848R A SG 10201701848RA SG 10201701848R A SG10201701848R A SG 10201701848RA
Authority
SG
Singapore
Prior art keywords
quartz crystal
crystal microbalance
ald systems
microbalance assembly
assembly
Prior art date
Application number
SG10201701848RA
Other languages
English (en)
Inventor
Lecordier Laurent
Ruffo Michael
Original Assignee
Ultratech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ultratech Inc filed Critical Ultratech Inc
Publication of SG10201701848RA publication Critical patent/SG10201701848RA/en

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523—Pulsed gas flow or change of composition over time
    • C23C16/45525—Atomic layer deposition [ALD]
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/52—Controlling or regulating the coating process
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523—Pulsed gas flow or change of composition over time
    • C23C16/45525—Atomic layer deposition [ALD]
    • C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G3/00—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances
    • G01G3/12—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances wherein the weighing element is in the form of a solid body stressed by pressure or tension during weighing
    • G01G3/16—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances wherein the weighing element is in the form of a solid body stressed by pressure or tension during weighing measuring variations of frequency of oscillations of the body
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02—Analysing fluids
    • G01N29/022—Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N5/00—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Chemical Vapour Deposition (AREA)
SG10201701848RA 2016-03-08 2017-03-08 Quartz crystal microbalance assembly for ald systems SG10201701848RA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201662304968P 2016-03-08 2016-03-08

Publications (1)

Publication Number Publication Date
SG10201701848RA true SG10201701848RA (en) 2017-10-30

Family

ID=59700439

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201701848RA SG10201701848RA (en) 2016-03-08 2017-03-08 Quartz crystal microbalance assembly for ald systems

Country Status (8)

Country Link
US (1) US20170260629A1 (ja)
JP (1) JP2017161523A (ja)
KR (1) KR20170104946A (ja)
CN (1) CN107164743A (ja)
DE (1) DE102017202960A1 (ja)
FI (1) FI20175201A (ja)
SG (1) SG10201701848RA (ja)
TW (1) TWI626330B (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD743358S1 (en) * 2013-09-03 2015-11-17 Abb S.P.A. Cabinet for electrical switchboards
CN107917955B (zh) * 2017-12-07 2019-12-03 江苏大学 新型光辅助石英晶体微天平及其检测方法
US11551905B2 (en) * 2018-03-19 2023-01-10 Intel Corporation Resonant process monitor
CN108982277B (zh) * 2018-06-20 2020-05-19 华中科技大学 一种石英晶体微天平湿度传感器的制备方法及产品
DE102022128091B4 (de) * 2022-10-25 2024-06-06 Technische Universität Dresden, Körperschaft des öffentlichen Rechts Wafer-Chuck, Träger und Verfahren

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2748246B2 (ja) * 1995-11-14 1998-05-06 デベロップメント センター フォー バイオテクノロジー カートリッジ状の圧電センサチップ
TW403791B (en) * 1997-06-02 2000-09-01 Applied Materials Inc Quartz crystal microbalance for measurement of CVD exhaust deposits
CN101638765A (zh) * 2000-11-29 2010-02-03 萨莫希雷梅克斯公司 电阻加热器及其应用
US7150789B2 (en) 2002-07-29 2006-12-19 Micron Technology, Inc. Atomic layer deposition methods
EP1771598B1 (en) 2004-06-28 2009-09-30 Cambridge Nanotech Inc. Atomic layer deposition (ald) system and method
JP2006066593A (ja) * 2004-08-26 2006-03-09 Hitachi Kokusai Electric Inc 基板処理装置
GB0708346D0 (en) * 2007-04-30 2007-06-06 Attana Ab Sensor
JP2010206081A (ja) * 2009-03-05 2010-09-16 Tokyo Electron Ltd 被加熱体の冷却方法、冷却システム及びその冷却システムを備えた基板処理装置
US9856563B2 (en) * 2012-08-22 2018-01-02 Uchicago Argonne, Llc Micro-balance sensor integrated with atomic layer deposition chamber
US9506895B2 (en) * 2013-05-17 2016-11-29 Inficon, Inc. Combined crystal retainer and contact system for deposition monitor sensors
TWI588286B (zh) 2013-11-26 2017-06-21 烏翠泰克股份有限公司 經改良的電漿強化原子層沉積方法、周期及裝置

Also Published As

Publication number Publication date
TW201800604A (zh) 2018-01-01
KR20170104946A (ko) 2017-09-18
JP2017161523A (ja) 2017-09-14
CN107164743A (zh) 2017-09-15
DE102017202960A1 (de) 2017-09-14
TWI626330B (zh) 2018-06-11
US20170260629A1 (en) 2017-09-14
FI20175201A (fi) 2017-09-09

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