SE0000418D0 - Anordning och förfarande för uppmätniing hos ytojämnheter hos ett matobjekt - Google Patents

Anordning och förfarande för uppmätniing hos ytojämnheter hos ett matobjekt

Info

Publication number
SE0000418D0
SE0000418D0 SE0000418A SE0000418A SE0000418D0 SE 0000418 D0 SE0000418 D0 SE 0000418D0 SE 0000418 A SE0000418 A SE 0000418A SE 0000418 A SE0000418 A SE 0000418A SE 0000418 D0 SE0000418 D0 SE 0000418D0
Authority
SE
Sweden
Prior art keywords
measuring surface
surface roughness
food object
camera
generated
Prior art date
Application number
SE0000418A
Other languages
English (en)
Other versions
SE0000418L (sv
SE515711C2 (sv
Inventor
Erland Max
Peter Larsson
Original Assignee
Volvo Personvagnar Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Volvo Personvagnar Ab filed Critical Volvo Personvagnar Ab
Priority to SE0000418A priority Critical patent/SE515711C2/sv
Publication of SE0000418D0 publication Critical patent/SE0000418D0/sv
Priority to PCT/SE2001/000235 priority patent/WO2001059404A1/en
Priority to DE60136896T priority patent/DE60136896D1/de
Priority to EP01904723A priority patent/EP1192415B1/en
Publication of SE0000418L publication Critical patent/SE0000418L/sv
Publication of SE515711C2 publication Critical patent/SE515711C2/sv
Priority to US09/682,712 priority patent/US6577404B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE0000418A 2000-02-09 2000-02-09 Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt SE515711C2 (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE0000418A SE515711C2 (sv) 2000-02-09 2000-02-09 Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt
PCT/SE2001/000235 WO2001059404A1 (en) 2000-02-09 2001-02-08 Arrangement and method for measuring surface irregularities at an object
DE60136896T DE60136896D1 (de) 2000-02-09 2001-02-08 Vorrichtung und methode zum messen von oberflächenunebenheiten eines objekts
EP01904723A EP1192415B1 (en) 2000-02-09 2001-02-08 Arrangement and method for measuring surface irregularities at an object
US09/682,712 US6577404B2 (en) 2000-02-09 2001-10-09 Arrangement and method for measuring surface irregularities

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0000418A SE515711C2 (sv) 2000-02-09 2000-02-09 Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt

Publications (3)

Publication Number Publication Date
SE0000418D0 true SE0000418D0 (sv) 2000-02-09
SE0000418L SE0000418L (sv) 2001-08-10
SE515711C2 SE515711C2 (sv) 2001-10-01

Family

ID=20278392

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0000418A SE515711C2 (sv) 2000-02-09 2000-02-09 Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt

Country Status (5)

Country Link
US (1) US6577404B2 (sv)
EP (1) EP1192415B1 (sv)
DE (1) DE60136896D1 (sv)
SE (1) SE515711C2 (sv)
WO (1) WO2001059404A1 (sv)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1400802A1 (en) * 2002-09-23 2004-03-24 Ford Global Technologies, Inc. Method and arrangement for detecting and evaluating surface irregularities
DE102004052508B4 (de) * 2004-10-21 2006-08-03 Pixargus Gmbh System und Verfahren zum Vermessen und zum Überwachen der Oberfläche eines Körpers
JP5084398B2 (ja) * 2007-08-24 2012-11-28 キヤノン株式会社 測定装置、測定方法、及び、プログラム
US8643717B2 (en) * 2009-03-04 2014-02-04 Hand Held Products, Inc. System and method for measuring irregular objects with a single camera
JP6308880B2 (ja) * 2014-06-09 2018-04-11 株式会社キーエンス 画像検査装置
US9261354B1 (en) * 2014-10-24 2016-02-16 Edward J. Mercado System and process for measuring deflection

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4212073A (en) * 1978-12-13 1980-07-08 Balasubramanian N Method and system for surface contouring
JPS57132044A (en) * 1981-02-10 1982-08-16 Hitachi Metals Ltd Discriminating method of surface defect
JPS61293657A (ja) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
US4792696A (en) * 1987-06-05 1988-12-20 Trustees Of Columbia University In The City Of New York Method and an apparatus for determining surface shape utilizing object self-shadowing
JPH04279848A (ja) * 1991-03-08 1992-10-05 Kawasaki Steel Corp 熱間圧延における鋼板表面状態観察装置及び観察方法
SE508822C2 (sv) * 1997-02-17 1998-11-09 Volvo Ab Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta
DE19749435B4 (de) * 1997-11-09 2005-06-02 Mähner, Bernward Verfahren und Vorrichtung zur dreidimensionalen, flächenhaften, optischen Vermessung von Objekten
AT406528B (de) * 1998-05-05 2000-06-26 Oesterr Forsch Seibersdorf Verfahren und einrichtung zur feststellung, insbesondere zur visualisierung, von fehlern auf der oberfläche von gegenständen
US6177682B1 (en) * 1998-10-21 2001-01-23 Novacam Tyechnologies Inc. Inspection of ball grid arrays (BGA) by using shadow images of the solder balls
SE511985C2 (sv) * 1999-01-28 2000-01-10 Skogsind Tekn Foskningsinst Topografisk bestämning av en av infallande ljus belyst yta

Also Published As

Publication number Publication date
EP1192415A1 (en) 2002-04-03
EP1192415B1 (en) 2008-12-10
SE0000418L (sv) 2001-08-10
WO2001059404A1 (en) 2001-08-16
SE515711C2 (sv) 2001-10-01
US6577404B2 (en) 2003-06-10
US20020093664A1 (en) 2002-07-18
DE60136896D1 (de) 2009-01-22

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Legal Events

Date Code Title Description
NUG Patent has lapsed