RU2020116530A3 - - Google Patents

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Publication number
RU2020116530A3
RU2020116530A3 RU2020116530A RU2020116530A RU2020116530A3 RU 2020116530 A3 RU2020116530 A3 RU 2020116530A3 RU 2020116530 A RU2020116530 A RU 2020116530A RU 2020116530 A RU2020116530 A RU 2020116530A RU 2020116530 A3 RU2020116530 A3 RU 2020116530A3
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RU
Russia
Application number
RU2020116530A
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RU2020116530A (ru
RU2768110C2 (ru
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of RU2020116530A publication Critical patent/RU2020116530A/ru
Publication of RU2020116530A3 publication Critical patent/RU2020116530A3/ru
Application granted granted Critical
Publication of RU2768110C2 publication Critical patent/RU2768110C2/ru

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/04Sorting according to size
    • B07C5/12Sorting according to size characterised by the application to particular articles, not otherwise provided for
    • B07C5/122Sorting according to size characterised by the application to particular articles, not otherwise provided for for bottles, ampoules, jars and other glassware
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/55Depth or shape recovery from multiple images
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/60Analysis of geometric attributes
    • G06T7/62Analysis of geometric attributes of area, perimeter, diameter or volume
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10116X-ray image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Electromagnetism (AREA)
  • Geometry (AREA)
  • Quality & Reliability (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
RU2020116530A 2017-10-27 2018-10-29 Способ и установка для поточного контроля размеров промышленных изделий RU2768110C2 (ru)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1760175 2017-10-27
FR1760175A FR3073043B1 (fr) 2017-10-27 2017-10-27 Procede et installation de controle dimensionnel en ligne d'objets manufactures
PCT/FR2018/052681 WO2019081875A1 (fr) 2017-10-27 2018-10-29 Procédé et installation de contrôle dimensionnel en ligne d'objets manufacturés

Publications (3)

Publication Number Publication Date
RU2020116530A RU2020116530A (ru) 2021-11-29
RU2020116530A3 true RU2020116530A3 (ru) 2022-01-18
RU2768110C2 RU2768110C2 (ru) 2022-03-23

Family

ID=60923692

Family Applications (1)

Application Number Title Priority Date Filing Date
RU2020116530A RU2768110C2 (ru) 2017-10-27 2018-10-29 Способ и установка для поточного контроля размеров промышленных изделий

Country Status (11)

Country Link
US (1) US11493334B2 (ru)
EP (1) EP3701221B1 (ru)
JP (1) JP7323517B2 (ru)
CN (1) CN111279148B (ru)
BR (1) BR112020007591B1 (ru)
ES (1) ES2885230T3 (ru)
FR (1) FR3073043B1 (ru)
MX (1) MX2020004360A (ru)
PL (1) PL3701221T3 (ru)
RU (1) RU2768110C2 (ru)
WO (1) WO2019081875A1 (ru)

Families Citing this family (11)

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Publication number Priority date Publication date Assignee Title
US9102055B1 (en) * 2013-03-15 2015-08-11 Industrial Perception, Inc. Detection and reconstruction of an environment to facilitate robotic interaction with the environment
FR3074907B1 (fr) * 2017-12-08 2019-12-27 Tiama Methode et machine pour controler un procede de formage
FR3095508B1 (fr) 2019-04-26 2021-05-14 Tiama Procede et installation de controle dimensionnel en ligne d’objets manufactures
FR3095506B1 (fr) 2019-04-29 2021-05-07 Tiama Ligne de contrôle de récipients vides en verre
IT201900006925A1 (it) * 2019-05-16 2020-11-16 Sica Spa Sistema di controllo della qualità di lavorazione di tubi in materiale termoplastico
JP7294927B2 (ja) * 2019-07-23 2023-06-20 ファナック株式会社 相違点抽出装置
JP6755603B1 (ja) * 2019-12-25 2020-09-16 上野精機株式会社 電子部品の処理装置
IT202000004246A1 (it) * 2020-02-28 2021-08-28 Microtec Srl Apparecchiatura e metodo per eseguire una tomografia computerizzata di un oggetto che presenti forma allungata, in particolare tavole di legno
FR3111703B1 (fr) * 2020-06-18 2022-05-20 Skf Svenska Kullagerfab Ab Procédé de détection d’un défaut critique pour élément roulant en matériau céramique
US11992733B1 (en) * 2021-07-01 2024-05-28 Acushnet Company Concentricity measurement and classification system and method for golf balls and golf ball components
WO2024101477A1 (ko) * 2022-11-10 2024-05-16 제이피아이헬스케어 주식회사 실시간 인라인 디지털 단층영상 합성 시스템

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JPS60260807A (ja) * 1984-06-08 1985-12-24 Kawasaki Steel Corp 管状材の放射線透過式肉厚測定装置
US5602890A (en) * 1995-09-27 1997-02-11 Thermedics Detection Inc. Container fill level and pressurization inspection using multi-dimensional images
DE19756697A1 (de) * 1997-12-19 1999-07-01 Manfred Dr Ing Pfeiler Vorrichtung zur Stückgut-Röntgentomosynthese
US7412022B2 (en) * 2002-02-28 2008-08-12 Jupiter Clyde P Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas
FR2846425B1 (fr) * 2002-10-25 2006-04-28 Bsn Glasspack Procede et didpositif pour detecter des defauts de surface presentes par la paroi externe d'un objet transparent ou translucide
JP2004280134A (ja) * 2003-03-12 2004-10-07 Toyota Motor Corp 薄板物の3次元モデル化方法
US7221732B1 (en) 2005-04-04 2007-05-22 Martin Annis Method and apparatus for producing laminography images using a fixed x-ray source
JP4127698B2 (ja) * 2005-04-25 2008-07-30 アンリツ産機システム株式会社 X線検査装置
DE102005037101A1 (de) * 2005-08-03 2007-02-08 Krones Ag Verfahren und Vorrichtung zur Wandstärkenkontrolle
WO2007064918A1 (en) * 2005-11-30 2007-06-07 The General Hospital Corporation Lumen tracking in computed tomographic images
JP4736755B2 (ja) * 2005-11-30 2011-07-27 コニカミノルタエムジー株式会社 モデリング装置、領域抽出装置、モデリング方法及びプログラム
US7319737B2 (en) 2006-04-07 2008-01-15 Satpal Singh Laminographic system for 3D imaging and inspection
WO2007122770A1 (ja) * 2006-04-13 2007-11-01 Shimadzu Corporation 透過x線を用いた三次元定量方法
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WO2010001845A1 (ja) * 2008-07-04 2010-01-07 株式会社 日立メディコ X線ct装置
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DE102014103137A1 (de) * 2014-03-10 2015-09-10 Deutsches Krebsforschungszentrum (Dkfz) Verfahren zur Bestimmung und Korrektur von Oberflächendaten zur dimensionellen Messung mit einer Computertomografiesensorik
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FR3073044B1 (fr) * 2017-10-27 2020-10-02 Tiama Procede et dispositif de mesure de dimensions par rayons x, sur des recipients en verre vide defilant en ligne

Also Published As

Publication number Publication date
FR3073043B1 (fr) 2019-11-15
EP3701221A1 (fr) 2020-09-02
MX2020004360A (es) 2020-08-03
US20200300619A1 (en) 2020-09-24
WO2019081875A1 (fr) 2019-05-02
RU2020116530A (ru) 2021-11-29
BR112020007591A2 (pt) 2020-09-24
CN111279148B (zh) 2022-08-30
EP3701221B1 (fr) 2021-07-21
RU2768110C2 (ru) 2022-03-23
US11493334B2 (en) 2022-11-08
ES2885230T3 (es) 2021-12-13
JP7323517B2 (ja) 2023-08-08
CN111279148A (zh) 2020-06-12
BR112020007591B1 (pt) 2023-11-14
PL3701221T3 (pl) 2021-12-13
JP2021500571A (ja) 2021-01-07
FR3073043A1 (fr) 2019-05-03

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