PL2988117T3 - System rentgenowskiego obrazowania dyfrakcyjnego ze zbieraniem sygnału w obrębie wokseli zawierających obiekty i sposób jego działania - Google Patents
System rentgenowskiego obrazowania dyfrakcyjnego ze zbieraniem sygnału w obrębie wokseli zawierających obiekty i sposób jego działaniaInfo
- Publication number
- PL2988117T3 PL2988117T3 PL15002417T PL15002417T PL2988117T3 PL 2988117 T3 PL2988117 T3 PL 2988117T3 PL 15002417 T PL15002417 T PL 15002417T PL 15002417 T PL15002417 T PL 15002417T PL 2988117 T3 PL2988117 T3 PL 2988117T3
- Authority
- PL
- Poland
- Prior art keywords
- operating
- imaging system
- ray diffraction
- same
- containing objects
- Prior art date
Links
- 238000002441 X-ray diffraction Methods 0.000 title 1
- 238000004220 aggregation Methods 0.000 title 1
- 230000002776 aggregation Effects 0.000 title 1
- 238000003384 imaging method Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
- G06T11/006—Inverse problem, transformation from projection-space into object-space, e.g. transform methods, back-projection, algebraic methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T15/00—3D [Three Dimensional] image rendering
- G06T15/08—Volume rendering
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/70—Denoising; Smoothing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/206—Sources of radiation sources operating at different energy levels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/401—Imaging image processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/405—Imaging mapping of a material property
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/41—Imaging imaging specifically internal structure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/423—Imaging multispectral imaging-multiple energy imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/639—Specific applications or type of materials material in a container
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/643—Specific applications or type of materials object on conveyor
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10116—X-ray image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2211/00—Image generation
- G06T2211/40—Computed tomography
- G06T2211/408—Dual energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Pure & Applied Mathematics (AREA)
- Data Mining & Analysis (AREA)
- Mathematical Optimization (AREA)
- Mathematical Analysis (AREA)
- Algebra (AREA)
- Computer Graphics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Evolutionary Biology (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Bioinformatics & Computational Biology (AREA)
- General Engineering & Computer Science (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/463,459 US9405990B2 (en) | 2014-08-19 | 2014-08-19 | X-ray diffraction imaging system with signal aggregation across voxels containing objects and method of operating the same |
EP15002417.2A EP2988117B1 (en) | 2014-08-19 | 2015-08-13 | X-ray diffraction imaging system with signal aggregation across voxels containing objects and method of operating the same |
Publications (1)
Publication Number | Publication Date |
---|---|
PL2988117T3 true PL2988117T3 (pl) | 2018-11-30 |
Family
ID=53836356
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL15002417T PL2988117T3 (pl) | 2014-08-19 | 2015-08-13 | System rentgenowskiego obrazowania dyfrakcyjnego ze zbieraniem sygnału w obrębie wokseli zawierających obiekty i sposób jego działania |
Country Status (4)
Country | Link |
---|---|
US (1) | US9405990B2 (pl) |
EP (1) | EP2988117B1 (pl) |
CN (1) | CN105372713B (pl) |
PL (1) | PL2988117T3 (pl) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2016105441A1 (en) * | 2014-12-27 | 2016-06-30 | Hill's Pet Nutrition, Inc. | Food processing method and system |
IL248615B (en) * | 2016-10-30 | 2020-05-31 | Rohde & Schwarz | Method and system for security inspection using a detector gate |
EP3378399A1 (de) * | 2017-03-24 | 2018-09-26 | Universität zu Lübeck | Röntgenstreumessvorrichtung und verfahren zur röntgenstreumessung |
US11788972B2 (en) | 2021-04-29 | 2023-10-17 | Industrial Technology Research Institute | Method of automatically setting optical parameters and automated optical inspection system using the same |
DE102022207748A1 (de) | 2022-07-28 | 2024-02-08 | Smiths Detection Germany Gmbh | Segmentierungsverfahren für eine abgrenzung von objekten als segmente in einem gepäckstück bei einer röntgen-diffraktionsanalyse |
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US5007072A (en) * | 1988-08-03 | 1991-04-09 | Ion Track Instruments | X-ray diffraction inspection system |
DE59308726D1 (de) | 1992-02-06 | 1998-08-13 | Philips Patentverwaltung | Anordnung zum Messen des Impulsübertragsspektrums von elastisch gestreuten Röntgenquanten |
DE4331317A1 (de) * | 1993-09-15 | 1995-03-16 | Philips Patentverwaltung | Untersuchungsverfahren zur Auswertung ortsabhängiger Spektren |
DE19504952B4 (de) * | 1995-02-15 | 2005-06-23 | Philips Intellectual Property & Standards Gmbh | Anordnung zum Messen von in einem Untersuchungsbereich elastisch gestreuten Röntgenquanten |
US6018562A (en) * | 1995-11-13 | 2000-01-25 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography |
US6359669B1 (en) * | 1999-09-17 | 2002-03-19 | Rockwell Collins, Inc. | Flat panel displays having an edge texture |
DE10009285A1 (de) * | 2000-02-28 | 2001-08-30 | Philips Corp Intellectual Pty | Computertomograph zur Ermittlung des Impulsübertrags-Spektrums in einem Untersuchungsbereich |
DE60222768T2 (de) * | 2001-04-03 | 2008-07-17 | Koninklijke Philips Electronics N.V. | Computertomograph |
WO2003065077A2 (en) | 2002-01-30 | 2003-08-07 | Rutgers, The State University | Combinatorial contraband detection using energy dispersive x-ray diffraction |
US7092485B2 (en) * | 2003-05-27 | 2006-08-15 | Control Screening, Llc | X-ray inspection system for detecting explosives and other contraband |
US7330528B2 (en) * | 2003-08-19 | 2008-02-12 | Agilent Technologies, Inc. | System and method for parallel image reconstruction of multiple depth layers of an object under inspection from radiographic images |
ATE385595T1 (de) * | 2004-03-17 | 2008-02-15 | Koninkl Philips Electronics Nv | Korrektur der strahlungsaufhärtung und der dämpfung in der coherent scatter computed tomography (csct) |
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US7190762B2 (en) * | 2004-10-29 | 2007-03-13 | Broker Axs, Inc | Scanning line detector for two-dimensional x-ray diffractometer |
DE102004060610A1 (de) * | 2004-12-16 | 2006-06-29 | Yxlon International Security Gmbh | Anordnung zum Messen des Impulsübertragungsspektrums von elastisch gestreuten Röntgenquanten sowie Verfahren zur Bestimmung dieses Impulsübertragungsspektrums |
DE102004060609A1 (de) * | 2004-12-16 | 2006-06-29 | Yxlon International Security Gmbh | Verfahren zum Messen des Impulsübertragungsspektrums von elastisch gestreuten Röntgenquanten |
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KR101460615B1 (ko) * | 2011-07-22 | 2014-11-14 | 삼성전자주식회사 | 다중 파장의 엑스선 투과 영상으로부터 단면 영상을 복원하는 방법 및 그 방법을 이용한 영상 처리 장치 |
WO2013103408A1 (en) * | 2011-10-07 | 2013-07-11 | Duke University | Apparatus for coded aperture x-ray scatter imaging and method therefor |
EP2798339B1 (fr) * | 2011-12-28 | 2017-10-11 | Commissariat à l'Énergie Atomique et aux Énergies Alternatives | Procédé d'analyse d'un échantillon de matériau par diffractométrie et diffractomètre associé |
DE102012205225A1 (de) * | 2012-03-30 | 2013-10-02 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Computertomographiesystem und verfahren zur datenermittelung für eine störeinfluss-korrigierte computertomographieaufnahme eines untersuchungsobjekts |
RU2638012C2 (ru) * | 2012-08-06 | 2017-12-08 | Конинклейке Филипс Н.В. | Уменьшение шума изображения и/или повышение разрешения изображения |
US9222901B2 (en) * | 2013-03-05 | 2015-12-29 | Danmarks Tekniske Universitet Anker Engelundsvej | X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus |
US10182757B2 (en) * | 2013-07-22 | 2019-01-22 | The Rockefeller University | System and method for optical detection of skin disease |
US9791385B2 (en) * | 2013-12-10 | 2017-10-17 | Arizona Board Of Regents On Behalf Of Arizona State University | Modular high resolution X-ray computed tomography system |
-
2014
- 2014-08-19 US US14/463,459 patent/US9405990B2/en active Active
-
2015
- 2015-08-13 EP EP15002417.2A patent/EP2988117B1/en active Active
- 2015-08-13 PL PL15002417T patent/PL2988117T3/pl unknown
- 2015-08-19 CN CN201510509667.9A patent/CN105372713B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN105372713B (zh) | 2019-06-04 |
EP2988117A1 (en) | 2016-02-24 |
CN105372713A (zh) | 2016-03-02 |
US20160055390A1 (en) | 2016-02-25 |
US9405990B2 (en) | 2016-08-02 |
EP2988117B1 (en) | 2018-04-11 |
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PL2988117T3 (pl) | System rentgenowskiego obrazowania dyfrakcyjnego ze zbieraniem sygnału w obrębie wokseli zawierających obiekty i sposób jego działania |