PL3249807T3 - Przetwornica częstotliwości, system pomiarowy, i sposób pomiaru - Google Patents

Przetwornica częstotliwości, system pomiarowy, i sposób pomiaru

Info

Publication number
PL3249807T3
PL3249807T3 PL16755691.9T PL16755691T PL3249807T3 PL 3249807 T3 PL3249807 T3 PL 3249807T3 PL 16755691 T PL16755691 T PL 16755691T PL 3249807 T3 PL3249807 T3 PL 3249807T3
Authority
PL
Poland
Prior art keywords
measuring
frequency converter
measuring method
measuring system
converter
Prior art date
Application number
PL16755691.9T
Other languages
English (en)
Inventor
Kohei Fujiwara
Takeshi Kobayashi
Original Assignee
Tokyo Metropolitan Industrial Technology Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=56789974&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PL3249807(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Tokyo Metropolitan Industrial Technology Research Institute filed Critical Tokyo Metropolitan Industrial Technology Research Institute
Publication of PL3249807T3 publication Critical patent/PL3249807T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/14—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
    • H03D7/00—Transference of modulation from one carrier to another, e.g. frequency-changing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Transmitters (AREA)
  • Superheterodyne Receivers (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
PL16755691.9T 2015-02-27 2016-02-26 Przetwornica częstotliwości, system pomiarowy, i sposób pomiaru PL3249807T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015039192A JP6611441B2 (ja) 2014-02-28 2015-02-27 周波数変換ユニット、計測システム及び計測方法
PCT/JP2016/055825 WO2016136947A1 (ja) 2015-02-27 2016-02-26 周波数変換器、計測システム及び計測方法

Publications (1)

Publication Number Publication Date
PL3249807T3 true PL3249807T3 (pl) 2025-02-03

Family

ID=56789974

Family Applications (1)

Application Number Title Priority Date Filing Date
PL16755691.9T PL3249807T3 (pl) 2015-02-27 2016-02-26 Przetwornica częstotliwości, system pomiarowy, i sposób pomiaru

Country Status (7)

Country Link
US (1) US10649013B2 (pl)
EP (1) EP3249807B1 (pl)
JP (1) JP6611441B2 (pl)
CN (1) CN107251416B (pl)
FI (1) FI3249807T3 (pl)
PL (1) PL3249807T3 (pl)
WO (1) WO2016136947A1 (pl)

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JP6611441B2 (ja) * 2014-02-28 2019-11-27 地方独立行政法人東京都立産業技術研究センター 周波数変換ユニット、計測システム及び計測方法
JP6933604B2 (ja) * 2018-04-24 2021-09-08 アンリツ株式会社 位相特性校正装置及び位相特性校正方法
CN108988962B (zh) * 2018-07-25 2021-09-10 北京无线电计量测试研究所 一种宽带矢量调制信号误差矢量幅度的修正装置与方法
CN109298318B (zh) * 2018-10-24 2024-06-21 伟创力电子技术(苏州)有限公司 V/e波段毫米波电路板测试系统及控制方法
US11579176B2 (en) 2019-12-30 2023-02-14 Industrial Technology Research Institute Sensing system and sensing signal measuring method thereof
TWI705251B (zh) * 2019-12-30 2020-09-21 財團法人工業技術研究院 感測系統及其感測訊號量測方法
US11762086B2 (en) * 2021-03-02 2023-09-19 GM Global Technology Operations LLC Generating a high frequency FMCW radar from low frequency FMCW radar
CN113315475B (zh) * 2021-05-28 2023-05-09 中电科思仪科技股份有限公司 一种太赫兹宽带下变频装置及其工作方法
CN114050871B (zh) * 2021-11-11 2023-12-05 北京天地一格科技有限公司 一种w波段信号测试方法
WO2025075195A1 (ja) * 2023-10-06 2025-04-10 ７Ｇａａ株式会社 減衰特性測定装置及び減衰特性測定方法

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Also Published As

Publication number Publication date
CN107251416A (zh) 2017-10-13
US10649013B2 (en) 2020-05-12
EP3249807B1 (en) 2024-10-09
EP3249807A4 (en) 2019-01-09
CN107251416B (zh) 2021-06-15
FI3249807T3 (fi) 2025-01-13
EP3249807A1 (en) 2017-11-29
JP2015180060A (ja) 2015-10-08
WO2016136947A1 (ja) 2016-09-01
US20180246151A1 (en) 2018-08-30
JP6611441B2 (ja) 2019-11-27

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