SE8304114L - Sjelvtestande anordning for generering av tidsfordrojningar - Google Patents
Sjelvtestande anordning for generering av tidsfordrojningarInfo
- Publication number
- SE8304114L SE8304114L SE8304114A SE8304114A SE8304114L SE 8304114 L SE8304114 L SE 8304114L SE 8304114 A SE8304114 A SE 8304114A SE 8304114 A SE8304114 A SE 8304114A SE 8304114 L SE8304114 L SE 8304114L
- Authority
- SE
- Sweden
- Prior art keywords
- time delay
- self
- generating time
- standing device
- testing component
- Prior art date
Links
- 238000012544 monitoring process Methods 0.000 abstract 1
- 238000004886 process control Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/135—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/14—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of delay lines
-
- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C13/00—Arrangements for influencing the relationship between signals at input and output, e.g. differentiating, delaying
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing And Monitoring For Control Systems (AREA)
- Monitoring And Testing Of Nuclear Reactors (AREA)
- Tests Of Electronic Circuits (AREA)
- Pulse Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/402,323 US4519090A (en) | 1982-07-27 | 1982-07-27 | Testable time delay |
Publications (2)
Publication Number | Publication Date |
---|---|
SE8304114D0 SE8304114D0 (sv) | 1983-07-22 |
SE8304114L true SE8304114L (sv) | 1984-01-28 |
Family
ID=23591437
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE8304114A SE8304114L (sv) | 1982-07-27 | 1983-07-22 | Sjelvtestande anordning for generering av tidsfordrojningar |
Country Status (7)
Country | Link |
---|---|
US (1) | US4519090A (sv) |
JP (1) | JPS5963000A (sv) |
KR (1) | KR840005625A (sv) |
DE (1) | DE3325362C2 (sv) |
ES (1) | ES524449A0 (sv) |
IT (1) | IT1170168B (sv) |
SE (1) | SE8304114L (sv) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4849702A (en) * | 1983-08-01 | 1989-07-18 | Schlumberger Techologies, Inc. | Test period generator for automatic test equipment |
US4789835A (en) * | 1983-08-01 | 1988-12-06 | Fairchild Camera & Instrument Corporation | Control of signal timing apparatus in automatic test systems using minimal memory |
AU572593B2 (en) * | 1983-12-22 | 1988-05-12 | Alcatel N.V. | Signal recognition system |
US4757523A (en) * | 1984-08-02 | 1988-07-12 | Texas Instruments Incorporated | High speed testing of integrated circuit |
US4649537A (en) * | 1984-10-22 | 1987-03-10 | Westinghouse Electric Corp. | Random pattern lock and key fault detection scheme for microprocessor systems |
US4982412A (en) * | 1989-03-13 | 1991-01-01 | Moore Push-Pin Company | Apparatus and method for counting a plurality of similar articles |
DE4142775C2 (de) * | 1991-12-23 | 1994-10-06 | Telefunken Microelectron | Verfahren zum Überprüfen eines in einem Schaltkreis integrierten Zeitglieds |
US5497475A (en) * | 1993-02-05 | 1996-03-05 | National Semiconductor Corporation | Configurable integrated circuit having true and shadow EPROM registers |
US5473651A (en) * | 1994-12-28 | 1995-12-05 | At&T Corp. | Method and apparatus for testing large embedded counters |
US6889349B2 (en) * | 2001-08-22 | 2005-05-03 | Hewlett-Packard Development Company, L.P. | Digital event sampling circuit and method |
EP1748299B1 (de) * | 2005-07-29 | 2008-03-19 | Siemens Aktiengesellschaft | Elektronische Schaltung, System mit einer elektronischen Schaltung und Verfahren zum Testen einer elektronischen Schaltung |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3845282A (en) * | 1972-09-01 | 1974-10-29 | Kearney & Trecker Corp | Apparatus and method for unambiguous counter reading |
US3934131A (en) * | 1975-01-06 | 1976-01-20 | The Unites States Of America As Represented By The Secretary Of The Navy | Output controller for initiating delayed or conditional commands via a general purpose computer |
US4082218A (en) * | 1976-12-27 | 1978-04-04 | Burroughs Corporation | Potential failure detecting circuit having improved means for detecting transitions in short duration signals |
FR2390856A1 (fr) * | 1977-05-10 | 1978-12-08 | Lannionnais Electronique | Base de temps |
US4144448A (en) * | 1977-11-29 | 1979-03-13 | International Business Machines Corporation | Asynchronous validity checking system and method for monitoring clock signals on separate electrical conductors |
US4223213A (en) * | 1978-05-22 | 1980-09-16 | Mcneil Akron, Inc. | Apparatus for rapid data verification of a programmable timer |
US4336448A (en) * | 1980-04-18 | 1982-06-22 | General Motors Corporation | Binary counter and circuit for testing same |
US4373201A (en) * | 1980-11-28 | 1983-02-08 | Honeywell Inc. | Fail safe digital timer |
DE3126747C2 (de) * | 1981-07-01 | 1983-06-01 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Schaltungsanordnung zur Anpassung der Länge eintreffender Impulse |
US4392226A (en) * | 1981-09-28 | 1983-07-05 | Ncr Corporation | Multiple source clock encoded communications error detection circuit |
-
1982
- 1982-07-27 US US06/402,323 patent/US4519090A/en not_active Expired - Fee Related
-
1983
- 1983-07-13 IT IT22043/83A patent/IT1170168B/it active
- 1983-07-14 DE DE3325362A patent/DE3325362C2/de not_active Expired
- 1983-07-22 SE SE8304114A patent/SE8304114L/sv not_active Application Discontinuation
- 1983-07-26 ES ES524449A patent/ES524449A0/es active Granted
- 1983-07-27 JP JP58135985A patent/JPS5963000A/ja active Pending
- 1983-07-27 KR KR1019830003485A patent/KR840005625A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
ES8501586A1 (es) | 1984-12-01 |
SE8304114D0 (sv) | 1983-07-22 |
DE3325362A1 (de) | 1984-02-23 |
ES524449A0 (es) | 1984-12-01 |
DE3325362C2 (de) | 1985-04-18 |
JPS5963000A (ja) | 1984-04-10 |
US4519090A (en) | 1985-05-21 |
IT8322043A0 (it) | 1983-07-13 |
IT1170168B (it) | 1987-06-03 |
KR840005625A (ko) | 1984-11-14 |
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