SE8704468D0 - Forfarande for tillverkning och provning av kretskort samt apparat for utforande av provningen - Google Patents

Forfarande for tillverkning och provning av kretskort samt apparat for utforande av provningen

Info

Publication number
SE8704468D0
SE8704468D0 SE8704468A SE8704468A SE8704468D0 SE 8704468 D0 SE8704468 D0 SE 8704468D0 SE 8704468 A SE8704468 A SE 8704468A SE 8704468 A SE8704468 A SE 8704468A SE 8704468 D0 SE8704468 D0 SE 8704468D0
Authority
SE
Sweden
Prior art keywords
holder
holders
contact members
circuit card
guide rods
Prior art date
Application number
SE8704468A
Other languages
English (en)
Other versions
SE458005B (sv
Inventor
Reinhold Strandberg
Original Assignee
Reinhold Strandberg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Reinhold Strandberg filed Critical Reinhold Strandberg
Priority to SE8704468A priority Critical patent/SE458005B/sv
Publication of SE8704468D0 publication Critical patent/SE8704468D0/sv
Priority to PCT/SE1988/000610 priority patent/WO1989005088A1/en
Publication of SE458005B publication Critical patent/SE458005B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
SE8704468A 1987-11-16 1987-11-16 Foerfarande foer provning av kretskort samt apparat foer utfoerande av provningen SE458005B (sv)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SE8704468A SE458005B (sv) 1987-11-16 1987-11-16 Foerfarande foer provning av kretskort samt apparat foer utfoerande av provningen
PCT/SE1988/000610 WO1989005088A1 (en) 1987-11-16 1988-11-15 A method for testing circuit cards and an apparatus for carrying out testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8704468A SE458005B (sv) 1987-11-16 1987-11-16 Foerfarande foer provning av kretskort samt apparat foer utfoerande av provningen

Publications (2)

Publication Number Publication Date
SE8704468D0 true SE8704468D0 (sv) 1987-11-16
SE458005B SE458005B (sv) 1989-02-13

Family

ID=20370229

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8704468A SE458005B (sv) 1987-11-16 1987-11-16 Foerfarande foer provning av kretskort samt apparat foer utfoerande av provningen

Country Status (2)

Country Link
SE (1) SE458005B (sv)
WO (1) WO1989005088A1 (sv)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3925505A1 (de) * 1989-04-05 1990-10-11 Siemens Ag Vorrichtung zum pruefen von leiterplatten
US5467020A (en) * 1994-03-29 1995-11-14 International Business Machines Corporation Testing fixture and method for circuit traces on a flexible substrate
DE4447814B4 (de) * 1994-05-20 2006-03-30 Luther & Maelzer Gmbh Verfahren zum Prüfen von elektrischen Leiterplatten unter Verwendung eines Prüfadapters mit Prüfstiften und Vorrichtung zur Durchführung des Verfahrens
SE504286C2 (sv) * 1994-06-17 1996-12-23 Reinhold Strandberg Adapter för användning vid en apparat för testning av kretskort
SE505383C2 (sv) * 1995-11-06 1997-08-18 Reinhold Strandberg Förfarande för tillverkning av kontaktplattor på mönsterkort samt adapterkort för användning vid en apparat för testning av med elektriska ledningsbanor försedda mönsterkort
JPH09289371A (ja) * 1996-04-22 1997-11-04 Sony Corp 手動式電子部品装着装置及び方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2243457C3 (de) * 1972-09-04 1978-09-14 Werner 7750 Konstanz Heilmann Vorrichtung zum Prüfen elektronischer Schaltungen
DE2344239B2 (de) * 1973-09-01 1977-11-03 Luther, Erich, 3050 Wunstorf; Maelzer, Fritz; Maelzer, Martin; 7910 Reutti Post Neu-Ulm; Türkkan, Tamer, 3011 Laatzen Kontaktvorrichtung zum anschliessen einer gedruckten schaltung an ein pruefgeraet
DE3038665C2 (de) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten
DE3311977A1 (de) * 1983-03-31 1984-10-04 Siemens AG, 1000 Berlin und 8000 München Anordnung zum elektrischen abtasten einer baugruppe
AT395485B (de) * 1985-01-22 1993-01-25 Feinmetall Gmbh Pruefadapter
AT391762B (de) * 1985-11-26 1990-11-26 Alcatel Austria Ag Vorrichtung zum pruefen von leiterplatten

Also Published As

Publication number Publication date
WO1989005088A1 (en) 1989-06-01
SE458005B (sv) 1989-02-13

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