SG10201600983PA - A test system - Google Patents

A test system

Info

Publication number
SG10201600983PA
SG10201600983PA SG10201600983PA SG10201600983PA SG10201600983PA SG 10201600983P A SG10201600983P A SG 10201600983PA SG 10201600983P A SG10201600983P A SG 10201600983PA SG 10201600983P A SG10201600983P A SG 10201600983PA SG 10201600983P A SG10201600983P A SG 10201600983PA
Authority
SG
Singapore
Prior art keywords
test system
test
Prior art date
Application number
SG10201600983PA
Other languages
English (en)
Inventor
Bryan Edward Cole
Original Assignee
Teraview Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teraview Ltd filed Critical Teraview Ltd
Publication of SG10201600983PA publication Critical patent/SG10201600983PA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31717—Interconnect testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31723—Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
SG10201600983PA 2011-02-11 2012-02-13 A test system SG10201600983PA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1102507.9A GB2488515B (en) 2011-02-11 2011-02-11 A test system

Publications (1)

Publication Number Publication Date
SG10201600983PA true SG10201600983PA (en) 2016-03-30

Family

ID=43859350

Family Applications (3)

Application Number Title Priority Date Filing Date
SG2013060843A SG192286A1 (en) 2011-02-11 2012-02-13 Reflectometer test device for integrated circuits
SG10201600983PA SG10201600983PA (en) 2011-02-11 2012-02-13 A test system
SG10201913235WA SG10201913235WA (en) 2011-02-11 2012-02-13 A test system

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SG2013060843A SG192286A1 (en) 2011-02-11 2012-02-13 Reflectometer test device for integrated circuits

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG10201913235WA SG10201913235WA (en) 2011-02-11 2012-02-13 A test system

Country Status (9)

Country Link
US (4) US10006960B2 (ko)
EP (2) EP2673650B1 (ko)
JP (3) JP6253988B2 (ko)
KR (4) KR102116786B1 (ko)
CN (1) CN103635819B (ko)
GB (2) GB2488515B (ko)
SG (3) SG192286A1 (ko)
TW (1) TWI567398B (ko)
WO (1) WO2012107782A2 (ko)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9059803B2 (en) * 2012-09-28 2015-06-16 Intel Corporation Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths
US9154972B2 (en) 2013-06-12 2015-10-06 Apple Inc. Methods and apparatus for testing electronic devices with antenna arrays
DE102013020216A1 (de) 2013-12-12 2015-07-02 Christopher Matheisen Auslegermikrostrukturbauelement zur optischen Erzeugung von elekromagnetischen Signalen im Terahertzfrequenzbereich
US9952297B2 (en) * 2014-05-08 2018-04-24 Auburn University Parallel plate transmission line for broadband nuclear magnetic resonance imaging
CN104614661A (zh) * 2015-01-16 2015-05-13 华东师范大学 电路雷达装置
CN104931906B (zh) * 2015-05-11 2017-12-29 中国船舶重工集团公司第七0九研究所 集成电路测试系统的数字通道的传输延迟校准方法及系统
US10082534B2 (en) * 2015-06-17 2018-09-25 Intel IP Corporation Directional pulse injection into a microelectronic system for electrostatic test
JP6139620B2 (ja) 2015-09-14 2017-05-31 株式会社アドバンテスト プローブ
US9784555B2 (en) * 2015-11-25 2017-10-10 Teradyne, Inc. Determining electrical path length
GB2545496B (en) * 2015-12-18 2020-06-03 Teraview Ltd A Test System
US10185020B1 (en) * 2015-12-22 2019-01-22 Keysight Technologies, Inc. Method of compensating loss and dispersion of transmission line for time domain reflectometry
GB2546794B (en) * 2016-01-29 2020-01-08 Teraview Ltd A transmission line
WO2018037013A1 (en) * 2016-08-24 2018-03-01 Inventio Ag Method and testing device for determining a state of a suspension traction means of an elevator system
CN106353634A (zh) * 2016-10-17 2017-01-25 深圳市太赫兹科技创新研究院 太赫兹时域反射系统
RU2660222C1 (ru) * 2017-02-13 2018-07-05 Федеральное государственное бюджетное образовательное учреждение высшего образования "Санкт-Петербургский государственный университет телекоммуникаций им. проф. М.А. Бонч-Бруевича" Способ определения расстояния до неоднородности или повреждения двухпроводной линии по ее рефлектограмме
CN109425817A (zh) * 2017-08-22 2019-03-05 鸿富锦精密工业(武汉)有限公司 信号测试电路
US10910786B2 (en) * 2018-07-23 2021-02-02 University Of Maryland, College Park Laser cavity optical alignment
KR102625253B1 (ko) 2018-10-26 2024-01-16 삼성전자주식회사 복수 개의 도전성 엘리먼트들을 전기적으로 연결할 수 있는 광 도전성 부재를 포함하는 광 도전성 소자를 가지는 전자 장치
WO2021112568A1 (ko) * 2019-12-03 2021-06-10 삼성전자 주식회사 광학 제어 스위치 및 이를 포함하는 전자 장치
TWI724909B (zh) * 2020-05-22 2021-04-11 紘康科技股份有限公司 具有校正功能之交流阻抗測量電路
CN113092825B (zh) * 2021-03-05 2022-12-30 中山大学 原子力显微镜系统及其电流检测方法
TWI777703B (zh) * 2021-03-18 2022-09-11 立錡科技股份有限公司 異物偵測方法及具有異物偵測功能之電源端
TWI832430B (zh) * 2022-09-16 2024-02-11 英業達股份有限公司 靜電放電量測裝置及靜電放電量測方法

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3804989A (en) 1972-07-31 1974-04-16 Bell Telephone Labor Inc Time division communication system
JPS5922459B2 (ja) 1977-03-17 1984-05-26 リコー時計株式会社 電源装置
US4482863A (en) * 1981-08-14 1984-11-13 At&T Bell Laboratories Apparatus and method for measuring electronic response of high speed devices and materials
US4681449A (en) * 1984-09-07 1987-07-21 Stanford University High speed testing of electronic circuits by electro-optic sampling
DE3502287A1 (de) * 1985-01-24 1986-07-24 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur herstellung eines rotationssymmetrischen gehaeuses, insbesondere eines ventilgehaeuses
US4745361A (en) * 1987-03-03 1988-05-17 University Of Rochester Electro-optic measurement (network analysis) system
US4896109A (en) * 1987-12-07 1990-01-23 The United States Of America As Represented By The Department Of Energy Photoconductive circuit element reflectometer
US5142224A (en) * 1988-12-13 1992-08-25 Comsat Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals
JP2839523B2 (ja) 1989-01-19 1998-12-16 株式会社東芝 整合回路形成用金属膜付き誘電体基板
JPH04104531A (ja) * 1990-08-23 1992-04-07 Nec Corp 分散等化器
US5258648A (en) 1991-06-27 1993-11-02 Motorola, Inc. Composite flip chip semiconductor device with an interposer having test contacts formed along its periphery
US5347241A (en) 1993-02-08 1994-09-13 Hughes Aircraft Company Dual junction back-to-back microstrip four-port circulators
JPH08233879A (ja) * 1995-02-23 1996-09-13 Advantest Corp 反射点測定用短パルス発生装置、反射点測定用サンプリング装置及びこれらの装置を用いた反射点測定装置
US5767955A (en) * 1995-02-23 1998-06-16 Advantest Corporation Short-width pulse generating apparatus for measurement of reflection point, sampling apparatus for measurement of reflection point and reflection point measuring apparatus
US6064054A (en) * 1995-08-21 2000-05-16 Diasense, Inc. Synchronous detection for photoconductive detectors
JP3528363B2 (ja) * 1995-10-13 2004-05-17 ヤマハ株式会社 試験用半導体装置の評価方法
US5751149A (en) * 1995-12-08 1998-05-12 Tempo Research Corporation Method and apparatus for high frequency time domain reflectometry
JP2000097846A (ja) 1998-09-21 2000-04-07 Olympus Optical Co Ltd 光走査プローブ装置
US6867598B2 (en) * 2000-06-16 2005-03-15 T-Mobile Deutschland Gmbh Method for measuring fault locations in high frequency cables and lines
US6501288B1 (en) * 2000-09-28 2002-12-31 Schlumberger Technologies, Inc. On-chip optically triggered latch for IC time measurements
US6714021B2 (en) * 2001-01-11 2004-03-30 Sun Microsystems, Inc. Integrated time domain reflectometry (TDR) tester
US7742172B2 (en) * 2002-09-18 2010-06-22 Teraview Limited Apparatus for varying the path length of a beam of radiation
JP2005094314A (ja) 2003-09-17 2005-04-07 Tdk Corp 伝送線路
KR100591309B1 (ko) 2003-12-30 2006-06-19 엘지전자 주식회사 마그네트론용 고압 콘덴서
US7507036B2 (en) * 2004-03-25 2009-03-24 Avago Technologies Fiber Ip (Singapore) Pte. Ltd. Connection arrangement for optical communication systems
JP4304498B2 (ja) 2004-10-08 2009-07-29 日本電信電話株式会社 半導体装置及び半導体モジュール
FR2885415B1 (fr) * 2005-05-03 2007-09-07 Thales Sa Mesure dynamique de l'impedance de composants hyperfrequences
US20060291114A1 (en) * 2005-06-27 2006-12-28 Teo Chee K Electrostatic discharge protection circuit and method
US7132845B1 (en) 2005-08-19 2006-11-07 Texas Instruments Incorporated FA tool using conductor model
CN1863244B (zh) 2005-10-28 2013-10-02 华为技术有限公司 传输线路的时域反射测试方法及装置
IL176000A (en) * 2006-05-30 2013-01-31 Kilolambda Tech Ltd Optically driven antenna
US7280190B1 (en) 2006-06-21 2007-10-09 Intel Corporation Electro-optic time domain reflectometry
JP4958278B2 (ja) 2007-03-13 2012-06-20 キヤノン株式会社 検査装置
DE102007062562B4 (de) * 2007-12-22 2009-10-01 Johann Wolfgang Goethe-Universität Frankfurt am Main Monolithisch integrierter Antennen- und Empfängerschaltkreis für die Erfassung von Terahertz-Wellen
JP2009216565A (ja) 2008-03-11 2009-09-24 Toshiba Corp 半導体集積回路
TWM390455U (en) * 2010-04-15 2010-10-11 Emerging Display Tech Corp Electrode layout detector for a liquid crystal display
US8901205B2 (en) * 2011-09-06 2014-12-02 Chung-Shan Institute of Science and Technology, Armaments, Bureau, Ministry of National Defense Electromagnetic wave-absorbing material

Also Published As

Publication number Publication date
SG10201913235WA (en) 2020-02-27
EP2673650A2 (en) 2013-12-18
JP2014506672A (ja) 2014-03-17
KR102116786B1 (ko) 2020-06-02
KR20190062588A (ko) 2019-06-05
KR20190107754A (ko) 2019-09-20
EP2977774A1 (en) 2016-01-27
JP2019070672A (ja) 2019-05-09
US11726136B2 (en) 2023-08-15
GB2488515A (en) 2012-09-05
US11169202B2 (en) 2021-11-09
JP6253988B2 (ja) 2017-12-27
JP6480980B2 (ja) 2019-03-13
KR102060932B1 (ko) 2020-02-11
WO2012107782A2 (en) 2012-08-16
SG192286A1 (en) 2013-09-30
KR20190011818A (ko) 2019-02-07
GB2502493A (en) 2013-11-27
KR20140041449A (ko) 2014-04-04
KR102060934B1 (ko) 2020-02-11
TW201245730A (en) 2012-11-16
US10006960B2 (en) 2018-06-26
US20140021963A1 (en) 2014-01-23
GB201316171D0 (en) 2013-10-23
CN103635819B (zh) 2016-12-21
EP2673650B1 (en) 2015-07-08
WO2012107782A3 (en) 2013-06-13
US20220026482A1 (en) 2022-01-27
GB2488515B (en) 2015-05-20
GB201102507D0 (en) 2011-03-30
JP2017138339A (ja) 2017-08-10
JP6861745B2 (ja) 2021-04-21
TWI567398B (zh) 2017-01-21
US20230324452A1 (en) 2023-10-12
EP2977774B1 (en) 2020-05-27
CN103635819A (zh) 2014-03-12
US20180275190A1 (en) 2018-09-27

Similar Documents

Publication Publication Date Title
GB2488515B (en) A test system
EP2684130A4 (en) GENERATION OF A TEST DATA SET
EP2751747A4 (en) REGAL MONITORING SYSTEM
GB201104686D0 (en) A device
HK1198734A1 (en) A footgauge
EP2719500A4 (en) PART PROCESSING SYSTEM
EP2773011A4 (en) POWER STORAGE SYSTEM
GB2491044B (en) Ablutionary system
EP2755734A4 (en) DEVICE FOR DEAERATION
EP2741811A4 (en) SYSTEM FOR THE TREATMENT OF SYMPTOMS
EP2700820A4 (en) ENGINE ATTACHMENT SYSTEM
GB2501846B (en) Case for a device
GB2489943B (en) A Device
GB2508750B (en) A monitoring system
GB201101680D0 (en) A system
GB2489685B (en) A Display System
GB2491828B (en) A device
GB201106152D0 (en) A monitoring system
PT2791023E (pt) Dispositivo de fecho de garrafa
GB201109708D0 (en) Compliance system
GB201118879D0 (en) A securing device
GB201215733D0 (en) A system
AU339206S (en) A block
GB201119847D0 (en) Well testing
GB201203416D0 (en) A system