SE7505028L - - Google Patents
Info
- Publication number
- SE7505028L SE7505028L SE7505028A SE7505028A SE7505028L SE 7505028 L SE7505028 L SE 7505028L SE 7505028 A SE7505028 A SE 7505028A SE 7505028 A SE7505028 A SE 7505028A SE 7505028 L SE7505028 L SE 7505028L
- Authority
- SE
- Sweden
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Textile Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US465510A US3920970A (en) | 1974-04-30 | 1974-04-30 | Laser scanner flaw detection system using baseline follower signal processing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| SE7505028L true SE7505028L (en:Method) | 1975-12-18 |
| SE423282B SE423282B (sv) | 1982-04-26 |
Family
ID=23848109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE7505028A SE423282B (sv) | 1974-04-30 | 1975-04-29 | Lasercanner-system for detektering av sprickor |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3920970A (en:Method) |
| JP (2) | JPS50147982A (en:Method) |
| CA (1) | CA1043883A (en:Method) |
| DE (1) | DE2519386A1 (en:Method) |
| FR (1) | FR2269714B1 (en:Method) |
| GB (1) | GB1512661A (en:Method) |
| NL (1) | NL7505021A (en:Method) |
| SE (1) | SE423282B (en:Method) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2636401C3 (de) * | 1976-08-11 | 1983-11-03 | Mannesmann AG, 4000 Düsseldorf | Verfahren zur automatischen Erkennung von Ultraschallanzeigen |
| US4202033A (en) * | 1977-12-27 | 1980-05-06 | Royco Instruments, Inc. | Apparatus and method utilizing calculator for quality control of hematology sample analysis |
| US4219277A (en) * | 1978-08-09 | 1980-08-26 | Westinghouse Electric Corp. | Method of detecting flaws on surfaces |
| US4253768A (en) * | 1978-08-09 | 1981-03-03 | Westinghouse Electric Corp. | Processing system for detection and the classification of flaws on metallic surfaces |
| US4493554A (en) * | 1979-02-27 | 1985-01-15 | Diffracto | Method and apparatus for determining physical characteristics of objects and object surfaces |
| US4357668A (en) * | 1980-03-04 | 1982-11-02 | The Perkin-Elmer Corp. | Base line correction method and apparatus |
| DE3014191A1 (de) * | 1980-04-14 | 1981-10-15 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung zum feststellen von flecken auf einem von einer elektrooptischen abtasteinrichtung in ein videosignal umgesetzten objektbild |
| DE3028942A1 (de) | 1980-07-30 | 1982-02-18 | Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling | Verfahren und inspektionsgeraet zum inspizieren eines gegenstandes, insbesondere einer flasche |
| US4483615A (en) * | 1981-12-18 | 1984-11-20 | Owens-Illinois, Inc. | Method and apparatus for detecting checks in glass tubes |
| US4538915A (en) * | 1981-12-23 | 1985-09-03 | E. I. Du Pont De Nemours And Company | Web inspection system having a product characteristic signal normalizing network |
| JPS58143251A (ja) * | 1982-02-22 | 1983-08-25 | Fuji Electric Corp Res & Dev Ltd | 板状物体の欠陥検出方法 |
| JPS58143250A (ja) * | 1982-02-22 | 1983-08-25 | Fuji Electric Corp Res & Dev Ltd | 板状物体の欠陥検出方法 |
| US4553838A (en) * | 1982-04-15 | 1985-11-19 | Eaton Corporation | Optical inspection system |
| JPS59208408A (ja) * | 1983-05-13 | 1984-11-26 | Toshiba Corp | 表面検査方法及びその装置 |
| DE3672163D1 (de) * | 1986-02-22 | 1990-07-26 | Pinsch Gmbh & Co Helmut K | Schnittholz-pruefvorrichtung. |
| US4891530A (en) * | 1986-02-22 | 1990-01-02 | Helmut K. Pinsch Gmbh & Co. | Testing or inspecting apparatus and method for detecting differently shaped surfaces of objects |
| US4803638A (en) * | 1986-06-26 | 1989-02-07 | Westinghouse Electric Corp. | Ultrasonic signal processing system including a flaw gate |
| US4824250A (en) * | 1986-11-17 | 1989-04-25 | Newman John W | Non-destructive testing by laser scanning |
| FR2624608A1 (fr) * | 1987-12-11 | 1989-06-16 | Tech Bois Ameublement Centre | Dispositif de detection automatique de defauts dans un lot heterogene d'objets |
| JP3142852B2 (ja) * | 1990-02-20 | 2001-03-07 | 株式会社日立製作所 | 表面欠陥検査装置 |
| US5440648A (en) * | 1991-11-19 | 1995-08-08 | Dalsa, Inc. | High speed defect detection apparatus having defect detection circuits mounted in the camera housing |
| US6219136B1 (en) | 1998-03-03 | 2001-04-17 | Union Underwear Company, Inc. | Digital signal processor knitting scanner |
| US7381939B2 (en) * | 2005-06-02 | 2008-06-03 | Transcore Link Logistics Corporation | Optical cargo detection |
| US20080079936A1 (en) * | 2006-09-29 | 2008-04-03 | Caterpillar Inc. | Internal thread inspection probe |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3026415A (en) * | 1958-10-20 | 1962-03-20 | Eastman Kodak Co | Flaw detector for continuous web |
| US3475600A (en) * | 1966-02-28 | 1969-10-28 | Infotronics Corp | Base line control circuit means |
| GB1315654A (en) * | 1969-05-21 | 1973-05-02 | Pilkington Brothers Ltd | Detection of faults in transparent material using lasers |
| US3628003A (en) * | 1970-01-02 | 1971-12-14 | Capital National Bank | Baseline projection apparatus for use with baseline drift correction circuits |
-
1974
- 1974-04-30 US US465510A patent/US3920970A/en not_active Expired - Lifetime
-
1975
- 1975-03-24 CA CA222,949A patent/CA1043883A/en not_active Expired
- 1975-04-24 GB GB17140/75A patent/GB1512661A/en not_active Expired
- 1975-04-28 JP JP50051965A patent/JPS50147982A/ja active Pending
- 1975-04-28 NL NL7505021A patent/NL7505021A/xx not_active Application Discontinuation
- 1975-04-29 FR FR7513440A patent/FR2269714B1/fr not_active Expired
- 1975-04-29 SE SE7505028A patent/SE423282B/xx not_active IP Right Cessation
- 1975-04-30 DE DE19752519386 patent/DE2519386A1/de not_active Withdrawn
-
1981
- 1981-03-09 JP JP1981032648U patent/JPS56157662U/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CA1043883A (en) | 1978-12-05 |
| NL7505021A (nl) | 1975-11-03 |
| JPS56157662U (en:Method) | 1981-11-25 |
| DE2519386A1 (de) | 1975-11-13 |
| SE423282B (sv) | 1982-04-26 |
| FR2269714B1 (en:Method) | 1981-08-07 |
| FR2269714A1 (en:Method) | 1975-11-28 |
| JPS50147982A (en:Method) | 1975-11-27 |
| GB1512661A (en) | 1978-06-01 |
| US3920970A (en) | 1975-11-18 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| NUG | Patent has lapsed |
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