SE367279B - - Google Patents
Info
- Publication number
- SE367279B SE367279B SE1622371A SE1622371A SE367279B SE 367279 B SE367279 B SE 367279B SE 1622371 A SE1622371 A SE 1622371A SE 1622371 A SE1622371 A SE 1622371A SE 367279 B SE367279 B SE 367279B
- Authority
- SE
- Sweden
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/488—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with retarding grids
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US9947570A | 1970-12-18 | 1970-12-18 | |
| US16857571A | 1971-08-03 | 1971-08-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SE367279B true SE367279B (en) | 1974-05-20 |
Family
ID=26796151
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE1622371A SE367279B (en) | 1970-12-18 | 1971-12-17 |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JPS512396B1 (en) |
| CA (1) | CA942435A (en) |
| DE (1) | DE2162808C3 (en) |
| GB (1) | GB1370360A (en) |
| NL (1) | NL173799C (en) |
| SE (1) | SE367279B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5335691U (en) * | 1976-09-02 | 1978-03-29 | ||
| JPS55129083A (en) * | 1979-03-27 | 1980-10-06 | Kasai Kk | Playing tool for child |
| DE3138927A1 (en) * | 1981-09-30 | 1983-04-14 | Siemens AG, 1000 Berlin und 8000 München | Imaging spectrometer for electron-beam metrology and an electron beam measurement apparatus |
| DE3206309A1 (en) * | 1982-02-22 | 1983-09-15 | Siemens AG, 1000 Berlin und 8000 München | SECONDARY ELECTRON SPECTROMETER AND METHOD FOR ITS OPERATION |
| EP1605492B1 (en) | 2004-06-11 | 2015-11-18 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Charged particle beam device with retarding field analyzer |
| CN112799120B (en) * | 2019-11-13 | 2024-03-22 | 中国科学院国家空间科学中心 | Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons |
-
1971
- 1971-11-30 CA CA128,998A patent/CA942435A/en not_active Expired
- 1971-12-17 GB GB5869571A patent/GB1370360A/en not_active Expired
- 1971-12-17 NL NL7117400A patent/NL173799C/en not_active IP Right Cessation
- 1971-12-17 JP JP10197271A patent/JPS512396B1/ja active Pending
- 1971-12-17 SE SE1622371A patent/SE367279B/xx unknown
- 1971-12-17 DE DE19712162808 patent/DE2162808C3/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2162808C3 (en) | 1978-09-07 |
| DE2162808B2 (en) | 1977-12-29 |
| NL173799C (en) | 1984-03-01 |
| NL7117400A (en) | 1972-06-20 |
| CA942435A (en) | 1974-02-19 |
| DE2162808A1 (en) | 1972-07-06 |
| NL173799B (en) | 1983-10-03 |
| JPS512396B1 (en) | 1976-01-26 |
| GB1370360A (en) | 1974-10-16 |