SE428973B - Optisk anordning for bestemning av ljusuttredesvinkeln vid en av en ljusfleck treffad materialbana - Google Patents

Optisk anordning for bestemning av ljusuttredesvinkeln vid en av en ljusfleck treffad materialbana

Info

Publication number
SE428973B
SE428973B SE7813256A SE7813256A SE428973B SE 428973 B SE428973 B SE 428973B SE 7813256 A SE7813256 A SE 7813256A SE 7813256 A SE7813256 A SE 7813256A SE 428973 B SE428973 B SE 428973B
Authority
SE
Sweden
Prior art keywords
light
mirror
cylinder
sensing
lens
Prior art date
Application number
SE7813256A
Other languages
English (en)
Swedish (sv)
Other versions
SE7813256L (sv
Inventor
E Sick
Original Assignee
Sick Optik Elektronik Erwin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick Optik Elektronik Erwin filed Critical Sick Optik Elektronik Erwin
Publication of SE7813256L publication Critical patent/SE7813256L/xx
Publication of SE428973B publication Critical patent/SE428973B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE7813256A 1978-01-04 1978-12-22 Optisk anordning for bestemning av ljusuttredesvinkeln vid en av en ljusfleck treffad materialbana SE428973B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2800351A DE2800351B2 (de) 1978-01-04 1978-01-04 Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn

Publications (2)

Publication Number Publication Date
SE7813256L SE7813256L (sv) 1979-07-05
SE428973B true SE428973B (sv) 1983-08-01

Family

ID=6028981

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7813256A SE428973B (sv) 1978-01-04 1978-12-22 Optisk anordning for bestemning av ljusuttredesvinkeln vid en av en ljusfleck treffad materialbana

Country Status (6)

Country Link
US (1) US4248537A (it)
JP (1) JPS5497475A (it)
DE (1) DE2800351B2 (it)
FR (1) FR2422933A1 (it)
GB (1) GB2023868B (it)
SE (1) SE428973B (it)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2827704C3 (de) * 1978-06-23 1981-03-19 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung der Lichtaustrittswinkel
DE2827705C3 (de) * 1978-06-23 1981-07-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Gerät zur Feststellung von Fehlern an Bahnmaterial
SE440405B (sv) * 1979-03-02 1985-07-29 Svenska Textilforskningsinst Anordning for bestemning av riktningsfordelningen av fibrer i planet for ett dukformigt material
DE3006072C2 (de) * 1980-02-19 1984-11-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlstellenermittlungsvorrichtung für Materialbahnen
DE3037622C2 (de) * 1980-10-04 1987-02-26 Theodor Prof. Dr.-Ing. 1000 Berlin Gast Einrichtung zur Bestimmung der Oberflächengüte
DE3307591C2 (de) * 1983-03-03 1986-06-05 Kraftwerk Union AG, 4330 Mülheim Verfahren zur optischen Kontrolle der Oberfläche eines Prüfgutes
EP0123929B1 (de) * 1983-04-22 1988-06-22 Erwin Sick GmbH Optik-Elektronik Fehlerfeststellungsvorrichtung
DE3411934C2 (de) * 1983-04-22 1986-04-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlerfeststellungsvorrichtung
DE3408106A1 (de) * 1984-03-05 1985-09-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optischer rauheits-scanner
DE3428435A1 (de) * 1984-08-01 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Rauheitssonde
US5448364A (en) * 1993-03-22 1995-09-05 Estek Corporation Particle detection system with reflective line-to-spot collector
EP1241466A1 (fr) * 2001-03-13 2002-09-18 Daniel Malaise Dispositif et procédé optoélectronique de mesure en temps réel de la lumière diffusée par une surface en défilement

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL279098A (it) * 1961-05-31
DE1473746A1 (de) * 1964-06-15 1969-01-09 Eastman Kodak Co Vorrichtung zum photoelektrischen Abtasten eines gefuehrten Bandes
US3618063A (en) * 1970-02-11 1971-11-02 Eastman Kodak Co Defect inspection apparatus
DE2051908A1 (de) * 1970-10-22 1972-04-27 Licentia Gmbh Photoelektronische Oberflachenabtast einrichtung
GB1347777A (en) * 1970-12-12 1974-02-27 Sick Optik Elektronik Erwin Photoelectric length measuring apparatus
GB1389444A (en) * 1971-03-09 1975-04-03 Sira Institute Apparatus for automatic inspection of materials
JPS4879686A (it) * 1972-01-28 1973-10-25
JPS5035437A (it) * 1973-07-31 1975-04-04
US3866054A (en) * 1973-09-28 1975-02-11 Du Pont Defect size discriminator circuit for web inspection system
US3919531A (en) * 1974-05-16 1975-11-11 Libbey Owens Ford Co Method of and apparatus for inspecting the contours of moving bent articles
GB1496765A (en) * 1974-12-19 1978-01-05 Ciba Geigy Ag Examining sheet material photoelectrically
JPS5210793A (en) * 1975-07-15 1977-01-27 Yaskawa Electric Mfg Co Ltd Fault detector

Also Published As

Publication number Publication date
FR2422933B1 (it) 1984-03-02
DE2800351A1 (de) 1979-07-05
US4248537A (en) 1981-02-03
FR2422933A1 (fr) 1979-11-09
JPS638420B2 (it) 1988-02-23
DE2800351C3 (it) 1980-07-31
DE2800351B2 (de) 1979-11-15
GB2023868B (en) 1982-06-23
JPS5497475A (en) 1979-08-01
GB2023868A (en) 1980-01-03
SE7813256L (sv) 1979-07-05

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