SE0850034L - Vätskefilmmätare - Google Patents

Vätskefilmmätare

Info

Publication number
SE0850034L
SE0850034L SE0850034A SE0850034A SE0850034L SE 0850034 L SE0850034 L SE 0850034L SE 0850034 A SE0850034 A SE 0850034A SE 0850034 A SE0850034 A SE 0850034A SE 0850034 L SE0850034 L SE 0850034L
Authority
SE
Sweden
Prior art keywords
radiation
fluid film
detector
reflector
normally
Prior art date
Application number
SE0850034A
Other languages
English (en)
Other versions
SE532397C2 (sv
Inventor
Leif Cronvall
Original Assignee
Microfluid Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microfluid Ab filed Critical Microfluid Ab
Priority to SE0850034A priority Critical patent/SE532397C2/sv
Priority to US13/122,860 priority patent/US8618484B2/en
Priority to JP2011530991A priority patent/JP5544643B2/ja
Priority to PCT/SE2009/051104 priority patent/WO2010042029A1/en
Priority to EP09819483A priority patent/EP2344838A1/en
Publication of SE0850034L publication Critical patent/SE0850034L/sv
Publication of SE532397C2 publication Critical patent/SE532397C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3577—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06186—Resistance heated; wire sources; lamelle sources

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measuring Fluid Pressure (AREA)
SE0850034A 2008-10-09 2008-10-09 Vätskefilmmätare SE532397C2 (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE0850034A SE532397C2 (sv) 2008-10-09 2008-10-09 Vätskefilmmätare
US13/122,860 US8618484B2 (en) 2008-10-09 2009-10-05 Fluid film indicator
JP2011530991A JP5544643B2 (ja) 2008-10-09 2009-10-05 流体フィルム測定器
PCT/SE2009/051104 WO2010042029A1 (en) 2008-10-09 2009-10-05 Fluid film indicator
EP09819483A EP2344838A1 (en) 2008-10-09 2009-10-05 Fluid film indicator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0850034A SE532397C2 (sv) 2008-10-09 2008-10-09 Vätskefilmmätare

Publications (2)

Publication Number Publication Date
SE0850034L true SE0850034L (sv) 2010-01-12
SE532397C2 SE532397C2 (sv) 2010-01-12

Family

ID=41502186

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0850034A SE532397C2 (sv) 2008-10-09 2008-10-09 Vätskefilmmätare

Country Status (5)

Country Link
US (1) US8618484B2 (sv)
EP (1) EP2344838A1 (sv)
JP (1) JP5544643B2 (sv)
SE (1) SE532397C2 (sv)
WO (1) WO2010042029A1 (sv)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106645144B (zh) * 2016-09-29 2019-04-12 河海大学常州校区 一种流动液膜发生装置及其使用方法

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4167746A (en) * 1975-03-03 1979-09-11 General Electric Company Radiation triggered thyristor with light focussing guide
FI65143C (fi) * 1981-12-23 1984-03-12 Valtion Teknillinen Maethuvud foer infraroedhygrometer
HU188795B (en) * 1982-05-28 1986-05-28 Koezponti Elelmiszeripari Kutato Intezet,Hu Detecting arrangement for meassuring the intensity of radiation scattering at a given angle from a sample exposed to radiation of given angle of incidence
DE3220282C3 (de) * 1982-05-28 1995-05-18 Roland Man Druckmasch Vorrichtung zum betrieblichen Erfassen eines Maßes für die Feuchtmittelmenge auf der rotierenden Druckplatte in Offset-Druckmaschinen
JPH02128168A (ja) 1988-11-07 1990-05-16 Natl Space Dev Agency Japan<Nasda> 電子走査型マイクロ波放射計
JPH03225258A (ja) * 1990-01-30 1991-10-04 Yokogawa Electric Corp シート状物体の特性測定装置
US5124552A (en) * 1991-01-28 1992-06-23 Measurex Corporation Sensor and method for measuring web moisture with optimal temperature insensitivity over a wide basis weight range
US5338361A (en) * 1991-11-04 1994-08-16 Measurex Corporation Multiple coat measurement and control apparatus and method
JPH05312723A (ja) * 1992-03-12 1993-11-22 Kobe Steel Ltd 鋼板の連続めっき合金化ラインでの合金化度測定方法
US5302823A (en) 1992-08-31 1994-04-12 Itt Corporation Satellite solar band calibration source target apparatus
JPH07128144A (ja) 1993-11-04 1995-05-19 Matsushita Electric Ind Co Ltd 分光測定装置
US5552604A (en) * 1994-05-13 1996-09-03 Donald W. Sting Optical sensing with crystal assembly sensing tip
JP3203149B2 (ja) * 1995-04-24 2001-08-27 株式会社クボタ 分光分析装置用の投受光装置
EP0890093A4 (en) * 1996-03-19 2000-03-15 Univ Utah Res Found SYSTEM FOR DETERMINING THE CONCENTRATION OF A SAMPLE TO BE ANALYZED
AU768800B2 (en) 1996-03-19 2004-01-08 University Of Utah Research Foundation System for determining analyte concentration
US5963333A (en) * 1996-09-12 1999-10-05 Color Savvy Systems Limited Color sensor
US6271523B1 (en) * 1997-12-05 2001-08-07 John D. Weaver Optical sensor system and method for monitoring consumables
JP4063947B2 (ja) * 1998-03-20 2008-03-19 横河電機株式会社 繊維配向計
GB9906011D0 (en) 1999-03-16 1999-05-12 Whiley Foils Ltd Fluorescent materials
US6424416B1 (en) * 1999-10-25 2002-07-23 Textron Systems Corporation Integrated optics probe for spectral analysis
SE519918C2 (sv) * 2000-11-24 2003-04-22 Cervitrol Ab Förfarande och anordning för radiometrisk mätning av tunna vätskefilmer
US7697750B2 (en) * 2004-12-06 2010-04-13 John Castle Simmons Specially coherent optics
EP1694049B1 (de) 2005-02-16 2009-07-01 X-Rite Europe GmbH Farbmessgerät und zugehöriger Messkopf

Also Published As

Publication number Publication date
SE532397C2 (sv) 2010-01-12
JP5544643B2 (ja) 2014-07-09
WO2010042029A1 (en) 2010-04-15
JP2012505401A (ja) 2012-03-01
US8618484B2 (en) 2013-12-31
US20110204238A1 (en) 2011-08-25
EP2344838A1 (en) 2011-07-20

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Legal Events

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