SE0601304L - Sensor samt system för avkänning av en elektronstråle - Google Patents

Sensor samt system för avkänning av en elektronstråle

Info

Publication number
SE0601304L
SE0601304L SE0601304A SE0601304A SE0601304L SE 0601304 L SE0601304 L SE 0601304L SE 0601304 A SE0601304 A SE 0601304A SE 0601304 A SE0601304 A SE 0601304A SE 0601304 L SE0601304 L SE 0601304L
Authority
SE
Sweden
Prior art keywords
detecting
sensor
electron beam
electron
Prior art date
Application number
SE0601304A
Other languages
English (en)
Other versions
SE530019C2 (sv
Inventor
Anders Kristiansson
Lars Aake Naeslund
Hans Hallstadius
Werner Haag
Kurt Holm
Benno Zigerlig
Original Assignee
Tetra Laval Holdings & Finance
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tetra Laval Holdings & Finance filed Critical Tetra Laval Holdings & Finance
Priority to SE0601304A priority Critical patent/SE530019C2/sv
Priority to PCT/SE2007/000444 priority patent/WO2007145560A1/en
Priority to EP07748108.3A priority patent/EP2033016A4/en
Priority to JP2009515339A priority patent/JP4922398B2/ja
Priority to BRPI0712302-7A priority patent/BRPI0712302A2/pt
Priority to CN2007800222999A priority patent/CN101473244B/zh
Priority to RU2009100927/28A priority patent/RU2420764C2/ru
Priority to MX2008014118A priority patent/MX2008014118A/es
Priority to TW096117474A priority patent/TW200803928A/zh
Priority to US11/812,050 priority patent/US7592613B2/en
Publication of SE0601304L publication Critical patent/SE0601304L/sv
Publication of SE530019C2 publication Critical patent/SE530019C2/sv
Priority to HK09111794.6A priority patent/HK1132332A1/xx

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65B—MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING
    • B65B55/00—Preserving, protecting or purifying packages or package contents in association with packaging
    • B65B55/02—Sterilising, e.g. of complete packages
    • B65B55/04—Sterilising wrappers or receptacles prior to, or during, packaging
    • B65B55/08—Sterilising wrappers or receptacles prior to, or during, packaging by irradiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Mechanical Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Plasma & Fusion (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
SE0601304A 2006-06-14 2006-06-14 Sensor samt system för avkänning av en elektronstråle SE530019C2 (sv)

Priority Applications (11)

Application Number Priority Date Filing Date Title
SE0601304A SE530019C2 (sv) 2006-06-14 2006-06-14 Sensor samt system för avkänning av en elektronstråle
CN2007800222999A CN101473244B (zh) 2006-06-14 2007-05-05 用于感应电子束的传感器和系统
EP07748108.3A EP2033016A4 (en) 2006-06-14 2007-05-05 DETECTOR AND SYSTEM FOR DETECTING AN ELECTRON BEAM
JP2009515339A JP4922398B2 (ja) 2006-06-14 2007-05-05 電子ビームを検知するためのセンサ及びシステム
BRPI0712302-7A BRPI0712302A2 (pt) 2006-06-14 2007-05-05 sensor e sistema para detectar um feixe de elétrons
PCT/SE2007/000444 WO2007145560A1 (en) 2006-06-14 2007-05-05 Sensor and system for sensing an electron beam
RU2009100927/28A RU2420764C2 (ru) 2006-06-14 2007-05-05 Датчик и система для измерения электронного луча
MX2008014118A MX2008014118A (es) 2006-06-14 2007-05-05 Sensor y sistema para detectar un haz de electrones.
TW096117474A TW200803928A (en) 2006-06-14 2007-05-16 Sensor and system for sensing an electron beam
US11/812,050 US7592613B2 (en) 2006-06-14 2007-06-14 Sensor and system for sensing an electron beam
HK09111794.6A HK1132332A1 (en) 2006-06-14 2009-12-16 Sensor and system for sensing an electron beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0601304A SE530019C2 (sv) 2006-06-14 2006-06-14 Sensor samt system för avkänning av en elektronstråle

Publications (2)

Publication Number Publication Date
SE0601304L true SE0601304L (sv) 2007-12-15
SE530019C2 SE530019C2 (sv) 2008-02-12

Family

ID=38831984

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0601304A SE530019C2 (sv) 2006-06-14 2006-06-14 Sensor samt system för avkänning av en elektronstråle

Country Status (11)

Country Link
US (1) US7592613B2 (sv)
EP (1) EP2033016A4 (sv)
JP (1) JP4922398B2 (sv)
CN (1) CN101473244B (sv)
BR (1) BRPI0712302A2 (sv)
HK (1) HK1132332A1 (sv)
MX (1) MX2008014118A (sv)
RU (1) RU2420764C2 (sv)
SE (1) SE530019C2 (sv)
TW (1) TW200803928A (sv)
WO (1) WO2007145560A1 (sv)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2729939B1 (en) * 2011-07-04 2018-02-14 Tetra Laval Holdings & Finance SA An electron beam device and a method of manufacturing said electron beam device
JP5924981B2 (ja) * 2012-03-02 2016-05-25 三菱電機株式会社 放射線ビームモニタ装置
JP6005447B2 (ja) * 2012-08-31 2016-10-12 澁谷工業株式会社 電子線検出装置
EP2737909A1 (en) * 2012-12-03 2014-06-04 Tetra Laval Holdings & Finance S.A. Device and method for irradiating packaging containers with electron beam
WO2015125418A1 (en) * 2014-02-19 2015-08-27 Hitachi Zosen Corporation Electron beam irradiator and irradiation system with emission detection
EP3110457B1 (en) * 2014-02-26 2018-03-21 Tetra Laval Holdings & Finance SA Device and method for electron beam sterilization comprising temperature measurement device, temperature correlated to radiation intensity
JP6893879B2 (ja) 2014-11-18 2021-06-23 テトラ ラバル ホールディングス アンド ファイナンス エス エイ 低電圧電子ビームの線量計装置及び方法
MX2019001975A (es) 2016-08-20 2019-08-29 Buehler Ag Dispositivos y metodos para pasteurizar y/o esterilizar material en particulas y cartucho.
CN107195519B (zh) * 2017-07-07 2023-07-11 桂林电子科技大学 一种高能带电粒子束从真空到大气的引出窗口
CN113167918A (zh) * 2018-11-23 2021-07-23 利乐拉瓦尔集团及财务有限公司 用于辐射源的测量工具和用于测量辐射的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11248893A (ja) * 1998-03-03 1999-09-17 Nissin High Voltage Co Ltd 電子線照射装置
TW464947B (en) * 1999-11-29 2001-11-21 Ushio Electric Inc Measuring apparatus of electron beam quantity and processing apparatus of electron beam irradiation
JP2001221897A (ja) * 2000-02-14 2001-08-17 Nissin High Voltage Co Ltd 電子線分布測定装置
US6919570B2 (en) * 2002-12-19 2005-07-19 Advanced Electron Beams, Inc. Electron beam sensor
JP2005003564A (ja) * 2003-06-13 2005-01-06 Ushio Inc 電子ビーム管および電子ビーム取り出し用窓
SE526700C2 (sv) 2003-06-19 2005-10-25 Tetra Laval Holdings & Finance Anordning och förfarande för sterilisering av en materialbana med elektronbestrålning
SE525347C2 (sv) 2003-06-19 2005-02-08 Tetra Laval Holdings & Finance Förfarande och anordning för bestrålning med elektroner
SE0302024D0 (sv) 2003-07-08 2003-07-08 Tetra Laval Holdings & Finance Device and method for sterilization
SE529241C2 (sv) * 2005-10-26 2007-06-05 Tetra Laval Holdings & Finance Sensor samt system för avkänning av en elektronstråle
US7375345B2 (en) 2005-10-26 2008-05-20 Tetra Laval Holdings & Finance S.A. Exposed conductor system and method for sensing an electron beam
US7368739B2 (en) 2005-10-26 2008-05-06 Tetra Laval Holdings & Finance S.A. Multilayer detector and method for sensing an electron beam

Also Published As

Publication number Publication date
JP2009540524A (ja) 2009-11-19
TW200803928A (en) 2008-01-16
CN101473244B (zh) 2012-06-13
BRPI0712302A2 (pt) 2012-01-17
US7592613B2 (en) 2009-09-22
MX2008014118A (es) 2008-11-18
HK1132332A1 (en) 2010-02-19
RU2009100927A (ru) 2010-07-20
EP2033016A4 (en) 2016-11-16
SE530019C2 (sv) 2008-02-12
WO2007145560A1 (en) 2007-12-21
US20070290148A1 (en) 2007-12-20
JP4922398B2 (ja) 2012-04-25
CN101473244A (zh) 2009-07-01
RU2420764C2 (ru) 2011-06-10
EP2033016A1 (en) 2009-03-11

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