PL1730503T3 - Sposób badania struktur ceramicznych - Google Patents

Sposób badania struktur ceramicznych

Info

Publication number
PL1730503T3
PL1730503T3 PL05728592T PL05728592T PL1730503T3 PL 1730503 T3 PL1730503 T3 PL 1730503T3 PL 05728592 T PL05728592 T PL 05728592T PL 05728592 T PL05728592 T PL 05728592T PL 1730503 T3 PL1730503 T3 PL 1730503T3
Authority
PL
Poland
Prior art keywords
ceramic structures
inspecting ceramic
inspecting
structures
ceramic
Prior art date
Application number
PL05728592T
Other languages
English (en)
Inventor
Shigeki Kato
Original Assignee
Ngk Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ngk Insulators Ltd filed Critical Ngk Insulators Ltd
Publication of PL1730503T3 publication Critical patent/PL1730503T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL05728592T 2004-03-31 2005-03-31 Sposób badania struktur ceramicznych PL1730503T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2004102320A JP2005283547A (ja) 2004-03-31 2004-03-31 セラミック構造体の検査方法
EP05728592.6A EP1730503B1 (en) 2004-03-31 2005-03-31 Method for inspecting ceramic structures
PCT/JP2005/006817 WO2005095932A1 (en) 2004-03-31 2005-03-31 Method for inspecting ceramic structures

Publications (1)

Publication Number Publication Date
PL1730503T3 true PL1730503T3 (pl) 2016-06-30

Family

ID=34963482

Family Applications (1)

Application Number Title Priority Date Filing Date
PL05728592T PL1730503T3 (pl) 2004-03-31 2005-03-31 Sposób badania struktur ceramicznych

Country Status (7)

Country Link
US (1) US7564944B2 (pl)
EP (1) EP1730503B1 (pl)
JP (1) JP2005283547A (pl)
CN (1) CN1677099B (pl)
PL (1) PL1730503T3 (pl)
WO (1) WO2005095932A1 (pl)
ZA (1) ZA200607797B (pl)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7614304B2 (en) 2006-05-16 2009-11-10 Corning Incorporated Ultrasonic testing system and method for ceramic honeycomb structures
US8499633B2 (en) 2006-05-16 2013-08-06 Corning Incorporated Non-contact ultrasonic testing method and device for ceramic honeycomb structures
JP5529682B2 (ja) * 2009-09-11 2014-06-25 日本碍子株式会社 気孔連続性解析装置、多孔質体の製造方法、気孔連続性解析方法及びそのプログラム
CN103109157A (zh) * 2010-09-24 2013-05-15 住友化学株式会社 多孔层状结构体的检查方法及检查装置
CN102023171B (zh) * 2010-11-12 2012-07-25 航天材料及工艺研究所 用ct值定量表征复合材料内部夹杂缺陷类型的无损检测方法
KR101074546B1 (ko) * 2011-04-13 2011-10-17 한국지질자원연구원 컴퓨터 단층촬영 장치와 표준시료를 이용한 시료 공극 측정 시스템 및 그 방법
US20120303333A1 (en) * 2011-05-26 2012-11-29 General Electric Company System and method for non-destructive testing
US9869645B2 (en) 2011-05-26 2018-01-16 General Electric Company System for non-destructive testing and method for processing data generated therein
JP5922892B2 (ja) 2011-08-26 2016-05-24 Ntn株式会社 転動体の検査方法および転動体の製造方法
JP5481498B2 (ja) 2012-01-12 2014-04-23 住友化学株式会社 グリーンハニカム成形体の欠陥を検査する方法、グリーンハニカム構造体の製造方法及びグリーンハニカム成形体の欠陥の検査装置
EP2669667B1 (en) 2012-03-30 2017-06-28 NGK Insulators, Ltd. Microstructure analysis method, program for same, and microstructure analysis device
JP5639690B2 (ja) * 2013-07-05 2014-12-10 株式会社アドバンテスト 付着量測定装置、測定方法、プログラム、記録媒体
US9970888B2 (en) 2014-11-07 2018-05-15 Ge Energy Oilfield Technology, Inc. System and method for wellsite core sample analysis
US9880318B2 (en) 2014-11-07 2018-01-30 Ge Energy Oilfield Technology, Inc. Method for analyzing core sample from wellbore, involves analyzing zone of interest in core sample, and forming image of core sample to spatially represent characteristics of core sample
US10001446B2 (en) 2014-11-07 2018-06-19 Ge Energy Oilfield Technology, Inc. Core sample analysis
US10031148B2 (en) 2014-12-31 2018-07-24 Ge Energy Oilfield Technology, Inc. System for handling a core sample
US10261204B2 (en) 2014-12-31 2019-04-16 Ge Energy Oilfield Technology, Inc. Methods and systems for scan analysis of a core sample
JP6946935B2 (ja) * 2017-10-30 2021-10-13 日本製鉄株式会社 気孔率推定方法及び気孔率推定装置
CN108844978B (zh) * 2018-05-29 2020-11-13 沈阳飞机工业（集团）有限公司 一种用于检测蜂窝内部缺陷的新方法
CN108802074B (zh) * 2018-08-02 2020-11-06 赵克 氧化锆双层全瓷修复体饰瓷内部缺陷的检测方法
JP7070995B2 (ja) * 2018-11-20 2022-05-18 東芝エネルギーシステムズ株式会社 検査方法および検査装置
US11928806B2 (en) 2020-02-14 2024-03-12 Cummins Inc. Systems and methods for evaluating part density, contamination and defects using computed tomography scanning
FR3111703B1 (fr) * 2020-06-18 2022-05-20 Skf Svenska Kullagerfab Ab Procédé de détection d’un défaut critique pour élément roulant en matériau céramique
RU2742540C1 (ru) * 2020-08-24 2021-02-08 федеральное государственное бюджетное образовательное учреждение высшего образования "Казанский национальный исследовательский технический универитет им. А.Н. Туполева - КАИ" Способ проведения исследования клеевых соединений многослойной втулки несущего винта вертолета

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59221643A (ja) * 1983-05-31 1984-12-13 Toshiba Corp セラミツクス物品の検査法
JPS6114550A (ja) 1984-06-30 1986-01-22 Toshiba Corp 混在率測定装置
JPS63203137A (ja) 1987-02-19 1988-08-23 株式会社東芝 Ｘ線ｃｔ装置
US5430291A (en) * 1992-05-01 1995-07-04 Texaco Inc. X-ray CT measurement of fracture widths and fracture porosity in reservoir core material
JP3839177B2 (ja) 1998-12-28 2006-11-01 イビデン株式会社 多孔質セラミック部材のピンホール検査装置
JP3631652B2 (ja) 2000-01-20 2005-03-23 日本碍子株式会社 Ｘ線を用いた非破壊検査方法
JP3904933B2 (ja) 2001-03-30 2007-04-11 日本碍子株式会社 欠陥を検出する検査方法及び検査装置
CN1392403A (zh) * 2001-06-20 2003-01-22 株式会社日立工程服务 X射线检查装置
US20030182930A1 (en) * 2002-03-28 2003-10-02 Goulette David Alexander Integrated non-thermal plasma reactor-diesel particulate filter
US6775352B2 (en) 2002-08-16 2004-08-10 Ge Medical Systems Global Technology Company, Llc Method and system for implementing variable x-ray intensity modulation schemes for imaging systems

Also Published As

Publication number Publication date
CN1677099B (zh) 2011-03-16
EP1730503B1 (en) 2015-12-09
US20080205596A1 (en) 2008-08-28
EP1730503A1 (en) 2006-12-13
ZA200607797B (en) 2008-06-25
US7564944B2 (en) 2009-07-21
WO2005095932A1 (en) 2005-10-13
CN1677099A (zh) 2005-10-05
JP2005283547A (ja) 2005-10-13

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