SE304117B - - Google Patents

Info

Publication number
SE304117B
SE304117B SE11677/64A SE1167764A SE304117B SE 304117 B SE304117 B SE 304117B SE 11677/64 A SE11677/64 A SE 11677/64A SE 1167764 A SE1167764 A SE 1167764A SE 304117 B SE304117 B SE 304117B
Authority
SE
Sweden
Prior art keywords
radiation
photo
cells
coating
cell
Prior art date
Application number
SE11677/64A
Other languages
English (en)
Inventor
H Mueller
Original Assignee
Kalle Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kalle Ag filed Critical Kalle Ag
Publication of SE304117B publication Critical patent/SE304117B/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G01B11/0633Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE11677/64A 1963-10-01 1964-09-29 SE304117B (ru)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEK0050961 1963-10-01

Publications (1)

Publication Number Publication Date
SE304117B true SE304117B (ru) 1968-09-16

Family

ID=7225823

Family Applications (1)

Application Number Title Priority Date Filing Date
SE11677/64A SE304117B (ru) 1963-10-01 1964-09-29

Country Status (8)

Country Link
US (1) US3322962A (ru)
AT (1) AT256493B (ru)
BE (1) BE653723A (ru)
CH (1) CH423274A (ru)
DK (1) DK115432B (ru)
GB (1) GB1069910A (ru)
NL (1) NL6411388A (ru)
SE (1) SE304117B (ru)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1548262B2 (de) * 1966-10-13 1970-05-06 Leybold-Heraeus GmbH & Co KG, 5OOO Köln-Bayenthal Optisches Gerät zur Messung von Schichtdicken in Vakuumaufdampfprozessen
US3693025A (en) * 1969-11-28 1972-09-19 Brun Sensor Systems Inc Apparatus and method for eliminating interference errors in dual-beam infrared reflection measurements on a diffusely reflecting surface by geometrical elimination of interference-producing specularly-reflected radiation components
US3744916A (en) * 1971-06-08 1973-07-10 Us Navy Optical film thickness monitor
US3737237A (en) * 1971-11-18 1973-06-05 Nasa Monitoring deposition of films
DE2910240A1 (de) * 1979-03-15 1980-09-25 Rolf Dr Bartke Vorrichtung zur ermittelung des reflexionsvermoegens der oberflaeche eines messobjektes
GB2127541B (en) * 1982-09-27 1986-08-20 Imp Group Plc Monitoring sheet material
US4737651A (en) * 1986-01-31 1988-04-12 Graphic Controls Corporation Optical apparatus for the measurement of coat weight of coated products
US7167615B1 (en) 1999-11-05 2007-01-23 Board Of Regents, The University Of Texas System Resonant waveguide-grating filters and sensors and methods for making and using same
KR102195240B1 (ko) * 2017-11-28 2020-12-24 주식회사 고영테크놀러지 기판 검사 장치 및 기판 검사 방법
US10859371B2 (en) 2017-11-28 2020-12-08 Koh Young Technology Inc. Apparatus for inspecting substrate and method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2215211A (en) * 1937-12-22 1940-09-17 Pittsburgh Plate Glass Co Polish meter
US2382439A (en) * 1941-06-19 1945-08-14 Hercules Powder Co Ltd Color grading apparatus and method
DE925197C (de) * 1953-11-11 1955-03-14 Exatest Ges Fuer Messtechnik M Verfahren zur beruehrungslosen Dickenmessung von bandfoermigem, vorzugsweise von warmgewalztem Gut mittels harter elektromagnetischer Strahlung
US2973686A (en) * 1957-10-11 1961-03-07 Gen Precision Inc Apparatus for spectrophotometric monitoring of thin film coatings
US3017512A (en) * 1959-06-29 1962-01-16 American Can Co Coating thickness gauge

Also Published As

Publication number Publication date
GB1069910A (en) 1967-05-24
DK115432B (da) 1969-10-06
BE653723A (ru) 1965-03-29
NL6411388A (ru) 1965-04-02
AT256493B (de) 1967-08-25
CH423274A (de) 1966-10-31
US3322962A (en) 1967-05-30

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