PL2543955T3 - Sposób kalibracji modelu matematycznego współrzędnościowej maszyny pomiarowej, w celu kompensowania błędów dynamicznych spowodowanych odkształceniem - Google Patents

Sposób kalibracji modelu matematycznego współrzędnościowej maszyny pomiarowej, w celu kompensowania błędów dynamicznych spowodowanych odkształceniem

Info

Publication number
PL2543955T3
PL2543955T3 PL11425179T PL11425179T PL2543955T3 PL 2543955 T3 PL2543955 T3 PL 2543955T3 PL 11425179 T PL11425179 T PL 11425179T PL 11425179 T PL11425179 T PL 11425179T PL 2543955 T3 PL2543955 T3 PL 2543955T3
Authority
PL
Poland
Prior art keywords
calibration
compensation
deformation
mathematical model
measuring machine
Prior art date
Application number
PL11425179T
Other languages
English (en)
Inventor
Giampiero Guasco
Original Assignee
Hexagon Metrology Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hexagon Metrology Spa filed Critical Hexagon Metrology Spa
Publication of PL2543955T3 publication Critical patent/PL2543955T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
PL11425179T 2011-07-06 2011-07-06 Sposób kalibracji modelu matematycznego współrzędnościowej maszyny pomiarowej, w celu kompensowania błędów dynamicznych spowodowanych odkształceniem PL2543955T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP11425179.6A EP2543955B1 (en) 2011-07-06 2011-07-06 Method of calibration of a mathematical model of a coordinate measuring machine for the compensation of dynamic errors due to deformation

Publications (1)

Publication Number Publication Date
PL2543955T3 true PL2543955T3 (pl) 2016-06-30

Family

ID=44651591

Family Applications (1)

Application Number Title Priority Date Filing Date
PL11425179T PL2543955T3 (pl) 2011-07-06 2011-07-06 Sposób kalibracji modelu matematycznego współrzędnościowej maszyny pomiarowej, w celu kompensowania błędów dynamicznych spowodowanych odkształceniem

Country Status (7)

Country Link
US (1) US9459096B2 (pl)
EP (1) EP2543955B1 (pl)
KR (1) KR102023560B1 (pl)
CN (1) CN102889868B (pl)
BR (1) BR102012016760B1 (pl)
ES (1) ES2559187T3 (pl)
PL (1) PL2543955T3 (pl)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8156825B2 (en) * 2007-06-11 2012-04-17 Snaptron, Inc. Methods and apparatus for determining deformation response
JP2012248098A (ja) * 2011-05-30 2012-12-13 Okuma Corp 機械の誤差補償値計算方法
CN103438816A (zh) * 2013-08-16 2013-12-11 合肥工业大学 一种测量关节类装备杆件变形的高精度测量装置
EP2899500B1 (en) * 2014-01-27 2016-09-07 Hexagon Metrology S.p.A. Method for compensating measurement errors due to thermally induced structural deformations in a coordinate measurement machine
EP3034991B2 (en) * 2014-12-19 2022-08-24 Hexagon Technology Center GmbH Method and system for actively counteracting displacement forces with a probing unit
CN105783845B (zh) * 2016-05-31 2018-03-09 重庆大学 一种数控磨齿机在机测量系统的齿廓测量方法
JP6341962B2 (ja) 2016-08-26 2018-06-13 株式会社ミツトヨ 三次元測定装置及び座標補正方法
JP6295299B2 (ja) 2016-08-26 2018-03-14 株式会社ミツトヨ 座標補正方法及び三次元測定装置
JP2018031754A (ja) * 2016-08-26 2018-03-01 株式会社ミツトヨ 三次元測定装置及び座標補正方法
EP3542130B1 (en) * 2016-11-16 2024-01-03 Renishaw PLC Method of calibrating an analogue contact probe and method of transforming a probe signal from an analogue contact probe into a spatial measurement value
CN109801536B (zh) * 2019-03-18 2021-02-26 郑州航空工业管理学院 一种数学模型动态展示装置
CN114076934A (zh) * 2020-08-12 2022-02-22 三赢科技（深圳）有限公司 校准设备及深度相机的校准方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5724264A (en) * 1993-07-16 1998-03-03 Immersion Human Interface Corp. Method and apparatus for tracking the position and orientation of a stylus and for digitizing a 3-D object
DE60118701T2 (de) * 2001-04-03 2007-04-12 Saphirwerk Industrieprodukte Ag Verfahren zur Bestimmung der Größe der Deformation eines Taststiftes
DE10214490B4 (de) 2002-03-26 2010-12-02 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Korrektur von Führungsfehlern bei einem Koordinatenmeßgerät
GB0309662D0 (en) * 2003-04-28 2003-06-04 Crampton Stephen Robot CMM arm
US7313948B2 (en) * 2003-09-30 2008-01-01 Iowa State University Research Foundation Real time detection of loss of cantilever sensing loss
CN100462677C (zh) * 2005-07-08 2009-02-18 鸿富锦精密工业（深圳）有限公司 三坐标测量机床误差补偿系统及方法
WO2009001385A1 (en) 2007-06-28 2008-12-31 Hexagon Metrology S.P.A. Method for determining dynamic errors in a measuring machine
US8042412B2 (en) * 2008-06-25 2011-10-25 General Electric Company Turbomachinery system fiberoptic multi-parameter sensing system and method
US8606426B2 (en) * 2009-10-23 2013-12-10 Academia Sinica Alignment and anti-drift mechanism

Also Published As

Publication number Publication date
EP2543955A1 (en) 2013-01-09
KR102023560B1 (ko) 2019-09-23
EP2543955B1 (en) 2015-10-14
CN102889868A (zh) 2013-01-23
US20130173199A1 (en) 2013-07-04
BR102012016760A2 (pt) 2017-02-21
US9459096B2 (en) 2016-10-04
CN102889868B (zh) 2017-03-01
KR20130006346A (ko) 2013-01-16
BR102012016760B1 (pt) 2020-09-24
ES2559187T3 (es) 2016-02-10

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