SE425937B - Sett och anordning for att analysera en jonstrale fran en jonkella - Google Patents

Sett och anordning for att analysera en jonstrale fran en jonkella

Info

Publication number
SE425937B
SE425937B SE7713827A SE7713827A SE425937B SE 425937 B SE425937 B SE 425937B SE 7713827 A SE7713827 A SE 7713827A SE 7713827 A SE7713827 A SE 7713827A SE 425937 B SE425937 B SE 425937B
Authority
SE
Sweden
Prior art keywords
deflection
field
ion beam
ion
source
Prior art date
Application number
SE7713827A
Other languages
English (en)
Swedish (sv)
Other versions
SE7713827L (sv
Inventor
C R Mckinney
Original Assignee
Du Pont
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Du Pont filed Critical Du Pont
Publication of SE7713827L publication Critical patent/SE7713827L/xx
Publication of SE425937B publication Critical patent/SE425937B/sv

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/326—Static spectrometers using double focusing with magnetic and electrostatic sectors of 90 degrees

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
SE7713827A 1976-12-07 1977-12-06 Sett och anordning for att analysera en jonstrale fran en jonkella SE425937B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/748,298 US4099052A (en) 1976-12-07 1976-12-07 Mass spectrometer beam monitor

Publications (2)

Publication Number Publication Date
SE7713827L SE7713827L (sv) 1978-06-08
SE425937B true SE425937B (sv) 1982-11-22

Family

ID=25008864

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7713827A SE425937B (sv) 1976-12-07 1977-12-06 Sett och anordning for att analysera en jonstrale fran en jonkella

Country Status (7)

Country Link
US (1) US4099052A (cg-RX-API-DMAC7.html)
JP (1) JPS5371892A (cg-RX-API-DMAC7.html)
CA (1) CA1081867A (cg-RX-API-DMAC7.html)
DE (1) DE2754198A1 (cg-RX-API-DMAC7.html)
FR (1) FR2373875A1 (cg-RX-API-DMAC7.html)
GB (1) GB1560328A (cg-RX-API-DMAC7.html)
SE (1) SE425937B (cg-RX-API-DMAC7.html)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2765890B2 (ja) * 1988-12-09 1998-06-18 株式会社日立製作所 プラズマイオン源微量元素質量分析装置
JP2007526458A (ja) * 2004-03-04 2007-09-13 エムディーエス インコーポレイテッド ドゥーイング ビジネス スルー イッツ エムディーエス サイエックス ディヴィジョン 試料を質量分析するための方法およびシステム
US7504621B2 (en) * 2004-03-04 2009-03-17 Mds Inc. Method and system for mass analysis of samples
DE102009029899A1 (de) * 2009-06-19 2010-12-23 Thermo Fisher Scientific (Bremen) Gmbh Massenspektrometer und Verfahren zur Isotopenanalyse
CN110568474B (zh) * 2019-10-08 2024-04-12 中国工程物理研究院激光聚变研究中心 一种宽能谱范围的带电粒子谱仪

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1498936B2 (de) * 1963-12-28 1971-01-14 Nihon Densht K K , Tokio Verfahren und Vorrichtung zur Steue rung der Expositionszeit in einem Massen spektrographen
GB1116427A (en) * 1965-01-21 1968-06-06 Ass Elect Ind Improvements in or relating to the measurement of the gas content of metals
US3475604A (en) * 1965-09-30 1969-10-28 Hitachi Ltd Mass spectrometer having means for simultaneously detecting single focussing and double focussing mass spectra
GB1131495A (en) * 1965-10-04 1968-10-23 Edwards High Vacuum Int Ltd Improvements in or relating to electron emission control in mass spectrometers
US3518424A (en) * 1967-09-13 1970-06-30 Exxon Research Engineering Co Ion beam intensity control for a field ionization mass spectrometer employing voltage feedback to the ion source
US3602709A (en) * 1968-03-14 1971-08-31 Bell & Howell Co Mass analyzer including magnetic field control means
US3548188A (en) * 1969-05-06 1970-12-15 Vacuum Instr Corp Method and apparatus for mass analyzing a gas which is selectively desorbed from a body
JPS5110797B1 (cg-RX-API-DMAC7.html) * 1970-07-24 1976-04-06
US3953732A (en) * 1973-09-28 1976-04-27 The University Of Rochester Dynamic mass spectrometer
US3868507A (en) * 1973-12-05 1975-02-25 Atomic Energy Commission Field desorption spectrometer

Also Published As

Publication number Publication date
JPS5371892A (en) 1978-06-26
US4099052A (en) 1978-07-04
CA1081867A (en) 1980-07-15
FR2373875A1 (fr) 1978-07-07
GB1560328A (en) 1980-02-06
FR2373875B1 (cg-RX-API-DMAC7.html) 1980-08-22
DE2754198A1 (de) 1978-06-08
SE7713827L (sv) 1978-06-08

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