NO315537B1 - Konstruktiv modul i et elektronisk telekommunikasjonsutstyr, med et grensesnitt mot et testings- og diagnosesystem - Google Patents
Konstruktiv modul i et elektronisk telekommunikasjonsutstyr, med et grensesnitt mot et testings- og diagnosesystem Download PDFInfo
- Publication number
- NO315537B1 NO315537B1 NO19984598A NO984598A NO315537B1 NO 315537 B1 NO315537 B1 NO 315537B1 NO 19984598 A NO19984598 A NO 19984598A NO 984598 A NO984598 A NO 984598A NO 315537 B1 NO315537 B1 NO 315537B1
- Authority
- NO
- Norway
- Prior art keywords
- module
- probes
- points
- testing
- monitoring
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 52
- 239000000523 sample Substances 0.000 claims abstract description 76
- 238000012544 monitoring process Methods 0.000 claims abstract description 23
- 238000003780 insertion Methods 0.000 claims abstract description 17
- 230000037431 insertion Effects 0.000 claims abstract description 17
- 239000004020 conductor Substances 0.000 claims abstract description 11
- 230000004913 activation Effects 0.000 claims description 27
- 238000005516 engineering process Methods 0.000 claims description 9
- 238000006243 chemical reaction Methods 0.000 claims description 8
- 230000008878 coupling Effects 0.000 claims description 6
- 238000010168 coupling process Methods 0.000 claims description 6
- 238000005859 coupling reaction Methods 0.000 claims description 6
- 230000003750 conditioning effect Effects 0.000 claims description 5
- 238000002955 isolation Methods 0.000 claims description 3
- 230000008054 signal transmission Effects 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 2
- 239000012212 insulator Substances 0.000 claims 1
- 238000002347 injection Methods 0.000 description 7
- 239000007924 injection Substances 0.000 description 7
- 238000010276 construction Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000003071 parasitic effect Effects 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 238000003745 diagnosis Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
- H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Two-Way Televisions, Distribution Of Moving Picture Or The Like (AREA)
- Exchange Systems With Centralized Control (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT96TO000256A IT1286293B1 (it) | 1996-04-02 | 1996-04-02 | Modulo costruttivo di apparecchiatura elettronica per telecomunicazioni con interfaccia verso un sistema di prova e diagnosi |
| PCT/EP1997/001632 WO1997037234A1 (en) | 1996-04-02 | 1997-04-01 | Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| NO984598D0 NO984598D0 (no) | 1998-10-01 |
| NO984598L NO984598L (no) | 1998-12-02 |
| NO315537B1 true NO315537B1 (no) | 2003-09-15 |
Family
ID=11414519
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO19984598A NO315537B1 (no) | 1996-04-02 | 1998-10-01 | Konstruktiv modul i et elektronisk telekommunikasjonsutstyr, med et grensesnitt mot et testings- og diagnosesystem |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US6194909B1 (pt) |
| EP (1) | EP0891558B1 (pt) |
| JP (1) | JP3126149B2 (pt) |
| AT (1) | ATE211262T1 (pt) |
| AU (1) | AU706919B2 (pt) |
| CA (1) | CA2250703C (pt) |
| DE (1) | DE69709329T2 (pt) |
| ES (1) | ES2170384T3 (pt) |
| IT (1) | IT1286293B1 (pt) |
| NO (1) | NO315537B1 (pt) |
| PT (1) | PT891558E (pt) |
| WO (1) | WO1997037234A1 (pt) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6327676B1 (en) * | 1998-03-31 | 2001-12-04 | Emc Corporation | Test equipment |
| US6684340B1 (en) * | 1999-10-07 | 2004-01-27 | Endress + Hauser Gmbh + Co. | Measuring instrument having two pairs of lines connected to two indentical pairs of terminals, via which signal current flows through one pair and supply current flows through the other pair |
| US6885203B1 (en) * | 2000-03-16 | 2005-04-26 | Sharp Laboratories Of America, Inc. | Wafer level burn-in using light as the stimulating signal |
| US7598747B2 (en) * | 2006-01-27 | 2009-10-06 | Ricoh Company, Ltd. | Noise injection apparatus for printed circuit board |
| US20240175913A1 (en) * | 2022-11-29 | 2024-05-30 | Texas Instruments Incorporated | Method for accurate reference voltage trimming |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4498196A (en) * | 1982-07-27 | 1985-02-05 | General Electric Company | Testable optically isolated control circuit |
| US4646299A (en) * | 1983-08-01 | 1987-02-24 | Fairchild Semiconductor Corporation | Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
| DE3328335C2 (de) * | 1983-08-05 | 1987-01-22 | Messerschmitt-Bölkow-Blohm GmbH, 8012 Ottobrunn | Datenfernüberwachungssystem |
| US4810956A (en) * | 1987-12-21 | 1989-03-07 | Northern Telecom Limited | Mounting bracket for test probes |
| US5252914A (en) * | 1990-08-06 | 1993-10-12 | Ericsson Ge Mobile Communications Inc. | Method of constructing and testing a circuit board designed for early diagnostics |
-
1996
- 1996-04-02 IT IT96TO000256A patent/IT1286293B1/it active IP Right Grant
-
1997
- 1997-04-01 DE DE69709329T patent/DE69709329T2/de not_active Expired - Lifetime
- 1997-04-01 JP JP09534939A patent/JP3126149B2/ja not_active Expired - Lifetime
- 1997-04-01 ES ES97918092T patent/ES2170384T3/es not_active Expired - Lifetime
- 1997-04-01 US US09/117,725 patent/US6194909B1/en not_active Expired - Lifetime
- 1997-04-01 EP EP97918092A patent/EP0891558B1/en not_active Expired - Lifetime
- 1997-04-01 WO PCT/EP1997/001632 patent/WO1997037234A1/en active IP Right Grant
- 1997-04-01 CA CA002250703A patent/CA2250703C/en not_active Expired - Lifetime
- 1997-04-01 PT PT97918092T patent/PT891558E/pt unknown
- 1997-04-01 AT AT97918092T patent/ATE211262T1/de active
- 1997-04-01 AU AU26356/97A patent/AU706919B2/en not_active Expired
-
1998
- 1998-10-01 NO NO19984598A patent/NO315537B1/no not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| ES2170384T3 (es) | 2002-08-01 |
| CA2250703A1 (en) | 1997-10-09 |
| PT891558E (pt) | 2002-06-28 |
| NO984598L (no) | 1998-12-02 |
| ATE211262T1 (de) | 2002-01-15 |
| NO984598D0 (no) | 1998-10-01 |
| DE69709329T2 (de) | 2002-08-14 |
| CA2250703C (en) | 2002-07-09 |
| WO1997037234A1 (en) | 1997-10-09 |
| ITTO960256A1 (it) | 1997-10-02 |
| JPH11507191A (ja) | 1999-06-22 |
| IT1286293B1 (it) | 1998-07-08 |
| AU706919B2 (en) | 1999-07-01 |
| JP3126149B2 (ja) | 2001-01-22 |
| US6194909B1 (en) | 2001-02-27 |
| EP0891558A1 (en) | 1999-01-20 |
| ITTO960256A0 (pt) | 1996-04-02 |
| AU2635697A (en) | 1997-10-22 |
| DE69709329D1 (de) | 2002-01-31 |
| EP0891558B1 (en) | 2001-12-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK1K | Patent expired |