SE7503585L - Optisk interferometer. - Google Patents

Optisk interferometer.

Info

Publication number
SE7503585L
SE7503585L SE7503585A SE7503585A SE7503585L SE 7503585 L SE7503585 L SE 7503585L SE 7503585 A SE7503585 A SE 7503585A SE 7503585 A SE7503585 A SE 7503585A SE 7503585 L SE7503585 L SE 7503585L
Authority
SE
Sweden
Prior art keywords
optical interferometer
interferometer
optical
Prior art date
Application number
SE7503585A
Other languages
English (en)
Other versions
SE406229B (sv
SE7503585A (sv
Inventor
G Amon
Original Assignee
Zeiss Jena Veb Carl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeiss Jena Veb Carl filed Critical Zeiss Jena Veb Carl
Publication of SE7503585L publication Critical patent/SE7503585L/sv
Publication of SE7503585A publication Critical patent/SE7503585A/sv
Publication of SE406229B publication Critical patent/SE406229B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
    • G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
SE7503585A 1974-05-13 1975-03-26 Optisk interferometer SE406229B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD178453A DD111993A1 (sv) 1974-05-13 1974-05-13

Publications (3)

Publication Number Publication Date
SE7503585L true SE7503585L (sv) 1975-11-14
SE7503585A SE7503585A (sv) 1975-11-14
SE406229B SE406229B (sv) 1979-01-29

Family

ID=5495729

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7503585A SE406229B (sv) 1974-05-13 1975-03-26 Optisk interferometer

Country Status (10)

Country Link
US (1) US4027976A (sv)
JP (1) JPS5611081B2 (sv)
CH (1) CH584396A5 (sv)
CS (1) CS177338B1 (sv)
DD (1) DD111993A1 (sv)
DE (1) DE2506675A1 (sv)
FR (1) FR2271539B1 (sv)
GB (1) GB1476911A (sv)
SE (1) SE406229B (sv)
SU (1) SU643746A1 (sv)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD137619A1 (de) * 1978-07-11 1979-09-12 Gerd Jaeger Vorrichtung,insbesondere zur digitalen kraftmessung
DD158187A3 (de) * 1980-06-30 1983-01-05 Karlheinz Bechstein Zweistufeninterferometer
US4788428A (en) * 1985-03-04 1988-11-29 The United States Of America As Represented By The Secretary Of The Navy Thermodynamics infrared imaging sensor
US4790642A (en) * 1986-12-01 1988-12-13 Gca Corporation/Tropel Division Integrated metrology for microlithographic objective reducing lens
US4884697A (en) * 1988-06-21 1989-12-05 Takacs Peter Z Surface profiling interferometer
DE3929152A1 (de) * 1989-09-02 1991-03-14 Roch Pierre Ets Elektronische auswerteschaltung fuer ein laser-interferometer
JP3351527B2 (ja) * 1991-11-08 2002-11-25 ブリテイッシュ・テクノロジー・グループ・リミテッド 計測装置
DE59403306D1 (de) * 1994-02-26 1997-08-14 Heidenhain Gmbh Dr Johannes Interferometer
US5493394A (en) * 1994-05-25 1996-02-20 The Boeing Company Method and apparatus for use in measuring frequency difference between light signals
US20070024959A1 (en) * 2005-07-26 2007-02-01 Infocus Corporation Laser combiner
KR100737177B1 (ko) * 2006-05-15 2007-07-10 경북대학교 산학협력단 수직 공진 표면광 레이저를 이용한 간섭계
JP5477774B2 (ja) * 2009-03-30 2014-04-23 株式会社ニコン 光学ユニット、干渉装置、ステージ装置、パターン形成装置およびデバイス製造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3225644A (en) * 1961-10-16 1965-12-28 Zeiss Jena Veb Carl Apparatus producing interferential test data for measuring and control instruments
US3661464A (en) * 1970-03-16 1972-05-09 Jorway Corp Optical interferometer

Also Published As

Publication number Publication date
SU643746A1 (ru) 1979-01-25
DD111993A1 (sv) 1975-03-12
US4027976A (en) 1977-06-07
FR2271539B1 (sv) 1978-02-24
SE406229B (sv) 1979-01-29
DE2506675A1 (de) 1975-11-27
FR2271539A1 (sv) 1975-12-12
GB1476911A (en) 1977-06-16
JPS50156483A (sv) 1975-12-17
SE7503585A (sv) 1975-11-14
CS177338B1 (sv) 1977-07-29
CH584396A5 (sv) 1977-01-31
JPS5611081B2 (sv) 1981-03-12

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