FR2885415B1 - Mesure dynamique de l'impedance de composants hyperfrequences - Google Patents

Mesure dynamique de l'impedance de composants hyperfrequences

Info

Publication number
FR2885415B1
FR2885415B1 FR0504497A FR0504497A FR2885415B1 FR 2885415 B1 FR2885415 B1 FR 2885415B1 FR 0504497 A FR0504497 A FR 0504497A FR 0504497 A FR0504497 A FR 0504497A FR 2885415 B1 FR2885415 B1 FR 2885415B1
Authority
FR
France
Prior art keywords
hyperfrequency
impedance
components
dynamic measurement
dynamic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0504497A
Other languages
English (en)
Other versions
FR2885415A1 (fr
Inventor
Clement Tolant
Michel Stanislawiak
Philippe Eudeline
Jean Marc Coupat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thales SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thales SA filed Critical Thales SA
Priority to FR0504497A priority Critical patent/FR2885415B1/fr
Priority to PCT/EP2006/062023 priority patent/WO2006117388A1/fr
Priority to JP2008509448A priority patent/JP2008541031A/ja
Priority to DE112006001115T priority patent/DE112006001115T5/de
Publication of FR2885415A1 publication Critical patent/FR2885415A1/fr
Application granted granted Critical
Publication of FR2885415B1 publication Critical patent/FR2885415B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
FR0504497A 2005-05-03 2005-05-03 Mesure dynamique de l'impedance de composants hyperfrequences Expired - Fee Related FR2885415B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR0504497A FR2885415B1 (fr) 2005-05-03 2005-05-03 Mesure dynamique de l'impedance de composants hyperfrequences
PCT/EP2006/062023 WO2006117388A1 (fr) 2005-05-03 2006-05-03 Mesure dynamique de l'impedance de composants hyperfrequence
JP2008509448A JP2008541031A (ja) 2005-05-03 2006-05-03 マイクロ波構成部品のインピーダンスの動的測定
DE112006001115T DE112006001115T5 (de) 2005-05-03 2006-05-03 Dynamische Messung der Impedanz von Ultrahochfrequenz-Komponenten

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0504497A FR2885415B1 (fr) 2005-05-03 2005-05-03 Mesure dynamique de l'impedance de composants hyperfrequences

Publications (2)

Publication Number Publication Date
FR2885415A1 FR2885415A1 (fr) 2006-11-10
FR2885415B1 true FR2885415B1 (fr) 2007-09-07

Family

ID=35502702

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0504497A Expired - Fee Related FR2885415B1 (fr) 2005-05-03 2005-05-03 Mesure dynamique de l'impedance de composants hyperfrequences

Country Status (4)

Country Link
JP (1) JP2008541031A (fr)
DE (1) DE112006001115T5 (fr)
FR (1) FR2885415B1 (fr)
WO (1) WO2006117388A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2466028A (en) * 2008-12-08 2010-06-09 Univ Cardiff High frequency measurement system
GB2488515B (en) * 2011-02-11 2015-05-20 Teraview Ltd A test system
DE102013004227A1 (de) * 2013-03-11 2014-09-11 Giesecke & Devrient Gmbh Spuleninduktivität
CN106154044B (zh) * 2016-06-18 2017-05-17 温州大学 一种功率二极管正向动态电阻测试装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0486567A (ja) * 1990-07-30 1992-03-19 Murata Mfg Co Ltd 高周波測定装置
ATE321272T1 (de) * 2000-11-21 2006-04-15 Datenkompensierende leistungsmessung
EP1296151B1 (fr) * 2001-09-24 2006-11-15 Agilent Technologies, Inc. (a Delaware corporation) Collecte de données de signaux HF en entrée et en sortie et de polarisation
GB2382662B (en) * 2001-11-29 2003-12-10 Univ Cardiff High frequency circuit analyzer

Also Published As

Publication number Publication date
DE112006001115T5 (de) 2008-03-27
WO2006117388A1 (fr) 2006-11-09
FR2885415A1 (fr) 2006-11-10
JP2008541031A (ja) 2008-11-20

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20100129