SE346853B - - Google Patents

Info

Publication number
SE346853B
SE346853B SE04200/68A SE420068A SE346853B SE 346853 B SE346853 B SE 346853B SE 04200/68 A SE04200/68 A SE 04200/68A SE 420068 A SE420068 A SE 420068A SE 346853 B SE346853 B SE 346853B
Authority
SE
Sweden
Application number
SE04200/68A
Inventor
E Kuusi
A Lehtinen
Original Assignee
Valmet Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valmet Oy filed Critical Valmet Oy
Publication of SE346853B publication Critical patent/SE346853B/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34Paper
    • G01N33/346Paper sheets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
SE04200/68A 1967-04-01 1968-03-29 SE346853B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI0962/67A FI40587B (xx) 1967-04-01 1967-04-01

Publications (1)

Publication Number Publication Date
SE346853B true SE346853B (xx) 1972-07-17

Family

ID=8504880

Family Applications (1)

Application Number Title Priority Date Filing Date
SE04200/68A SE346853B (xx) 1967-04-01 1968-03-29

Country Status (6)

Country Link
US (1) US3530296A (xx)
DE (1) DE1773085C3 (xx)
FI (1) FI40587B (xx)
FR (1) FR1573107A (xx)
GB (1) GB1185783A (xx)
SE (1) SE346853B (xx)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3662170A (en) * 1970-05-21 1972-05-09 Beloit Corp Method and apparatus for measuring the thickness moisture profile of fibrous webs
ZA755471B (en) * 1976-02-28 1977-05-25 W Richter Improvements in automatic guidance
FI62420C (fi) * 1981-05-29 1982-12-10 Enso Gutzeit Oy Foerfarande foer att maeta belaeggningsmaengd
FI68320C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning fraon en radioisotopkaella utan att foerstoera provet maeta foerdelningen av fyll-och/eller belaeggningsmedel i tjockleksriktningen av papp erartong eller liknande och halten av dessa medel anordnin rgafoer tillaempande av foerfarandet samt anvaendningar av erfoarandet och anordningarna
FI68321C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning utsaend av ett roentgenroer utan att foerstoera provet maeta foerdelningen av fyll- och/eller belaeggningsmedel i tjockleksriktningen av papper kartong eller liknande och halten av dessa medel anordningar foer tillaempande av foerfarandet samt anvaendningar av foerfarandet och anordningarna
FI68322C (fi) * 1983-06-28 1985-08-12 Enso Gutzeit Oy Foerfarande och anordning foer maetning av maengden av siliciumbelaeggning vid papper eller kartong
US5778041A (en) * 1983-10-13 1998-07-07 Honeywell-Measurex Corporation System and process for measuring ash in paper
JP3467507B2 (ja) 2000-06-22 2003-11-17 独立行政法人通信総合研究所 光搬送波を用いた高周波信号伝送方法および高周波信号伝送装置
EP3339847B1 (en) 2016-12-22 2020-03-18 Malvern Panalytical B.V. Analysis of layered samples with xrf

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2977478A (en) * 1953-11-11 1961-03-28 Exatest Ges Fur Messtechnik Mi Method of and apparatus for measuring the thickness of materials
NL238481A (xx) * 1955-04-12
US2963585A (en) * 1955-07-21 1960-12-06 Daystrom Inc Non-contacting thickness gauges
US3121166A (en) * 1960-10-20 1964-02-11 Carl A Vossberg X-ray apparatus for measuring paper web density
US3254211A (en) * 1961-12-11 1966-05-31 Gen Motors Corp Radioactive radiation transducer device for measuring variable conditions
US3383510A (en) * 1964-12-07 1968-05-14 Parametrics Inc Alpha particle excited monochromatic X-ray source

Also Published As

Publication number Publication date
GB1185783A (en) 1970-03-25
DE1773085C3 (de) 1975-12-11
DE1773085A1 (de) 1972-03-16
US3530296A (en) 1970-09-22
FR1573107A (xx) 1969-07-04
DE1773085B2 (de) 1975-04-24
FI40587B (xx) 1968-11-30

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