SE0000418D0 - Anordning och förfarande för uppmätniing hos ytojämnheter hos ett matobjekt - Google Patents
Anordning och förfarande för uppmätniing hos ytojämnheter hos ett matobjektInfo
- Publication number
- SE0000418D0 SE0000418D0 SE0000418A SE0000418A SE0000418D0 SE 0000418 D0 SE0000418 D0 SE 0000418D0 SE 0000418 A SE0000418 A SE 0000418A SE 0000418 A SE0000418 A SE 0000418A SE 0000418 D0 SE0000418 D0 SE 0000418D0
- Authority
- SE
- Sweden
- Prior art keywords
- measuring surface
- surface roughness
- food object
- camera
- generated
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0000418A SE515711C2 (sv) | 2000-02-09 | 2000-02-09 | Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt |
DE60136896T DE60136896D1 (de) | 2000-02-09 | 2001-02-08 | Vorrichtung und methode zum messen von oberflächenunebenheiten eines objekts |
EP01904723A EP1192415B1 (en) | 2000-02-09 | 2001-02-08 | Arrangement and method for measuring surface irregularities at an object |
PCT/SE2001/000235 WO2001059404A1 (en) | 2000-02-09 | 2001-02-08 | Arrangement and method for measuring surface irregularities at an object |
US09/682,712 US6577404B2 (en) | 2000-02-09 | 2001-10-09 | Arrangement and method for measuring surface irregularities |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0000418A SE515711C2 (sv) | 2000-02-09 | 2000-02-09 | Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt |
Publications (3)
Publication Number | Publication Date |
---|---|
SE0000418D0 true SE0000418D0 (sv) | 2000-02-09 |
SE0000418L SE0000418L (sv) | 2001-08-10 |
SE515711C2 SE515711C2 (sv) | 2001-10-01 |
Family
ID=20278392
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0000418A SE515711C2 (sv) | 2000-02-09 | 2000-02-09 | Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt |
Country Status (5)
Country | Link |
---|---|
US (1) | US6577404B2 (sv) |
EP (1) | EP1192415B1 (sv) |
DE (1) | DE60136896D1 (sv) |
SE (1) | SE515711C2 (sv) |
WO (1) | WO2001059404A1 (sv) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1400802A1 (en) * | 2002-09-23 | 2004-03-24 | Ford Global Technologies, Inc. | Method and arrangement for detecting and evaluating surface irregularities |
DE102004052508B4 (de) * | 2004-10-21 | 2006-08-03 | Pixargus Gmbh | System und Verfahren zum Vermessen und zum Überwachen der Oberfläche eines Körpers |
JP5084398B2 (ja) * | 2007-08-24 | 2012-11-28 | キヤノン株式会社 | 測定装置、測定方法、及び、プログラム |
US8643717B2 (en) * | 2009-03-04 | 2014-02-04 | Hand Held Products, Inc. | System and method for measuring irregular objects with a single camera |
JP6308880B2 (ja) * | 2014-06-09 | 2018-04-11 | 株式会社キーエンス | 画像検査装置 |
US9261354B1 (en) * | 2014-10-24 | 2016-02-16 | Edward J. Mercado | System and process for measuring deflection |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4212073A (en) * | 1978-12-13 | 1980-07-08 | Balasubramanian N | Method and system for surface contouring |
JPS57132044A (en) * | 1981-02-10 | 1982-08-16 | Hitachi Metals Ltd | Discriminating method of surface defect |
JPS61293657A (ja) * | 1985-06-21 | 1986-12-24 | Matsushita Electric Works Ltd | 半田付け外観検査方法 |
US4792696A (en) * | 1987-06-05 | 1988-12-20 | Trustees Of Columbia University In The City Of New York | Method and an apparatus for determining surface shape utilizing object self-shadowing |
JPH04279848A (ja) * | 1991-03-08 | 1992-10-05 | Kawasaki Steel Corp | 熱間圧延における鋼板表面状態観察装置及び観察方法 |
SE508822C2 (sv) * | 1997-02-17 | 1998-11-09 | Volvo Ab | Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta |
DE19749435B4 (de) * | 1997-11-09 | 2005-06-02 | Mähner, Bernward | Verfahren und Vorrichtung zur dreidimensionalen, flächenhaften, optischen Vermessung von Objekten |
AT406528B (de) * | 1998-05-05 | 2000-06-26 | Oesterr Forsch Seibersdorf | Verfahren und einrichtung zur feststellung, insbesondere zur visualisierung, von fehlern auf der oberfläche von gegenständen |
US6177682B1 (en) * | 1998-10-21 | 2001-01-23 | Novacam Tyechnologies Inc. | Inspection of ball grid arrays (BGA) by using shadow images of the solder balls |
SE511985C2 (sv) * | 1999-01-28 | 2000-01-10 | Skogsind Tekn Foskningsinst | Topografisk bestämning av en av infallande ljus belyst yta |
-
2000
- 2000-02-09 SE SE0000418A patent/SE515711C2/sv not_active IP Right Cessation
-
2001
- 2001-02-08 EP EP01904723A patent/EP1192415B1/en not_active Expired - Lifetime
- 2001-02-08 WO PCT/SE2001/000235 patent/WO2001059404A1/en active Application Filing
- 2001-02-08 DE DE60136896T patent/DE60136896D1/de not_active Expired - Lifetime
- 2001-10-09 US US09/682,712 patent/US6577404B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20020093664A1 (en) | 2002-07-18 |
SE515711C2 (sv) | 2001-10-01 |
EP1192415B1 (en) | 2008-12-10 |
DE60136896D1 (de) | 2009-01-22 |
SE0000418L (sv) | 2001-08-10 |
US6577404B2 (en) | 2003-06-10 |
EP1192415A1 (en) | 2002-04-03 |
WO2001059404A1 (en) | 2001-08-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |