RU2724129C1 - Contact device for testing microcircuits - Google Patents

Abstract

FIELD: microelectronic equipment.

SUBSTANCE: invention relates to the field of microelectronic equipment, in particular, to methods of electric and functional control and testing of microcircuits in cases. Contact device for testing microcircuits comprises base of separator, on which there is separator with contacts, clamp contacts to outputs of microcircuit chip provides clamp, having base, clamping screw, installed in threaded bushing, latches installed on a spring-loaded axis in the clamp base, which provide for engagement of collar beads, clamp pressing the spring-loaded screws. Separator has holes corresponding to dimensions of flat contact, and in them are arranged with possibility of dismantling flat contacts having oval shape, supplemented with rectangular lobe on long side of oval and semi-circular lobes on other side of oval, in the contact center an oval hole is made so that the contact width is the same.

EFFECT: disclosed is a contact device for testing microcircuits.

1 cl, 4 dwg

Description

The invention relates to the field of microelectronic technology, in particular to methods for electrical and functional control and testing of microcircuits in buildings.

The prior art known contact device for testing microcircuits (see JP2003133022, publ. 09.05.2003), which has a socket - base for mounting the integrated circuit. The socket consists of a socket body on which a pedestal is mounted, a frame-shaped closing element mounted with the ability to move up and down with respect to the socket body and a clamping mechanism that holds the integrated circuit case mounted on the mounting part of the package. The clamping mechanism has a clamping element mounted so that it can carry out an elastic displacement of the end portion of the clamping lever element.

The closest analogue of the claimed invention can be selected contact device for electrotraining microcircuits (see US4824392, publ. 04/25/1989). This contact device contains many electrical contacts located inside the respective wells. The contacts include sections extending beyond the bottom surface of the contact device for mounting by soldering into the holes of the printed circuit board and elastic contact sections that directly provide contact with the terminals of the microchip during compression;

The main disadvantage of these analogues is that the contacts of the device for testing microcircuits are connected to the measuring system by soldering, and thus makes it difficult to replace a failed contact. Also, the disadvantage of the given analogues is the large length of the contacts themselves, which reduces the permissible private range of measurements and tests.

The technical result of the claimed device is to increase manufacturability, due to the ability to easily replace the contacting device as a whole, or to replace individual contacts and improve the frequency characteristics of the measuring system.

The claimed technical result is achieved by creating a contact device for testing microcircuits containing a separator base and a separator with contacts located between them. Clamping the contacts to the terminals of the microcircuit provides a clamp. The clamp consists of a base, a clamping screw rotating in a threaded sleeve, spring-loaded latches installed on the axes at the base of the clamp and providing engagement of the sides of the shell, and a clamp made of insulating material. The clamp is connected to the clamp base with two spring-loaded screws, which ensure its return when the clamp screw is loosened. The separator made holes corresponding to the dimensions of the flat contact and placed, with the possibility of dismantling, flat contacts having an oval shape, complemented by a rectangular petal on the long side of the oval and a semicircular petal on the other side of the oval. An oval hole is made on the vertical axis of the contact so that the width of the side contact petals is the same.

The claimed invention is illustrated by the following figures:

Figure 1 shows an axial section of a contact device for testing microcircuits.

In FIG. 2 shows the contacting device in the initial state.

Figure 3 presents the contacting device with the installed clip.

Figure 4 presents the contacting device in the working position.

The positions in figure 1-4 indicate the following:

1 - the base of the separator;

2 - separator;

3 - shell;

4 - clamp;

5 - a spacer;

6 - base clamp;

7 - clamping screw;

8 - flywheel;

9 - latch;

10 - axis;

11 - torsion spring;

12 - sleeve;

13 - screw;

14 - flat contact;

15 - microcircuit;

16 - protrusions of the separator;

17 - inclined faces of the protrusions;

18 - a comb of protrusions;

19 - shell;

20 - spring;

21 - the findings of the chip;

22 - printed circuit board measuring system.

The contact device for testing microcircuits is intended for testing microcircuits in housings. For this, the microcircuit is fixed in the device by clamping to the contacts, which are connected when pressed with the terminals of the microcircuit. The clamp has a base, a clamping screw fixed to the sleeve, latches mounted on a spring axis in the base, providing engagement of the sides of the shell, a clamp that clamps the spring-loaded screws. The separator has openings corresponding to the dimensions of the flat contact and flat contacts having an oval shape, complemented by a rectangular petal on the long side of the oval and a semicircular petal on the other groan of the oval, placed in the center of the contact with an oval hole so that the width of the side The contact petals are the same.

The flat contact is made in the form of a design with two parallel electrically conductive branches, while the base material is BrB2M beryllium bronze. Flat contact can be cut on an EDM machine with subsequent processing of the working contact surfaces from burrs and dross, annealing the flat contact to relieve internal stresses and processing the flat contact surface to remove oxides. Next, the flat contact is coated with gold with a thickness of 1-3 microns and polished work surfaces.

The presence of side lobes allows you to strengthen the spring properties, expand the frequency range and reduce contact resistance. The proposed symmetrical shape avoids the need to solder the contacting device to the board, which greatly accelerates the process of replacing it in the event of a failure or the contact resource is exhausted. In addition, the need to expose the printed circuit board of the measuring system to soldering the contacting device is eliminated by thermal and mechanical stresses.

The contacting device is intended for use in manual and automatic modes in a horizontal position and works as follows.

In the initial state shown in FIG. 2, the clip is separated from the contacting device. The microcircuit (15) is installed on the separator of the contacting device (2). The correct position of the chip relative to the contacting device is provided in two stages. Rough alignment is ensured by four protrusions on the separator (16). This leveling stage is provided by the inclined faces of the protrusions (17) and the action of gravity. Simply put, the chip slides to the desired position under its own weight. The final alignment of the terminals of the microcircuit with respect to the contacts of the KU is ensured by a comb of protrusions (18) on the separator, also having beveled faces.

Before installing it on the contacting device, the clamping screw (7) with the handwheel (8) is moved to a position that provides the minimum distance between the clamp (4) and the base of the clamp (6)

After installing the microcircuit and its correct positioning, a clamp is installed on the contacting device and the side latches (9) are engaged with the shell (19).

A contact device with an integrated microcircuit and a clamp is shown in FIG. 4. Using the handwheel, the clamping screw is screwed, allowing the clamp to move down. Through the terminals of the microcircuit (21), the clamping force is transmitted to the ring contact (14), ensuring its elastic deformation. The compressive strength of the ring contact ensures reliable contacting of the terminals of the microcircuit, the ring contact and the printed circuit board of the measuring system (22). The shape of the wells of the base of the separator and separator ensure the absence of displacement of the annular contact in the horizontal plane. After the measurements, the clamping screw is unscrewed, the clamp, under the action of the springs (20), releases the microcircuit pins and ring contacts, the latches are removed from the engagement position with the shell, and the microcircuit is removed from the contacting device.

In the automated measurement mode, the clamp function is performed by an automatic sorter, the structure of which includes a clamp.

Thus, the application of the claimed invention improves the reliability characteristics, simplifies the mounting of the contacting device on the board, reduces the contact transition resistance and extends the frequency range of the measuring system.

Claims (1)

A contact device for testing microcircuits containing a separator base on which a separator with contacts is located, a contact clamp to the terminals of the microcircuit provides a clamp having a base, a clamping screw installed in the threaded sleeve, latches mounted on a spring-loaded axis in the clamp base, which ensure engagement of the sides of the shell , a clamp that presses the spring-loaded screws, characterized in that the separator has holes corresponding to the dimensions of the flat contact, and flat contacts having an oval shape, complemented by a rectangular petal on the long side of the oval and a semicircular petal on the other side of the oval are placed with the possibility of dismantling an oval hole is made in the center of the contact so that the width of the contact is the same.

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