NO842440L - Spektrometer - Google Patents
SpektrometerInfo
- Publication number
- NO842440L NO842440L NO842440A NO842440A NO842440L NO 842440 L NO842440 L NO 842440L NO 842440 A NO842440 A NO 842440A NO 842440 A NO842440 A NO 842440A NO 842440 L NO842440 L NO 842440L
- Authority
- NO
- Norway
- Prior art keywords
- secondary electron
- monochromator
- calculator
- operating voltage
- spectrometer
- Prior art date
Links
- 230000005855 radiation Effects 0.000 claims description 9
- 230000003595 spectral effect Effects 0.000 claims description 7
- 238000001228 spectrum Methods 0.000 claims description 7
- 230000035945 sensitivity Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 description 7
- 229910052729 chemical element Inorganic materials 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 210000000352 storage cell Anatomy 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
- G01J2001/4233—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation with selection of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/283—Investigating the spectrum computer-interfaced
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3325659 | 1983-07-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NO842440L true NO842440L (no) | 1985-01-16 |
Family
ID=6204115
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO842440A NO842440L (no) | 1983-07-15 | 1984-06-18 | Spektrometer |
Country Status (15)
| Country | Link |
|---|---|
| US (1) | US4609289A (ja) |
| JP (1) | JPS6070319A (ja) |
| AU (1) | AU2979084A (ja) |
| BE (1) | BE899994A (ja) |
| BR (1) | BR8403039A (ja) |
| CA (1) | CA1229239A (ja) |
| CH (1) | CH665026A5 (ja) |
| FR (1) | FR2549222B1 (ja) |
| GB (1) | GB2143319B (ja) |
| IN (1) | IN160716B (ja) |
| IT (1) | IT1175548B (ja) |
| NL (1) | NL8401933A (ja) |
| NO (1) | NO842440L (ja) |
| SE (1) | SE8403318L (ja) |
| ZA (1) | ZA844681B (ja) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06100500B2 (ja) * | 1985-06-26 | 1994-12-12 | 株式会社島津製作所 | 分光測定装置 |
| US4907876A (en) * | 1987-05-08 | 1990-03-13 | Hamamatsu Photonics Kabushiki Kaisha | Examination apparatus for measuring oxygenation in body organs |
| JP2002139380A (ja) * | 2000-11-02 | 2002-05-17 | Hitachi Ltd | 分光光度計 |
| JP2003232681A (ja) * | 2002-02-07 | 2003-08-22 | Hitachi High-Technologies Corp | 分光光度計 |
| US7414717B2 (en) * | 2003-10-21 | 2008-08-19 | Fastmetrix, Inc. | System and method for detection and identification of optical spectra |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3531202A (en) * | 1966-11-14 | 1970-09-29 | Baird Atomic Inc | Spectrometer readout system |
| US3554647A (en) * | 1968-12-27 | 1971-01-12 | Nasa | Spectroscope equipment using a slender cylindrical reflector as a substitute for a slit |
| US3967113A (en) * | 1974-12-05 | 1976-06-29 | Baxter Laboratories, Inc. | Wavelength-corrected spectrofluorometer |
| JPS576989Y2 (ja) * | 1975-07-22 | 1982-02-09 | ||
| US4260255A (en) * | 1979-10-22 | 1981-04-07 | The United States Of America As Represented By The Secretary Of The Army | High energy laser beam sampling meter |
| US4373813A (en) * | 1981-01-07 | 1983-02-15 | Beckman Instruments, Inc. | Control of system energy in a single beam spectrophotometer |
-
1984
- 1984-06-15 CH CH2910/84A patent/CH665026A5/de not_active IP Right Cessation
- 1984-06-18 NL NL8401933A patent/NL8401933A/nl not_active Application Discontinuation
- 1984-06-18 NO NO842440A patent/NO842440L/no unknown
- 1984-06-20 SE SE8403318A patent/SE8403318L/ not_active Application Discontinuation
- 1984-06-20 BR BR8403039A patent/BR8403039A/pt unknown
- 1984-06-20 ZA ZA844681A patent/ZA844681B/xx unknown
- 1984-06-22 JP JP59127680A patent/JPS6070319A/ja active Pending
- 1984-06-22 BE BE0/213201A patent/BE899994A/fr not_active IP Right Cessation
- 1984-06-22 US US06/623,751 patent/US4609289A/en not_active Expired - Fee Related
- 1984-06-22 CA CA000457265A patent/CA1229239A/en not_active Expired
- 1984-06-22 IT IT21565/84A patent/IT1175548B/it active
- 1984-06-22 GB GB08415954A patent/GB2143319B/en not_active Expired
- 1984-06-22 AU AU29790/84A patent/AU2979084A/en not_active Abandoned
- 1984-06-22 FR FR848409856A patent/FR2549222B1/fr not_active Expired
- 1984-06-22 IN IN436/CAL/84A patent/IN160716B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| NL8401933A (nl) | 1985-02-01 |
| IN160716B (ja) | 1987-08-01 |
| IT8421565A0 (it) | 1984-06-22 |
| US4609289A (en) | 1986-09-02 |
| CA1229239A (en) | 1987-11-17 |
| BR8403039A (pt) | 1985-05-28 |
| BE899994A (fr) | 1984-10-15 |
| SE8403318L (sv) | 1985-01-16 |
| ZA844681B (en) | 1985-02-27 |
| GB2143319B (en) | 1987-01-07 |
| JPS6070319A (ja) | 1985-04-22 |
| CH665026A5 (de) | 1988-04-15 |
| GB8415954D0 (en) | 1984-07-25 |
| GB2143319A (en) | 1985-02-06 |
| FR2549222A1 (fr) | 1985-01-18 |
| SE8403318D0 (sv) | 1984-06-20 |
| FR2549222B1 (fr) | 1989-03-10 |
| IT1175548B (it) | 1987-07-01 |
| AU2979084A (en) | 1985-01-17 |
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