FR3111703B1 - Procédé de détection d’un défaut critique pour élément roulant en matériau céramique - Google Patents

Procédé de détection d’un défaut critique pour élément roulant en matériau céramique Download PDF

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Publication number
FR3111703B1
FR3111703B1 FR2006367A FR2006367A FR3111703B1 FR 3111703 B1 FR3111703 B1 FR 3111703B1 FR 2006367 A FR2006367 A FR 2006367A FR 2006367 A FR2006367 A FR 2006367A FR 3111703 B1 FR3111703 B1 FR 3111703B1
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FR
France
Prior art keywords
rolling element
detecting
ceramic material
element made
zone
Prior art date
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Active
Application number
FR2006367A
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English (en)
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FR3111703A1 (fr
Inventor
Herve Carrerot
Michael Boettger
Victor Brizmer
Yoann Hebrard
Charlotte Vieillard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SKF Aerospace France SAS
SKF AB
Original Assignee
SKF Aerospace France SAS
SKF AB
Svenska Kullagerfabriken AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Application filed by SKF Aerospace France SAS, SKF AB, Svenska Kullagerfabriken AB filed Critical SKF Aerospace France SAS
Priority to FR2006367A priority Critical patent/FR3111703B1/fr
Priority to GB2104390.6A priority patent/GB2596181B/en
Priority to KR1020210050222A priority patent/KR20210157307A/ko
Priority to US17/306,024 priority patent/US11650170B2/en
Priority to CN202110542995.4A priority patent/CN113822843A/zh
Priority to CA3119139A priority patent/CA3119139A1/fr
Priority to JP2021086084A priority patent/JP2021196351A/ja
Priority to DE102021205895.7A priority patent/DE102021205895A1/de
Publication of FR3111703A1 publication Critical patent/FR3111703A1/fr
Application granted granted Critical
Publication of FR3111703B1 publication Critical patent/FR3111703B1/fr
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G01M13/04—Bearings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
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    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/10—Image enhancement or restoration using non-spatial domain filtering
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
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    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/90—Determination of colour characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/414—Imaging stereoscopic system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/426—Imaging image comparing, unknown with known substance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G01N2223/6466—Specific applications or type of materials flaws, defects flaws comparing to predetermined standards
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G06T2207/10012—Stereo images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G06T2207/10124—Digitally reconstructed radiograph [DRR]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20024—Filtering details

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Computer Graphics (AREA)
  • Geometry (AREA)
  • Software Systems (AREA)
  • Pulmonology (AREA)
  • Multimedia (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Procédé de détection d’au moins un défaut critique pour élément roulant en matériau céramique (2), caractérisé en ce qu’il comporte : - une capture d’une pluralité d’images radiographiques numériques bidimensionnelles (E4) de l’élément roulant (2); - un filtrage numérique de chaque image radiographique (E5); - une délimitation à partir de l’image filtrée d’au moins une zone susceptible de comprendre le défaut critique (E6); - une construction stéréoscopique d’un modèle virtuel de l’élément roulant (2) comportant ladite zone (E6) ; - une comparaison des dimensions de la zone délimitée avec une pluralité de valeurs seuil prédéterminées (E7), et lorsque les dimensions sont supérieures aux valeurs seuil, une génération d’un signal d’alarme (E8). Référence pour la figure : Fig.2
FR2006367A 2020-06-18 2020-06-18 Procédé de détection d’un défaut critique pour élément roulant en matériau céramique Active FR3111703B1 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR2006367A FR3111703B1 (fr) 2020-06-18 2020-06-18 Procédé de détection d’un défaut critique pour élément roulant en matériau céramique
GB2104390.6A GB2596181B (en) 2020-06-18 2021-03-29 Method for detecting a critical defect in a ceramic rolling element
KR1020210050222A KR20210157307A (ko) 2020-06-18 2021-04-19 세라믹 롤링 요소의 중대한 결함을 검출하는 방법
US17/306,024 US11650170B2 (en) 2020-06-18 2021-05-03 Method for detecting a critical defect in a ceramic rolling element
CN202110542995.4A CN113822843A (zh) 2020-06-18 2021-05-18 用于检测陶瓷滚动元件中的关键缺陷的方法
CA3119139A CA3119139A1 (fr) 2020-06-18 2021-05-19 Methode de detection d`un defaut critique dans un element de roulage en ceramique
JP2021086084A JP2021196351A (ja) 2020-06-18 2021-05-21 セラミック転動体の重大な欠陥を検出する方法
DE102021205895.7A DE102021205895A1 (de) 2020-06-18 2021-06-10 Verfahren zum Detektieren eines kritischen Defekts in einem keramischen Walzkörper

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2006367 2020-06-18
FR2006367A FR3111703B1 (fr) 2020-06-18 2020-06-18 Procédé de détection d’un défaut critique pour élément roulant en matériau céramique

Publications (2)

Publication Number Publication Date
FR3111703A1 FR3111703A1 (fr) 2021-12-24
FR3111703B1 true FR3111703B1 (fr) 2022-05-20

Family

ID=72266588

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2006367A Active FR3111703B1 (fr) 2020-06-18 2020-06-18 Procédé de détection d’un défaut critique pour élément roulant en matériau céramique

Country Status (8)

Country Link
US (1) US11650170B2 (fr)
JP (1) JP2021196351A (fr)
KR (1) KR20210157307A (fr)
CN (1) CN113822843A (fr)
CA (1) CA3119139A1 (fr)
DE (1) DE102021205895A1 (fr)
FR (1) FR3111703B1 (fr)
GB (1) GB2596181B (fr)

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5182775A (en) * 1990-01-12 1993-01-26 Kawasaki Jukogyo Kabushiki Kaisha Method of processing radiographic image data for detecting a welding defect
JP4660998B2 (ja) * 2001-07-31 2011-03-30 トヨタ自動車株式会社 接合検査装置
US6873680B2 (en) * 2003-05-02 2005-03-29 Siemens Westinghouse Power Corporation Method and apparatus for detecting defects using digital radiography
JP2005283547A (ja) * 2004-03-31 2005-10-13 Ngk Insulators Ltd セラミック構造体の検査方法
JP4211702B2 (ja) * 2004-05-12 2009-01-21 トヨタ自動車株式会社 鋳巣計測方法
US8204291B2 (en) * 2007-10-15 2012-06-19 General Electric Company Method and system for identifying defects in a radiographic image of a scanned object
JP4404159B2 (ja) * 2008-01-21 2010-01-27 凸版印刷株式会社 検査方法
DE102010056042A1 (de) * 2010-12-23 2012-06-28 Yxlon International Gmbh Verfahren und Vorrichtung zur Sichtprüfung eines mittels Röntgenstrahlung zu überprüfenden Prüfobjekts
JP5922892B2 (ja) 2011-08-26 2016-05-24 Ntn株式会社 転動体の検査方法および転動体の製造方法
GB201504471D0 (en) * 2015-03-17 2015-04-29 Johnson Matthey Plc Apparatus and method for scanning a structure
CA3031397A1 (fr) * 2016-07-22 2018-01-25 Lynx Inspection Inc. Procede d'inspection destine a un article manufacture et systeme d'execution dudit procede d'inspection
US11047806B2 (en) * 2016-11-30 2021-06-29 Kla-Tencor Corporation Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures
CN110914637B (zh) * 2017-05-23 2022-03-25 Lm风力发电国际技术有限公司 用于检测细长结构中的纤维错位的双扫描方法
EP3702765B1 (fr) * 2017-10-23 2023-07-19 Toray Industries, Inc. Procédé d'inspection et procédé de fabrication pour produit en résine moulé ainsi que dispositif d'inspection et dispositif de fabrication pour produit en résine moulé
FR3073043B1 (fr) * 2017-10-27 2019-11-15 Tiama Procede et installation de controle dimensionnel en ligne d'objets manufactures

Also Published As

Publication number Publication date
GB2596181B (en) 2024-07-17
DE102021205895A1 (de) 2021-12-23
JP2021196351A (ja) 2021-12-27
CA3119139A1 (fr) 2021-12-18
FR3111703A1 (fr) 2021-12-24
US20210396686A1 (en) 2021-12-23
KR20210157307A (ko) 2021-12-28
GB202104390D0 (en) 2021-05-12
CN113822843A (zh) 2021-12-21
US11650170B2 (en) 2023-05-16
GB2596181A (en) 2021-12-22

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