SE9002665L - Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets - Google Patents

Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets

Info

Publication number
SE9002665L
SE9002665L SE9002665A SE9002665A SE9002665L SE 9002665 L SE9002665 L SE 9002665L SE 9002665 A SE9002665 A SE 9002665A SE 9002665 A SE9002665 A SE 9002665A SE 9002665 L SE9002665 L SE 9002665L
Authority
SE
Sweden
Prior art keywords
monitor
supply voltage
integrated circuit
monitoring
voltage local
Prior art date
Application number
SE9002665A
Other languages
Unknown language ( )
English (en)
Other versions
SE9002665D0 (sv
SE466875B (sv
Inventor
T L Haulin
Original Assignee
Ellemtel Utvecklings Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ellemtel Utvecklings Ab filed Critical Ellemtel Utvecklings Ab
Priority to SE9002665A priority Critical patent/SE466875B/sv
Publication of SE9002665D0 publication Critical patent/SE9002665D0/sv
Priority to EP91201949A priority patent/EP0471399B1/en
Priority to DE1991609965 priority patent/DE69109965T2/de
Publication of SE9002665L publication Critical patent/SE9002665L/sv
Publication of SE466875B publication Critical patent/SE466875B/sv
Priority to US08/185,145 priority patent/US5498972A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318575—Power distribution; Power saving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
SE9002665A 1990-08-15 1990-08-15 Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets SE466875B (sv)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SE9002665A SE466875B (sv) 1990-08-15 1990-08-15 Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets
EP91201949A EP0471399B1 (en) 1990-08-15 1991-07-25 Device for monitoring the supply voltage on integrated circuits
DE1991609965 DE69109965T2 (de) 1990-08-15 1991-07-25 Vorrichtung zur Überwachung der Speisespannung von integrierten Kreisen.
US08/185,145 US5498972A (en) 1990-08-15 1994-01-24 Device for monitoring the supply voltage on integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9002665A SE466875B (sv) 1990-08-15 1990-08-15 Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets

Publications (3)

Publication Number Publication Date
SE9002665D0 SE9002665D0 (sv) 1990-08-15
SE9002665L true SE9002665L (sv) 1992-02-16
SE466875B SE466875B (sv) 1992-04-13

Family

ID=20380165

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9002665A SE466875B (sv) 1990-08-15 1990-08-15 Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets

Country Status (3)

Country Link
EP (1) EP0471399B1 (sv)
DE (1) DE69109965T2 (sv)
SE (1) SE466875B (sv)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3983807B2 (ja) * 1995-10-20 2007-09-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 試験可能回路及び試験方法
FR3020720B1 (fr) * 2014-04-30 2017-09-15 Inside Secure Interface de communication avec adaptation automatique au niveau du signal entrant

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8502476A (nl) * 1985-09-11 1987-04-01 Philips Nv Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers.
US4872169A (en) * 1987-03-06 1989-10-03 Texas Instruments Incorporated Hierarchical scan selection
US4860288A (en) * 1987-10-23 1989-08-22 Control Data Corporation Clock monitor for use with VLSI chips
EP0628831B1 (en) * 1988-09-07 1998-03-18 Texas Instruments Incorporated Bidirectional boundary scan test cell
US4875003A (en) * 1989-02-21 1989-10-17 Silicon Connections Corporation Non-contact I/O signal pad scan testing of VLSI circuits

Also Published As

Publication number Publication date
EP0471399A1 (en) 1992-02-19
SE9002665D0 (sv) 1990-08-15
DE69109965D1 (de) 1995-06-29
EP0471399B1 (en) 1995-05-24
SE466875B (sv) 1992-04-13
DE69109965T2 (de) 1995-09-21

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