SG10201407598VA - Substrate cleaning apparatus and substrate processing apparatus - Google Patents
Substrate cleaning apparatus and substrate processing apparatusInfo
- Publication number
- SG10201407598VA SG10201407598VA SG10201407598VA SG10201407598VA SG10201407598VA SG 10201407598V A SG10201407598V A SG 10201407598VA SG 10201407598V A SG10201407598V A SG 10201407598VA SG 10201407598V A SG10201407598V A SG 10201407598VA SG 10201407598V A SG10201407598V A SG 10201407598VA
- Authority
- SG
- Singapore
- Prior art keywords
- substrate
- processing apparatus
- substrate processing
- cleaning apparatus
- substrate cleaning
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68792—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013239041A JP2015099852A (en) | 2013-11-19 | 2013-11-19 | Substrate cleaning device and substrate processing device |
JP2013239040A JP6321353B2 (en) | 2013-11-19 | 2013-11-19 | Substrate cleaning apparatus and substrate processing apparatus |
JP2013241960A JP6282850B2 (en) | 2013-11-22 | 2013-11-22 | Substrate cleaning apparatus and substrate processing apparatus |
JP2013242716A JP6339351B2 (en) | 2013-11-25 | 2013-11-25 | Substrate cleaning apparatus and substrate processing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201407598VA true SG10201407598VA (en) | 2015-06-29 |
Family
ID=53181612
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201407598VA SG10201407598VA (en) | 2013-11-19 | 2014-11-14 | Substrate cleaning apparatus and substrate processing apparatus |
Country Status (2)
Country | Link |
---|---|
US (1) | US10090189B2 (en) |
SG (1) | SG10201407598VA (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101641948B1 (en) * | 2015-01-28 | 2016-07-25 | 세메스 주식회사 | Substrate treating apparatus and chemical nozzle |
SG10201601095UA (en) * | 2015-02-18 | 2016-09-29 | Ebara Corp | Substrate cleaning apparatus, substrate cleaning method, and substrate processing apparatus |
US11676827B2 (en) | 2016-03-08 | 2023-06-13 | Ebara Corporation | Substrate cleaning apparatus, substrate cleaning method, substrate processing apparatus, and substrate drying apparatus |
KR20190086859A (en) | 2018-01-15 | 2019-07-24 | 삼성전자주식회사 | Substrate Support Mechanism And Substrate Cleaning Device Including The Same |
CN112543991A (en) | 2018-08-06 | 2021-03-23 | 应用材料公司 | Non-contact cleaning module |
US20200306931A1 (en) * | 2019-03-25 | 2020-10-01 | Applied Materials, Inc. | Methods and apparatus for removing abrasive particles |
JP2021048336A (en) * | 2019-09-20 | 2021-03-25 | 三菱電機株式会社 | Processing liquid generating method, processing liquid generating mechanism, semiconductor manufacturing apparatus and semiconductor manufacturing method |
CN114823430B (en) * | 2022-06-28 | 2022-10-18 | 江苏芯梦半导体设备有限公司 | Equipment and method for cleaning wafer |
CN114823431B (en) * | 2022-06-28 | 2022-10-18 | 江苏芯梦半导体设备有限公司 | Spraying device for cleaning wafer |
Family Cites Families (36)
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JPS506362B1 (en) | 1970-07-17 | 1975-03-13 | ||
JPS58130532A (en) | 1983-01-10 | 1983-08-04 | Fujitsu Ltd | Spin coating method |
JPS60261582A (en) | 1984-06-08 | 1985-12-24 | 日本インター株式会社 | Ultrasonic washer |
JPS61192379A (en) | 1985-02-21 | 1986-08-26 | 島田理化工業株式会社 | Ultrasonic washer |
JP3504023B2 (en) | 1995-05-26 | 2004-03-08 | 株式会社ルネサステクノロジ | Cleaning device and cleaning method |
JP3315611B2 (en) * | 1996-12-02 | 2002-08-19 | 三菱電機株式会社 | Two-fluid jet nozzle for cleaning, cleaning device, and semiconductor device |
JP3776214B2 (en) | 1997-08-18 | 2006-05-17 | 株式会社荏原製作所 | Workpiece chuck wheel mechanism, polishing device and cleaning device |
JP3890787B2 (en) | 1998-11-30 | 2007-03-07 | いすゞ自動車株式会社 | Cleaning method and apparatus |
JP4481394B2 (en) | 1999-08-13 | 2010-06-16 | 株式会社荏原製作所 | Semiconductor substrate cleaning apparatus and cleaning method thereof |
JP2003017452A (en) | 2001-07-02 | 2003-01-17 | Ebara Corp | Method and apparatus for treating substrate |
JP4868667B2 (en) | 2001-07-18 | 2012-02-01 | 株式会社東芝 | Ultrasonic cleaning unit, ultrasonic cleaning device, ultrasonic cleaning method, method for manufacturing semiconductor device, and method for manufacturing liquid crystal display device |
JP2004096023A (en) | 2002-09-04 | 2004-03-25 | Renesas Technology Corp | Object cleaning method |
JP2005093873A (en) | 2003-09-19 | 2005-04-07 | Ebara Corp | Substrate treating device |
JP2005012197A (en) | 2003-05-26 | 2005-01-13 | Sumitomo Heavy Ind Ltd | Method and apparatus of aerosol cleaning |
JP4346380B2 (en) | 2003-08-28 | 2009-10-21 | 株式会社いけうち | Three-fluid nozzle and waste treatment apparatus equipped with the three-fluid nozzle |
TWI251857B (en) * | 2004-03-09 | 2006-03-21 | Tokyo Electron Ltd | Two-fluid nozzle for cleaning substrate and substrate cleaning device |
JP4365254B2 (en) | 2004-04-05 | 2009-11-18 | 三菱電機株式会社 | Cleaning method |
TWI267405B (en) | 2004-07-20 | 2006-12-01 | Sez Ag | Fluid discharging device |
JP2007027241A (en) | 2005-07-13 | 2007-02-01 | Nippo Ltd | Ultrasonic washing apparatus |
JP2007027270A (en) | 2005-07-13 | 2007-02-01 | Sony Corp | Cleaning apparatus and cleaning method |
JP2007073610A (en) | 2005-09-05 | 2007-03-22 | Seiko Epson Corp | Method and device for cleaning component |
JP4763575B2 (en) | 2006-01-26 | 2011-08-31 | 大日本スクリーン製造株式会社 | Substrate processing apparatus and substrate processing method |
TW200739710A (en) | 2006-04-11 | 2007-10-16 | Dainippon Screen Mfg | Substrate processing method and substrate processing apparatus |
JP2008108829A (en) | 2006-10-24 | 2008-05-08 | Dainippon Screen Mfg Co Ltd | Two-fluid nozzle and substrate processing apparatus employing the same |
JP2008153322A (en) | 2006-12-15 | 2008-07-03 | Dainippon Screen Mfg Co Ltd | Two-fluid nozzle, substrate processor, and method for processing substrates |
JP2009088078A (en) | 2007-09-28 | 2009-04-23 | Dainippon Screen Mfg Co Ltd | Two-fluid nozzle, and substrate cleaning device and method using the same |
JP2011507236A (en) | 2007-12-07 | 2011-03-03 | フォンタナ・テクノロジー | Methods and compositions for cleaning wafers |
JP5404093B2 (en) | 2008-03-31 | 2014-01-29 | 株式会社東芝 | Semiconductor wafer cleaning method |
JP5294944B2 (en) | 2009-03-31 | 2013-09-18 | 株式会社荏原製作所 | Substrate cleaning method |
JP5449953B2 (en) | 2009-09-29 | 2014-03-19 | 大日本スクリーン製造株式会社 | Substrate processing apparatus and substrate processing method |
JP5470306B2 (en) | 2011-03-09 | 2014-04-16 | 東京エレクトロン株式会社 | Two-fluid nozzle, substrate liquid processing apparatus, substrate liquid processing method, and computer-readable recording medium recording a substrate liquid processing program |
JP5837788B2 (en) | 2011-09-29 | 2015-12-24 | 株式会社Screenホールディングス | Nozzle, substrate processing apparatus, and substrate processing method |
JP2013089797A (en) | 2011-10-19 | 2013-05-13 | Ebara Corp | Substrate cleaning method and substrate cleaning device |
JP5866227B2 (en) | 2012-02-23 | 2016-02-17 | 株式会社荏原製作所 | Substrate cleaning method |
CN103295936B (en) * | 2012-02-29 | 2016-01-13 | 斯克林集团公司 | Substrate board treatment and substrate processing method using same |
JP2013214737A (en) | 2012-03-09 | 2013-10-17 | Ebara Corp | Substrate processing method and substrate processing apparatus |
-
2014
- 2014-11-14 SG SG10201407598VA patent/SG10201407598VA/en unknown
- 2014-11-14 US US14/541,488 patent/US10090189B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US10090189B2 (en) | 2018-10-02 |
US20150144164A1 (en) | 2015-05-28 |
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