NL8702570A - Geladen deeltjes bundel apparaat. - Google Patents
Geladen deeltjes bundel apparaat. Download PDFInfo
- Publication number
- NL8702570A NL8702570A NL8702570A NL8702570A NL8702570A NL 8702570 A NL8702570 A NL 8702570A NL 8702570 A NL8702570 A NL 8702570A NL 8702570 A NL8702570 A NL 8702570A NL 8702570 A NL8702570 A NL 8702570A
- Authority
- NL
- Netherlands
- Prior art keywords
- charged particle
- emitters
- particle beam
- diaphragm
- individual
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/14—Mounting supporting structure in casing or on frame or rack
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
- H01J37/3007—Electron or ion-optical systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
- H01J37/3177—Multi-beam, e.g. fly's eye, comb probe
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electron Beam Exposure (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8702570A NL8702570A (nl) | 1987-10-29 | 1987-10-29 | Geladen deeltjes bundel apparaat. |
EP88202232A EP0314216A1 (en) | 1987-10-29 | 1988-10-06 | Charged-particle beam apparatus |
KR1019880013953A KR890007356A (ko) | 1987-10-29 | 1988-10-26 | 하전 입자 빔 장치 |
JP63269610A JPH01159957A (ja) | 1987-10-29 | 1988-10-27 | 荷電粒子ビーム装置 |
US07/549,652 US5001349A (en) | 1987-10-29 | 1990-07-09 | Charged-particle beam apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8702570A NL8702570A (nl) | 1987-10-29 | 1987-10-29 | Geladen deeltjes bundel apparaat. |
NL8702570 | 1987-10-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL8702570A true NL8702570A (nl) | 1989-05-16 |
Family
ID=19850830
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL8702570A NL8702570A (nl) | 1987-10-29 | 1987-10-29 | Geladen deeltjes bundel apparaat. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5001349A (ko) |
EP (1) | EP0314216A1 (ko) |
JP (1) | JPH01159957A (ko) |
KR (1) | KR890007356A (ko) |
NL (1) | NL8702570A (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02258689A (ja) * | 1989-03-31 | 1990-10-19 | Canon Inc | 結晶質薄膜の形成方法 |
EP1369895B1 (en) | 1996-03-04 | 2012-05-09 | Canon Kabushiki Kaisha | Electron beam exposure apparatus and method, and device manufacturing method |
WO1998035358A1 (en) * | 1997-02-06 | 1998-08-13 | The University Of Miami | Iso-energetic intensity modulator for therapeutic electron beams, electron beam wedge and flattening filters |
US6157039A (en) * | 1998-05-07 | 2000-12-05 | Etec Systems, Inc. | Charged particle beam illumination of blanking aperture array |
EP1273907A4 (en) * | 2000-11-17 | 2006-08-30 | Ebara Corp | METHOD AND INSTRUMENT FOR WAFER INSPECTION AND ELECTRON BEAM |
WO2002049065A1 (fr) * | 2000-12-12 | 2002-06-20 | Ebara Corporation | Dispositif a faisceau d'electrons et procede de production de dispositifs a semi-conducteur utilisant ledit dispositif a faisceau d'electrons |
JP2011238387A (ja) * | 2010-05-07 | 2011-11-24 | Jeol Ltd | エミッタアレイを用いた電子プローブ装置 |
JP5988570B2 (ja) * | 2010-12-31 | 2016-09-07 | エフ・イ−・アイ・カンパニー | 選択可能な複数の粒子放出器を備える荷電粒子源 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE29500E (en) * | 1970-08-31 | 1977-12-20 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. | Scanning charged beam particle beam microscope |
US3745494A (en) * | 1972-03-07 | 1973-07-10 | Display Components | Fiberous shield means for a magnetic focus coil |
DE2547079C3 (de) * | 1975-10-17 | 1979-12-06 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren zur Korpuskularbestrahlung eines Präparats |
US4097745A (en) * | 1976-10-13 | 1978-06-27 | General Electric Company | High resolution matrix lens electron optical system |
CA1100237A (en) * | 1977-03-23 | 1981-04-28 | Roger F.W. Pease | Multiple electron beam exposure system |
NL184549C (nl) * | 1978-01-27 | 1989-08-16 | Philips Nv | Halfgeleiderinrichting voor het opwekken van een elektronenstroom en weergeefinrichting voorzien van een dergelijke halfgeleiderinrichting. |
DE2827085C2 (de) * | 1978-06-16 | 1980-07-24 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren und Vorrichtung zur Brennweitenbestimmung langbrennweitiger elektronenoptischer Linsen |
FR2443085A1 (fr) * | 1978-07-24 | 1980-06-27 | Thomson Csf | Dispositif de microlithographie par bombardement electronique |
US4419580A (en) * | 1981-06-26 | 1983-12-06 | Control Data Corporation | Electron beam array alignment means |
JPS58106747A (ja) * | 1981-12-18 | 1983-06-25 | Hitachi Ltd | 荷電粒子線集束系の自動軸合せ装置 |
NL8201732A (nl) * | 1982-04-27 | 1983-11-16 | Bernardus Johannes Gerardus Ma | Bestralingsinrichting met bundelsplitsing. |
DE3504714A1 (de) * | 1985-02-12 | 1986-08-14 | Siemens AG, 1000 Berlin und 8000 München | Lithografiegeraet zur erzeugung von mikrostrukturen |
NL8500413A (nl) * | 1985-02-14 | 1986-09-01 | Philips Nv | Electronenbundelapparaat met een halfgeleider electronenemitter. |
NL8502275A (nl) * | 1985-08-19 | 1987-03-16 | Philips Nv | In slanke deelbundels opgedeelde bundel geladen deeltjes. |
JPS62155517A (ja) * | 1985-12-27 | 1987-07-10 | Canon Inc | パターン描画装置及び方法 |
-
1987
- 1987-10-29 NL NL8702570A patent/NL8702570A/nl not_active Application Discontinuation
-
1988
- 1988-10-06 EP EP88202232A patent/EP0314216A1/en not_active Withdrawn
- 1988-10-26 KR KR1019880013953A patent/KR890007356A/ko not_active Application Discontinuation
- 1988-10-27 JP JP63269610A patent/JPH01159957A/ja active Pending
-
1990
- 1990-07-09 US US07/549,652 patent/US5001349A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0314216A1 (en) | 1989-05-03 |
US5001349A (en) | 1991-03-19 |
JPH01159957A (ja) | 1989-06-22 |
KR890007356A (ko) | 1989-06-19 |
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Legal Events
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A1B | A search report has been drawn up | ||
BV | The patent application has lapsed |