RU96119926A - INTERFEROMETER AND FOURIER TRANSFORMATION SPECTROMETER - Google Patents

INTERFEROMETER AND FOURIER TRANSFORMATION SPECTROMETER

Info

Publication number
RU96119926A
RU96119926A RU96119926/25A RU96119926A RU96119926A RU 96119926 A RU96119926 A RU 96119926A RU 96119926/25 A RU96119926/25 A RU 96119926/25A RU 96119926 A RU96119926 A RU 96119926A RU 96119926 A RU96119926 A RU 96119926A
Authority
RU
Russia
Prior art keywords
reflectors
interferometer
reflector
interferometer according
beam splitter
Prior art date
Application number
RU96119926/25A
Other languages
Russian (ru)
Other versions
RU2150090C1 (en
Inventor
Ларссон Кай
Original Assignee
Опсис АБ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SE9400819A external-priority patent/SE503758C2/en
Application filed by Опсис АБ filed Critical Опсис АБ
Publication of RU96119926A publication Critical patent/RU96119926A/en
Application granted granted Critical
Publication of RU2150090C1 publication Critical patent/RU2150090C1/en

Links

Claims (8)

1. Интерферометр, содержащий расщепитель луча, который предназначен для образования первого и второго лучей из падающего пучка (Bin), и первый и второй отражатели (М1, М2), предназначенные для приема соответственно первого и второго лучей и для отражения их назад в расщепитель луча, отличающийся тем, что первый и второй отражатели соединены неподвижно и предназначены для по существу линейного перемещения для изменения различия в длине пути между первым и вторым лучами, причем интерферометр дополнительно содержит третий отражатель (М3), который расположен на пути первого луча между расщепителем луча (BS) и первым отражателем (М1), и четвертый отражатель (М4), который расположен на пути второго луча между расщепителем луча (BS) и вторым отражателем (М2), причем расщепитель луча (BS), третий отражатель (М3) и четвертый отражатель (М4) расположены ортогонально.1. An interferometer containing a beam splitter that is designed to form the first and second rays from the incident beam (Bin), and the first and second reflectors (M1, M2), designed to receive the first and second rays, respectively, and to reflect them back into the beam splitter characterized in that the first and second reflectors are connected stationary and are intended for essentially linear movement to change the difference in the path length between the first and second beams, the interferometer further comprising a third reflector (M3), which located on the path of the first beam between the beam splitter (BS) and the first reflector (M1), and the fourth reflector (M4), which is located on the path of the second beam between the beam splitter (BS) and the second reflector (M2), and the beam splitter (BS) , the third reflector (M3) and the fourth reflector (M4) are located orthogonally. 2. Интерферометр по п. 1, отличающийся тем, что пятый и шестой отражатели расположены на путях первого луча и второго луча соответственно. 2. The interferometer according to claim 1, characterized in that the fifth and sixth reflectors are located on the paths of the first beam and the second beam, respectively. 3. Интерферометр по п. 2, отличающийся тем, что пятый и шестой отражатели расположены между расщепителем луча (BS) и соответственно третьим и четвертым отражателями (М3, М4). 3. The interferometer according to claim 2, characterized in that the fifth and sixth reflectors are located between the beam splitter (BS) and the third and fourth reflectors (M3, M4), respectively. 4. Интерферометр по п. 2, отличающийся тем, что пятый и шестой отражатели расположены между первым и третьим отражателями (М1, М3) и между вторым и четвертым отражателями (М2, М4) соответственно. 4. The interferometer according to claim 2, characterized in that the fifth and sixth reflectors are located between the first and third reflectors (M1, M3) and between the second and fourth reflectors (M2, M4), respectively. 5. Интерферометр по любому из предшествующих пунктов, отличающийся тем, что третий и четвертый отражатели (М3, М4) являются плоскими зеркалами. 5. The interferometer according to any one of the preceding paragraphs, characterized in that the third and fourth reflectors (M3, M4) are flat mirrors. 6. Интерферометр по любому из предшествующих пунктов, отличающийся тем, что первый и второй отражатели (М1, М2) - плоские зеркала. 6. The interferometer according to any one of the preceding paragraphs, characterized in that the first and second reflectors (M1, M2) are flat mirrors. 7. Интерферометр по любому из пп. 2 - 6, отличающийся тем, что пятый и шестой отражатели - плоские зеркала. 7. Interferometer according to any one of paragraphs. 2 to 6, characterized in that the fifth and sixth reflectors are flat mirrors. 8. Спектрометр преобразования Фурье, содержащий интерферометр по любому из пп. 1 - 7. 8. Fourier transform spectrometer containing an interferometer according to any one of paragraphs. 1 - 7.
RU96119926A 1994-03-10 1995-03-09 Fourier transform interferometer and spectrometer RU2150090C1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE9400819-0 1994-03-10
SE9400819A SE503758C2 (en) 1994-03-10 1994-03-10 Interferometer and Fourier Transform Spectrometer
PCT/SE1995/000248 WO1995024619A1 (en) 1994-03-10 1995-03-09 Interferometre and fourier transform spectrometer

Publications (2)

Publication Number Publication Date
RU96119926A true RU96119926A (en) 1998-12-10
RU2150090C1 RU2150090C1 (en) 2000-05-27

Family

ID=20393239

Family Applications (1)

Application Number Title Priority Date Filing Date
RU96119926A RU2150090C1 (en) 1994-03-10 1995-03-09 Fourier transform interferometer and spectrometer

Country Status (13)

Country Link
US (1) US5650848A (en)
EP (1) EP0749566B1 (en)
JP (1) JP3805787B2 (en)
KR (1) KR100385438B1 (en)
CN (1) CN1079157C (en)
AT (1) ATE185422T1 (en)
AU (1) AU2088895A (en)
CA (1) CA2185006C (en)
DE (1) DE69512640T2 (en)
RU (1) RU2150090C1 (en)
SE (1) SE503758C2 (en)
TW (1) TW261663B (en)
WO (1) WO1995024619A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK78096A (en) * 1996-07-12 1998-01-13 Foss Electric As Interferometer
US20030020924A1 (en) * 2001-06-19 2003-01-30 Fuyuhiko Inoue Interferometer system
CN100385213C (en) * 2003-09-18 2008-04-30 中国科学院西安光学精密机械研究所 Data processing method for interference type hyperspectral imager
CN100401027C (en) * 2005-07-23 2008-07-09 中国科学院西安光学精密机械研究所 Imaging method of high-stability interference imaging spectrometer and spectrometer for implementing same
CN100485331C (en) * 2005-10-09 2009-05-06 中国科学院西安光学精密机械研究所 Imaging method of high-stability interference imaging spectrometer and spectrometer for implementing same
CN100443869C (en) * 2005-10-09 2008-12-17 中国科学院西安光学精密机械研究所 High-stability high-spectral-resolution interference imaging spectrometer imaging method and spectrometer
CN101532880B (en) * 2008-03-12 2010-12-15 中国科学院西安光学精密机械研究所 Double-moving-mirror interferometer
DE102016103295A1 (en) 2016-02-24 2017-08-24 Martin Berz Three-dimensional interferometer and method for determining a phase of an electric field
US9952031B1 (en) * 2016-10-26 2018-04-24 University Corporation For Atmospheric Research Interferometer

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4165183A (en) * 1977-08-26 1979-08-21 The United States Of America As Represented By The Secretary Of Commerce Fringe counting interferometric system for high accuracy measurements
DE3005520C2 (en) * 1980-02-14 1983-05-05 Kayser-Threde GmbH, 8000 München Two-beam interferometer for Fourier spectroscopy
US4319843A (en) * 1980-02-25 1982-03-16 Burleigh Instruments, Inc. Interferometer apparatus for the direct measurement of wavelength and frequency
GB2163548B (en) * 1984-08-09 1987-11-25 Perkin Elmer Ltd Interferometric apparatus particularly for use in ft spectrophotometer
DE3736694A1 (en) * 1987-10-29 1989-06-01 Kayser Threde Gmbh METHOD AND DEVICE FOR THE CONTACTLESS DRIVE OF A DOUBLE PENDULUM INTERFEROMETER
US5150172A (en) * 1988-01-11 1992-09-22 Nicolet Instrument Corporation Interferometer spectrometer having tiltable reflector assembly and reflector assembly therefor
EP0369054B1 (en) * 1988-11-17 1993-09-01 Erwin Kayser-Threde Gesellschaft mit beschränkter Haftung Arrangement of reflectors for a michelson interferometer
US5159405A (en) * 1989-10-28 1992-10-27 Horiba, Ltd. Multibeam interferometer for use in a fourier transform spectrometer and a driving device for moving the mirrors used therein
GB9027480D0 (en) * 1990-12-19 1991-02-06 Philips Electronic Associated Interferometer

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