PL3701221T3 - Sposób i instalacja do kontroli wymiarowej na linii wytwarzanych obiektów - Google Patents

Sposób i instalacja do kontroli wymiarowej na linii wytwarzanych obiektów

Info

Publication number
PL3701221T3
PL3701221T3 PL18803752T PL18803752T PL3701221T3 PL 3701221 T3 PL3701221 T3 PL 3701221T3 PL 18803752 T PL18803752 T PL 18803752T PL 18803752 T PL18803752 T PL 18803752T PL 3701221 T3 PL3701221 T3 PL 3701221T3
Authority
PL
Poland
Prior art keywords
facility
dimensional control
manufactured objects
line dimensional
line
Prior art date
Application number
PL18803752T
Other languages
English (en)
Inventor
Laurent COSNEAU
Olivier Colle
Original Assignee
Tiama
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tiama filed Critical Tiama
Publication of PL3701221T3 publication Critical patent/PL3701221T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/04—Sorting according to size
    • B07C5/12—Sorting according to size characterised by the application to particular articles, not otherwise provided for
    • B07C5/122—Sorting according to size characterised by the application to particular articles, not otherwise provided for for bottles, ampoules, jars and other glassware
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Electromagnetism (AREA)
  • Quality & Reliability (AREA)
  • Geometry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
PL18803752T 2017-10-27 2018-10-29 Sposób i instalacja do kontroli wymiarowej na linii wytwarzanych obiektów PL3701221T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1760175A FR3073043B1 (fr) 2017-10-27 2017-10-27 Procede et installation de controle dimensionnel en ligne d'objets manufactures
EP18803752.7A EP3701221B1 (fr) 2017-10-27 2018-10-29 Procédé et installation de contrôle dimensionnel en ligne d'objets manufacturés
PCT/FR2018/052681 WO2019081875A1 (fr) 2017-10-27 2018-10-29 Procédé et installation de contrôle dimensionnel en ligne d'objets manufacturés

Publications (1)

Publication Number Publication Date
PL3701221T3 true PL3701221T3 (pl) 2021-12-13

Family

ID=60923692

Family Applications (1)

Application Number Title Priority Date Filing Date
PL18803752T PL3701221T3 (pl) 2017-10-27 2018-10-29 Sposób i instalacja do kontroli wymiarowej na linii wytwarzanych obiektów

Country Status (11)

Country Link
US (1) US11493334B2 (pl)
EP (1) EP3701221B1 (pl)
JP (1) JP7323517B2 (pl)
CN (1) CN111279148B (pl)
BR (1) BR112020007591B1 (pl)
ES (1) ES2885230T3 (pl)
FR (1) FR3073043B1 (pl)
MX (1) MX2020004360A (pl)
PL (1) PL3701221T3 (pl)
RU (1) RU2768110C2 (pl)
WO (1) WO2019081875A1 (pl)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9333649B1 (en) * 2013-03-15 2016-05-10 Industrial Perception, Inc. Object pickup strategies for a robotic device
FR3074907B1 (fr) * 2017-12-08 2019-12-27 Tiama Methode et machine pour controler un procede de formage
FR3095508B1 (fr) 2019-04-26 2021-05-14 Tiama Procede et installation de controle dimensionnel en ligne d’objets manufactures
FR3095506B1 (fr) 2019-04-29 2021-05-07 Tiama Ligne de contrôle de récipients vides en verre
IT201900006925A1 (it) * 2019-05-16 2020-11-16 Sica Spa Sistema di controllo della qualità di lavorazione di tubi in materiale termoplastico
JP7294927B2 (ja) * 2019-07-23 2023-06-20 ファナック株式会社 相違点抽出装置
JP6755603B1 (ja) * 2019-12-25 2020-09-16 上野精機株式会社 電子部品の処理装置
IT202000004246A1 (it) * 2020-02-28 2021-08-28 Microtec Srl Apparecchiatura e metodo per eseguire una tomografia computerizzata di un oggetto che presenti forma allungata, in particolare tavole di legno
FR3111703B1 (fr) * 2020-06-18 2022-05-20 Skf Svenska Kullagerfab Ab Procédé de détection d’un défaut critique pour élément roulant en matériau céramique
WO2024101477A1 (ko) * 2022-11-10 2024-05-16 제이피아이헬스케어 주식회사 실시간 인라인 디지털 단층영상 합성 시스템

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JPS60260807A (ja) * 1984-06-08 1985-12-24 Kawasaki Steel Corp 管状材の放射線透過式肉厚測定装置
US5602890A (en) * 1995-09-27 1997-02-11 Thermedics Detection Inc. Container fill level and pressurization inspection using multi-dimensional images
DE19756697A1 (de) * 1997-12-19 1999-07-01 Manfred Dr Ing Pfeiler Vorrichtung zur Stückgut-Röntgentomosynthese
US7412022B2 (en) * 2002-02-28 2008-08-12 Jupiter Clyde P Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas
FR2846425B1 (fr) * 2002-10-25 2006-04-28 Bsn Glasspack Procede et didpositif pour detecter des defauts de surface presentes par la paroi externe d'un objet transparent ou translucide
JP2004280134A (ja) * 2003-03-12 2004-10-07 Toyota Motor Corp 薄板物の３次元モデル化方法
US7221732B1 (en) 2005-04-04 2007-05-22 Martin Annis Method and apparatus for producing laminography images using a fixed x-ray source
JP4127698B2 (ja) * 2005-04-25 2008-07-30 アンリツ産機システム株式会社 Ｘ線検査装置
DE102005037101A1 (de) * 2005-08-03 2007-02-08 Krones Ag Verfahren und Vorrichtung zur Wandstärkenkontrolle
US7809177B2 (en) * 2005-11-30 2010-10-05 The General Hospital Corporation Lumen tracking in computed tomographic images
JP4736755B2 (ja) * 2005-11-30 2011-07-27 コニカミノルタエムジー株式会社 モデリング装置、領域抽出装置、モデリング方法及びプログラム
US7319737B2 (en) 2006-04-07 2008-01-15 Satpal Singh Laminographic system for 3D imaging and inspection
CN101405597B (zh) * 2006-04-13 2012-05-23 株式会社岛津制作所 使用透过x射线的三维定量方法
GB0801307D0 (en) * 2008-01-24 2008-03-05 3Dx Ray Ltd Can seam inspection
CN101561405B (zh) * 2008-04-17 2011-07-06 清华大学 一种直线轨迹扫描成像系统和方法
US8744039B2 (en) * 2008-07-04 2014-06-03 Hitachi Medical Corporation X-ray CT apparatus
GB0902138D0 (en) * 2009-02-10 2009-03-25 Durham Scient Crystals Ltd Apparatus and method for viewing an object
US20100220910A1 (en) * 2009-03-02 2010-09-02 General Electric Company Method and system for automated x-ray inspection of objects
DE102009051692B3 (de) * 2009-10-27 2011-04-07 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zum Identifizieren eines Materials
PL2628146T3 (pl) * 2010-07-01 2018-02-28 Kinepict Kft. Nowy sposób obrazowania przy wykorzystaniu promieniowań przenikliwych
FR2981450B1 (fr) * 2011-10-17 2014-06-06 Eads Europ Aeronautic Defence Systeme et procede de controle de la qualite d'un objet
CN110632673A (zh) 2011-11-22 2019-12-31 新锐系统有限责任公司 高速、覆盖区小的x射线断层摄影检查系统、设备和方法
DE102012103984A1 (de) * 2012-05-07 2013-11-07 Werth Messtechnik Gmbh Verfahren zum Bestimmen von Merkmalen eines Messobjekts
CN103900503B (zh) * 2012-12-27 2016-12-28 清华大学 提取形状特征的方法、安全检查方法以及设备
DE102014103137A1 (de) * 2014-03-10 2015-09-10 Deutsches Krebsforschungszentrum (Dkfz) Verfahren zur Bestimmung und Korrektur von Oberflächendaten zur dimensionellen Messung mit einer Computertomografiesensorik
US9709513B2 (en) * 2014-09-30 2017-07-18 Hexagon Metrology, Inc. System and method for measuring an object using X-ray projections
FR3073044B1 (fr) * 2017-10-27 2020-10-02 Tiama Procede et dispositif de mesure de dimensions par rayons x, sur des recipients en verre vide defilant en ligne

Also Published As

Publication number Publication date
BR112020007591A2 (pt) 2020-09-24
US20200300619A1 (en) 2020-09-24
CN111279148A (zh) 2020-06-12
BR112020007591B1 (pt) 2023-11-14
JP7323517B2 (ja) 2023-08-08
FR3073043B1 (fr) 2019-11-15
ES2885230T3 (es) 2021-12-13
EP3701221A1 (fr) 2020-09-02
FR3073043A1 (fr) 2019-05-03
RU2020116530A (ru) 2021-11-29
WO2019081875A1 (fr) 2019-05-02
MX2020004360A (es) 2020-08-03
CN111279148B (zh) 2022-08-30
RU2020116530A3 (pl) 2022-01-18
US11493334B2 (en) 2022-11-08
JP2021500571A (ja) 2021-01-07
EP3701221B1 (fr) 2021-07-21
RU2768110C2 (ru) 2022-03-23

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