OA00017A - Procédé de dosage et dispositifs en faisant application. - Google Patents
Procédé de dosage et dispositifs en faisant application.Info
- Publication number
- OA00017A OA00017A OA50050A OA50050A OA00017A OA 00017 A OA00017 A OA 00017A OA 50050 A OA50050 A OA 50050A OA 50050 A OA50050 A OA 50050A OA 00017 A OA00017 A OA 00017A
- Authority
- OA
- OAPI
- Prior art keywords
- applying
- devices
- dosing method
- dosing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/063—Investigating materials by wave or particle radiation by diffraction, scatter or reflection inelastic scatter, e.g. Compton effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/071—Investigating materials by wave or particle radiation secondary emission combination of measurements, at least 1 secondary emission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1013—Different kinds of radiation or particles electromagnetic radiation gamma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/202—Sources of radiation isotopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/61—Specific applications or type of materials thin films, coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/625—Specific applications or type of materials nuclear fuels, laser imploded targets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)
Landscapes
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR930019A FR1389417A (fr) | 1963-04-01 | 1963-04-01 | Procédé de dosage et dispositifs en faisant application |
Publications (1)
Publication Number | Publication Date |
---|---|
OA00017A true OA00017A (fr) | 1966-01-15 |
Family
ID=8800625
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
OA50050A OA00017A (fr) | 1963-04-01 | 1964-04-02 | Procédé de dosage et dispositifs en faisant application. |
Country Status (10)
Country | Link |
---|---|
US (1) | US3404275A (xx) |
BE (1) | BE645935A (xx) |
CH (1) | CH412403A (xx) |
DE (1) | DE1296829B (xx) |
ES (1) | ES298196A1 (xx) |
FR (1) | FR1389417A (xx) |
GB (1) | GB1042992A (xx) |
LU (1) | LU45778A1 (xx) |
NL (1) | NL6403478A (xx) |
OA (1) | OA00017A (xx) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2727989C3 (de) * | 1977-06-22 | 1980-05-08 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | Einrichtung zur Bestimmung von Uran und/oder Thorium in Erzproben |
US4134012A (en) * | 1977-10-17 | 1979-01-09 | Bausch & Lomb, Inc. | X-ray analytical system |
US4362935A (en) * | 1979-02-09 | 1982-12-07 | Martin Marietta Corporation | Field portable element analysis unit |
CA1144662A (en) * | 1979-08-07 | 1983-04-12 | Dennis Page | Method and apparatus for sensing the ash content of coal |
US4431104A (en) * | 1979-11-07 | 1984-02-14 | Armour And Company | Indexing conveyor system |
FI61361C (fi) * | 1980-09-15 | 1982-07-12 | Outokumpu Oy | Foerfarande och anordning foer analys av malm med anvaendning av gammastraolning |
ZA816802B (en) * | 1980-10-21 | 1982-09-29 | Coal Industry Patents Ltd | Probe equipment for use in underground mining |
FR2495776B1 (fr) * | 1980-12-08 | 1985-06-07 | Atomic Energy Authority Uk | Procede et appareil de determination de la teneur en or de minerais auriferes |
GB2116698A (en) * | 1982-02-26 | 1983-09-28 | Coal Ind | Coal analysis using x-rays |
FI72211C (fi) * | 1983-03-23 | 1987-04-13 | Outokumpu Oy | Foerfarande foer beaktande av straolningsbakgrunden foer bestaemning av straolningsintensiteter som uppstaor i kroppar som skall analyseras. |
FI67626C (fi) * | 1983-03-23 | 1985-04-10 | Outokumpu Oy | Foerfarande foer analysering av malmblock |
DE3312883C1 (de) * | 1983-04-11 | 1984-08-02 | Preussag Ag Metall, 3380 Goslar | Sonde zur Einfuehrung in Bohrloecher zum Zwecke der Erkundung von Erzlagerstaetten |
DE3312884C1 (de) * | 1983-04-11 | 1984-06-14 | Preussag Ag Metall, 3380 Goslar | Sonde zur Einführung in Bohrlöcher zum Zwecke der Erkundung von Erzlagerstätten |
US4612660A (en) * | 1985-05-17 | 1986-09-16 | The United States Of America As Represented By The Secretary Of The Navy | Time resolved extended X-ray absorption fine structure spectrometer |
US4799247A (en) * | 1986-06-20 | 1989-01-17 | American Science And Engineering, Inc. | X-ray imaging particularly adapted for low Z materials |
GB8621983D0 (en) * | 1986-09-12 | 1986-10-22 | K X Technology Ltd | Ore analysis |
JPH082604Y2 (ja) * | 1989-08-03 | 1996-01-29 | 理学電機工業株式会社 | 特性x線検出装置 |
WO2003021244A1 (en) * | 2001-09-04 | 2003-03-13 | Quality Control, Inc. | X-ray fluorescence measuring system and methods for trace elements |
DE102005046878A1 (de) * | 2005-09-29 | 2007-04-12 | Katz, Elisabeth | Vorrichtung und Verfahren zur Schnell- oder Online-Bestimmung der Komponenten eines Zwei- oder Mehrstoffsystems |
US7916834B2 (en) * | 2007-02-12 | 2011-03-29 | Thermo Niton Analyzers Llc | Small spot X-ray fluorescence (XRF) analyzer |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2711480A (en) * | 1948-06-29 | 1955-06-21 | Friedman Herbert | Method of measuring thickness of thin layers |
US2923824A (en) * | 1953-08-10 | 1960-02-02 | Philip W Martin | X-ray analysis of geological formations |
US3102952A (en) * | 1954-05-27 | 1963-09-03 | Philips Corp | X-ray fluorescence analysis of multi-component systems |
NL238481A (xx) * | 1955-04-12 | |||
US2950393A (en) * | 1956-11-20 | 1960-08-23 | Bendix Corp | Gamma compensated neutron detector |
US3046402A (en) * | 1960-04-28 | 1962-07-24 | Norman H Cherry | Multiple thickness times density gamma gauge |
-
1963
- 1963-04-01 FR FR930019A patent/FR1389417A/fr not_active Expired
-
1964
- 1964-03-30 US US355760A patent/US3404275A/en not_active Expired - Lifetime
- 1964-03-31 LU LU45778D patent/LU45778A1/xx unknown
- 1964-03-31 ES ES0298196A patent/ES298196A1/es not_active Expired
- 1964-03-31 BE BE645935A patent/BE645935A/xx unknown
- 1964-04-01 GB GB13519/64A patent/GB1042992A/en not_active Expired
- 1964-04-01 DE DEC32536A patent/DE1296829B/de active Pending
- 1964-04-01 NL NL6403478A patent/NL6403478A/xx unknown
- 1964-04-01 CH CH413464A patent/CH412403A/fr unknown
- 1964-04-02 OA OA50050A patent/OA00017A/xx unknown
Also Published As
Publication number | Publication date |
---|---|
DE1296829B (de) | 1969-06-04 |
NL6403478A (xx) | 1964-10-02 |
GB1042992A (en) | 1966-09-21 |
US3404275A (en) | 1968-10-01 |
ES298196A1 (es) | 1964-09-01 |
LU45778A1 (xx) | 1964-06-01 |
BE645935A (xx) | 1964-07-16 |
CH412403A (fr) | 1966-04-30 |
FR1389417A (fr) | 1965-02-19 |
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