HK1132332A1 - Sensor and system for sensing an electron beam - Google Patents

Sensor and system for sensing an electron beam

Info

Publication number
HK1132332A1
HK1132332A1 HK09111794.6A HK09111794A HK1132332A1 HK 1132332 A1 HK1132332 A1 HK 1132332A1 HK 09111794 A HK09111794 A HK 09111794A HK 1132332 A1 HK1132332 A1 HK 1132332A1
Authority
HK
Hong Kong
Prior art keywords
sensing
sensor
electron beam
electron
Prior art date
Application number
HK09111794.6A
Other languages
English (en)
Inventor
Anders Kristiansson
Lars Aake Naeslund
Hans Hallstadius
Werner Haag
Kurt Holm
Benno Zigerlig
Original Assignee
Tetra Laval Holdings & Finance
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tetra Laval Holdings & Finance filed Critical Tetra Laval Holdings & Finance
Publication of HK1132332A1 publication Critical patent/HK1132332A1/xx

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65B—MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING
    • B65B55/00—Preserving, protecting or purifying packages or package contents in association with packaging
    • B65B55/02—Sterilising, e.g. of complete packages
    • B65B55/04—Sterilising wrappers or receptacles prior to, or during, packaging
    • B65B55/08—Sterilising wrappers or receptacles prior to, or during, packaging by irradiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Mechanical Engineering (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
HK09111794.6A 2006-06-14 2009-12-16 Sensor and system for sensing an electron beam HK1132332A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE0601304A SE530019C2 (sv) 2006-06-14 2006-06-14 Sensor samt system för avkänning av en elektronstråle
US81453206P 2006-06-19 2006-06-19
PCT/SE2007/000444 WO2007145560A1 (en) 2006-06-14 2007-05-05 Sensor and system for sensing an electron beam

Publications (1)

Publication Number Publication Date
HK1132332A1 true HK1132332A1 (en) 2010-02-19

Family

ID=38831984

Family Applications (1)

Application Number Title Priority Date Filing Date
HK09111794.6A HK1132332A1 (en) 2006-06-14 2009-12-16 Sensor and system for sensing an electron beam

Country Status (11)

Country Link
US (1) US7592613B2 (xx)
EP (1) EP2033016A4 (xx)
JP (1) JP4922398B2 (xx)
CN (1) CN101473244B (xx)
BR (1) BRPI0712302A2 (xx)
HK (1) HK1132332A1 (xx)
MX (1) MX2008014118A (xx)
RU (1) RU2420764C2 (xx)
SE (1) SE530019C2 (xx)
TW (1) TW200803928A (xx)
WO (1) WO2007145560A1 (xx)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013004565A1 (en) * 2011-07-04 2013-01-10 Tetra Laval Holdings & Finance S.A. An electron beam device and a method of manufacturing said electron beam device
JP5924981B2 (ja) * 2012-03-02 2016-05-25 三菱電機株式会社 放射線ビームモニタ装置
JP6005447B2 (ja) 2012-08-31 2016-10-12 澁谷工業株式会社 電子線検出装置
EP2737909A1 (en) * 2012-12-03 2014-06-04 Tetra Laval Holdings & Finance S.A. Device and method for irradiating packaging containers with electron beam
JP6628728B2 (ja) * 2014-02-19 2020-01-15 日立造船株式会社 電子線照射装置、および照射検出を有する照射システム
JP6363219B2 (ja) * 2014-02-26 2018-07-25 テトラ ラバル ホールディングス アンド ファイナンス エス エイ 温度測定デバイス、放射強度と相関がある温度を含む、電子線滅菌のためのデバイスおよび方法
EP3220963B1 (en) * 2014-11-18 2019-01-23 Tetra Laval Holdings & Finance SA E-beam emitter with dosimeter assembly
MY195270A (en) 2016-08-20 2023-01-11 Buehler Ag Geb Apparatuses and methods for pasteurizing and/or sterilizing par-ticulate material and cassette
CN107195519B (zh) * 2017-07-07 2023-07-11 桂林电子科技大学 一种高能带电粒子束从真空到大气的引出窗口
CN113167918A (zh) * 2018-11-23 2021-07-23 利乐拉瓦尔集团及财务有限公司 用于辐射源的测量工具和用于测量辐射的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11248893A (ja) * 1998-03-03 1999-09-17 Nissin High Voltage Co Ltd 電子線照射装置
TW464947B (en) * 1999-11-29 2001-11-21 Ushio Electric Inc Measuring apparatus of electron beam quantity and processing apparatus of electron beam irradiation
JP2001221897A (ja) * 2000-02-14 2001-08-17 Nissin High Voltage Co Ltd 電子線分布測定装置
US6919570B2 (en) 2002-12-19 2005-07-19 Advanced Electron Beams, Inc. Electron beam sensor
JP2005003564A (ja) * 2003-06-13 2005-01-06 Ushio Inc 電子ビーム管および電子ビーム取り出し用窓
SE526700C2 (sv) 2003-06-19 2005-10-25 Tetra Laval Holdings & Finance Anordning och förfarande för sterilisering av en materialbana med elektronbestrålning
SE525347C2 (sv) 2003-06-19 2005-02-08 Tetra Laval Holdings & Finance Förfarande och anordning för bestrålning med elektroner
SE0302024D0 (sv) 2003-07-08 2003-07-08 Tetra Laval Holdings & Finance Device and method for sterilization
US7368739B2 (en) * 2005-10-26 2008-05-06 Tetra Laval Holdings & Finance S.A. Multilayer detector and method for sensing an electron beam
SE529241C2 (sv) * 2005-10-26 2007-06-05 Tetra Laval Holdings & Finance Sensor samt system för avkänning av en elektronstråle
US7375345B2 (en) * 2005-10-26 2008-05-20 Tetra Laval Holdings & Finance S.A. Exposed conductor system and method for sensing an electron beam

Also Published As

Publication number Publication date
MX2008014118A (es) 2008-11-18
SE530019C2 (sv) 2008-02-12
RU2009100927A (ru) 2010-07-20
WO2007145560A1 (en) 2007-12-21
RU2420764C2 (ru) 2011-06-10
JP2009540524A (ja) 2009-11-19
BRPI0712302A2 (pt) 2012-01-17
EP2033016A4 (en) 2016-11-16
CN101473244A (zh) 2009-07-01
CN101473244B (zh) 2012-06-13
SE0601304L (sv) 2007-12-15
US20070290148A1 (en) 2007-12-20
EP2033016A1 (en) 2009-03-11
JP4922398B2 (ja) 2012-04-25
US7592613B2 (en) 2009-09-22
TW200803928A (en) 2008-01-16

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20160505